A semiconductor device includes a memory cell array, a plurality of word lines, a plurality of bit line pairs, a column selection circuit coupling a bit line pair in a selected column in the plurality of bit line pairs to first and second output signal lines on the basis of a column selection signal, and a sense amplifier amplifying the voltage difference between the first and second output signal lines. The semiconductor device further includes: a scan flip flop to which the data can be input via a scan chain; and a voltage setting circuit setting the first and second output signal lines to voltage according to the data held in the scan flip flop in a scan test.

An electric meter that is configured to regenerate meter state data after a power loss includes a memory with at least one volatile and non-volatile memory device and a processor connected to the memory. The processor is configured to retrieve a backup copy of meter state data and a plurality of meter input data samples that were generated after the backup copy of the meter state data and prior to the power loss from a nonvolatile memory device. The processor is configured to regenerate meter state data by updating the backup copy of meter state data with the plurality of meter input data samples to regenerate the meter state data at the time of a final meter input data sample prior to the power loss.

One embodiment provides a master device in a bus system. The master device includes bus interface circuitry to exchange commands and data with a slave device in communication with the master device; and test sequence generation logic to generate at least one test sequence, each test sequence having a corresponding unique clock signal having a unique clock frequency; the test sequence generation logic also to transmit the at least one test sequence and the corresponding unique clock signal to the slave device; the test signal generation logic also to determine, based on feedback from the slave device, if the slave device is capable of communicating with the master device using the unique clock frequency.

A data transmission apparatus includes lanes, a first clock generation circuit, a second clock generation circuit, a first circuit, and a second circuit. The first clock generation circuit can generate a first clock as a reference for data transmission in a first lane. The second clock generation circuit can generate a second clock as a reference for data transmission in a second lane. The first circuit can determine a shift amount by notification of a first delay amount of the first lane and a second delay amount of the second lane to cause a delay amount of one of the first clock and the second clock to match a delay amount of the other of the first clock and the second clock. The second circuit can shift the first delay amount or the second delay amount based on the determined shift amount.

Devices and techniques are disclosed herein for debugging a device implemented on a die using non-test pins. An instruction to enable a debugging mode of operation is received with a memory device implemented at least in part on a die. In response to receiving the instruction, functionality of a first non-test pin of the die is modified to enable debugging data to be transmitted to a debugging component external to the die over the first non-test pin of the die. A debugging clock signal is established using a signal received at a second non-test pin of the die. Information including the debugging data is exchanged between the die and the debugging component using the first and second non-test pins of the die.

A system to create periodic pulse sequences with defined absolute phase comprises a phase coherent analyzer and a pulse generator. The phase coherent analyzer and the pulse generator are connected with each other. The pulse generator has a clock input connected to the analyzer for receiving a clock signal from the analyzer. The system comprises a trigger line via which a marker signal is provided to at least one of the analyzer and the pulse generator. The marker signal temporally aligns an output signal of the pulse generator with a measurement process of the analyzer. Further, a method of creating periodic pulse sequences with defined absolute phase is described.

Herein is disclosed a multichip reference logging system comprising a control circuit, configured to generate a reference signal; a first chip, configured to generate a first operations log, the first chip further comprising a first reference circuit, configured to receive the reference signal and to create a first reference event in response to the received reference signal; a memory associated with the first chip, configured to store the first reference event within the first operations log; a second chip, configured to generate a second operations log, the second chip further comprising a second reference circuit, configured to receive the reference signal and to create a second reference event in response to the received reference signal; and a memory associated with the second chip, configured to store the second reference event within the second operations log.

An apparatus includes a first circuit and a second circuit. The first circuit may be configured to generate a launch signal synchronized with a first clock signal in a first clock domain. The second circuit may be configured to (i) receive a second clock signal in a second clock domain and (ii) generate a plurality of pulses in each of a third clock signal and a fourth clock signal based on the second clock signal and the launch signal. A frequency of the pulses in the fourth clock signal may be an integer multiple of another frequency of the pulses in the third clock signal. An initial one of each of the pulses in the third clock signal and the fourth clock signal may be synchronized with each other.

A memory controller instantiated on a semiconductor IC device comprises a timing circuit to transfer a timing signal, the timing circuit being configured to receive a first test signal and to effect a delay in the timing signal in response to the first test signal, the first test signal including a first timing event. The memory controller further comprises an interface circuit configured to transfer the data signal in response to the timing signal, the interface circuit being further configured to receive a second test signal and to effect a delay in the data signal in response to the second test signal, the second test signal including a second timing event that is related to the first timing event according to a test criterion.

A test apparatus is configured to test a DUT that does not support synchronous control from an external circuit. A main controller is configured based on an architecture that tests a device by synchronous control with the main controller itself as the master. A MIU is configured as an interface between the main controller and the DUT. The MIU establishes asynchronous control between it and the DUT with the DUT as the master, and establishes control between it and the main controller with the main controller as the master.