An error rate measuring apparatus includes a data transmission unit that transmits a test signal of a known pattern and a parameter value defined by a communication standard to a device under test, and a bit error measurement unit that measures a bit error of a signal transmitted from the device under test. The data transmission unit sequentially changes the parameter value and transmits the parameter value to the device under test. The bit error measurement unit measures a bit error of a signal transmitted from the device under test corresponding to the parameter value. The error rate measuring apparatus further includes a discrimination unit that discriminates a parameter value at which the number of bit errors is the least in a measurement result of the bit error measurement unit, as an optimum value of emphasis of an output waveform of the device under test.

Various embodiments provide for testing a transmitter with interpolation, which can be used with a circuit for data communications, such as serializer/deserializer (SerDes) communications. In particular, some embodiments provide for data transmission test of a transmitter by: generating and outputting a pre-determined data pattern through a serializer of the transmitter; sampling a serialized data output of the serializer over a plurality of different interpolation phase positions of a phase interpolator; and using a pattern checker to error check the sampled data over the plurality of different interpolation phase positions to determine whether the data transmission test passes.

A test and measurement device includes an input configured to receive an analog signal from a Device Under Test (DUT), an Analog to Digital Converter (ADC) coupled to the input and structured to convert the analog signal to a digital signal, a receiver implemented in a first Field Programmable Gate Array (FPGA) and structured to accept the digital signal and perform signal analysis on the digital signal, a transmitter implemented in a second FPGA and structured to generate a digital output signal, and a Digital to Analog Converter (DAC) coupled to the transmitter and structured to convert the digital output signal from the transmitter to an analog signal, and structured to send the analog signal to the DUT. The receiver and the transmitter are coupled together by a high speed data link over which data about the current testing environment may be shared.

Provided is a technique for achieving improvement of usability in setting parameters. An error rate measuring apparatus includes a display unit that displays input boxes for inputting one Codeword length and one FEC Symbol length of FEC on a setting screen, and an operation unit that inputs the one Codeword length and the one FEC Symbol length to the corresponding input boxes according to a communication standard of a device under test. A graphic of one Codeword, a graphic of one FEC Symbol, and a graphic of one Codeword including an error for identifying a configuration relationship of an FEC Symbol to a Codeword of the FEC and a correspondence relationship of an FEC Symbol Error to the Codeword are displayed on the setting screen corresponding to the input box of each of the one Codeword length and the one FEC Symbol length of the FEC.

An error rate measuring apparatus that inputs a PAM4 signal of a known pattern as a test signal to a device under test W, receives a signal from the device under test W compliant with the input of the test signal, and measures whether or not an FEC operation of the device under test W is possible based on a comparison result of the received signal and the test signal includes an operation unit that sets one Codeword length and one FEC Symbol length of the FEC as a setting parameter to the signal received from the device under test W according to a communication standard of the device under test W, and a display unit that parallel-displays MSB data and LSB data of each piece of symbol string data obtained by receiving and converting the signal from the device under test W on a display screen.

Presented embodiments facilitate efficient and effective flexible implementation of different types of testing procedures in a test system. In one embodiment, a tester system diagnostic method includes forwarding test signals to a loopback component; receiving the test signals from the loopback component; and analyzing the test signals to diagnose whether or not the test system is experiencing problems associated with electrostatic discharges, including analysis of eye scan configuration data corresponding to characteristics of the test signals. In one exemplary implementation, analyzing the eye scan configuration data, including analyzing symmetry of a graphical representation (e.g., eye pattern, eye diagram, etc.) of the eye scan configuration data with respect to a horizontal graphical representation axis.

The present application discloses a test device and method with built-in self-test logic and a communication device. The test device includes at least one generator and at least one checker which are disposed between a physical layer and a medium access control layer, The at least one generator is configured to generate a protocol pattern to form a data path between the physical layer and the medium access control layer and generate different pseudo random bit sequence patterns in the data path. The at least one checker is configured to test data stream in the physical layer and/or the medium access control layer according to the pseudo random bit sequence patterns, thereby locating a fault position.

Systems, methods, and non-transitory computer readable media are configured to receive a signal. One or more data streams associated with one or more metrics associated with the signal can be determined. The one or more data streams can be sampled to generate data samples. A grade associated with the signal can be generated based on the data samples. The grade can indicate quality of the signal.

A test and measurement device includes an input configured to receive an analog signal from a Device Under Test (DUT), an Analog to Digital Converter (ADC) coupled to the input and structured to convert the analog signal to a digital signal, a receiver implemented in a first Field Programmable Gate Array (FPGA) and structured to accept the digital signal and perform signal analysis on the digital signal, a transmitter implemented in a second FPGA and structured to generate a digital output signal, and a Digital to Analog Converter (DAC) coupled to the transmitter and structured to convert the digital output signal from the transmitter to an analog signal, and structured to send the analog signal to the DUT. The receiver and the transmitter are coupled together by a high speed data link over which data about the current testing environment may be shared.

An example apparatus includes an input buffer coupled to an input terminal, wherein the input buffer is configured to provide an input signal based on a voltage received at the input terminal, a test terminal configured to receive a probe signal, and a power supply terminal configured to receive an external supply voltage. The example apparatus further includes a test logic circuit configured to, in response to the probe signal indicating a test and an external supply voltage detection signal having a value indicating detection of the external supply voltage, initiate a probe contact detection test. During the initiate a probe contact detection test, the test logic circuit is configured to receive the input signal and to provide an output signal having a value based on the input signal.