A processor includes a transmitter to transmit, to a receiver, a differential pair of signals including a positive signal transmitted across a positive conductor and a negative signal transmitted across a negative conductor. A first programmable analog delay circuit is coupled to the positive conductor to provide a first delay to the positive signal and a second programmable analog delay circuit is coupled to the negative conductor to provide a second delay to the negative signal. A controller receives data based on a bit error rate (BER) of the differential pair of signals as measured by a bit error checker of the receiver. In response to determining the BER is less than a threshold BER, the controller stores a first delay value to program the first delay and store a second delay value to program the second delay.

An apparatus for performing an electrical test at a device is described. In one general implementation, an apparatus may include a memory, a receiver, and a processor. The receiver is configured to receive a test signal, convert the test signal into a digital test signal (bit stream) and store the digital test signal in the memory. The receiver identifies when a pre-defined number of bits of the bit stream are available in the memory. The processor is configured to perform a logic operation on the bit stream and a reference signal, generate a test result based on the logic operation, and determine whether the test result satisfies a condition. In some implementations, the processor may be configured to synchronize the digital test signal with the reference signal prior to performing of the logic operation.

An eye pattern measurement apparatus includes: an eye pattern monitoring device, performing first sampling on a data signal by sequentially using scan clock signals having different phases to obtain a plurality of scan data signals; and a data aligning device, connected to the eye pattern monitoring device, receiving the scan data signals outputted by the eye pattern monitoring device, performing phase-shift on the first clock signal to generate a synchronization clock signal, synchronizing the scan data signals with the synchronization clock signal, and outputting the synchronized scan data signals.

A method for processing blocks of flash memory to decrease raw bit errors from the flash memory is provided. The method includes identifying one or more blocks of the flash memory for a refresh operation and writing information regarding the identified blocks, to a data structure. The method includes issuing background reads to the identified blocks, according to the data structure, as the refresh operation. The method may be embodied on a computer readable medium. In some embodiments the background reads may be based on a time based refresh responsive to an increase in raw bit error count in the flash memory over time.

A margin testing device includes at least one interface structured to connect to a device under test (DUT) one or more controllers structured to create a set of test signals based on a sequence of pseudo random data and one or more pre-defined parameters, and an output structured to send the set of test signals to the DUT. Methods and a system for testing a DUT with the disclosed margin tester and other testing device are also described.

A processing method and electronic apparatus for a digital signal are provided. The method includes: detecting the quality of a first eye in an eye diagram of the digital signal; equalizing the digital signal; detecting the quality of a second eye in the eye diagram of the equalized digital signal; determining whether the quality of the second eye superior to the quality of the first eye by a predetermined threshold; and if so, outputting the digital signal, or else again equalizing and performing subsequent steps on the auto-compensated digital signal. The above solution is capable of effectively improving the quality of eyes in the eye diagram of the digital signal.

A method of analyzing an electrical circuit applied for an electrical system is disclosed. The method includes steps of obtaining a loss parameter and an eye diagram of a circuit channel of the electrical system; comparing the eye diagram with a standard eye diagram to generate a comparison result; generating an analytic result of the loss parameter according to the comparison result in order to adjust the eye diagram; and adjusting the loss parameter according to the analytic result.

Embodiments of the present disclosure are directed to an integrated circuit with photonic bit-corrector circuits. The integrated circuit includes a photonic circuit, a photonic bit-corrector circuit, a photodetector array coupled to the photonic bit-corrector circuit, and an electronic circuit coupled to the photodetector array. The photonic circuit includes a plurality of cascaded photonic gates configured to generate a first photonic output signal for a set of photonic input signals applied to the photonic circuit. The photonic bit-corrector circuit is configured to generate a second photonic output signal for the set of photonic input signals applied to the photonic bit-corrector circuit. The photodetector array is configured to generate an electrical signal based on the second photonic output signal. The electronic circuit is configured to compare the electrical signal with a label signal and output a corrected version of the first photonic output signal based on the comparison.

A method for processing blocks of flash memory to decrease raw bit errors from the flash memory is provided. The method includes identifying one or more blocks of the flash memory for a refresh operation and writing information regarding the identified blocks, to a data structure. The method includes issuing background reads to the identified blocks, according to the data structure, as the refresh operation. The method may be embodied on a computer readable medium. In some embodiments the background reads may be based on a time based refresh responsive to an increase in raw bit error count in the flash memory over time.

An integrated circuit having an eye opening monitor (EOM) is provided. The integrated circuit may include: an internal circuit; and the EOM configured to measure an eye diagram of a predetermined point of the internal circuit, wherein the EOM may include a comparator configured to receive a first and a second parent reference voltages and a first and a second input voltages output from the internal circuit, and to compare the first and second input voltages with target reference voltages corresponding to the first and second parent reference voltages, and wherein the comparator divides the target reference voltages from the first and second input voltages respectively by varying a driving capability according to size information data, and compares the first and second input voltages with divided target reference voltages.