There may be provided a method for validating a monitoring system, the method may include sensing, by at least one sensing element of the monitoring system, a physical parameter; sending sensed information that is related to the physical parameter to a remote computerized system of the monitoring system; applying, by the remote computerized system, a process on the sensed information to provide a response to the sensed information; generating validation information by a generator of the monitoring system; sending the validation information to the remote computerized system; applying, by the remote computerized system, the process on the validation information to provide a response to the validation information; and determining, by a validator of the monitoring system, a validity of the monitoring system based on the response to the validation result.

Manufacturers perform tests on chips before the chips are shipped to customers. However, defects can occur on a chip after the manufacturer testing and when the chips are used in a system or device. The defects can occur due to aging or the environment in which the chip is employed and can be critical; especially when the chips are used in systems such as autonomous vehicles. To verify the structural integrity of the IC during the lifetime of the product, an in-system test (IST) is disclosed. The IST enables self-testing mechanisms for an IC in working systems. The IST mechanisms provide structural testing of the ICs when in a functional system and at a manufacturer's level of testing. Unlike ATE tests that are running on a separate environment, the IST provides the ability to go from a functional world view to a test mode.

A method of identifying cell-internal defects: obtaining a circuit design of an integrated circuit, the circuit design including netlists of one or more cells coupled to one another; identifying the netlist corresponding to one of the one or more cells; injecting a defect to one of a plurality of circuit elements and one or more interconnects of the cell; retrieving a first current waveform at a location of the cell where the defect is injected by applying excitations to inputs of the cell; retrieving, without the defect injected, a second current waveform at the location of the cell by applying the same excitations to the inputs of the cell; and selectively annotating, based on the first current waveform and the second current waveform, an input/output table of the cell with the defect.

A fault rules engine generates a plurality of fault rules files, each of the fault rules files is associated with a respective cell type of a plurality of cell types in an integrated circuit (IC) design. Each fault rules file includes data quantifying a nominal delay for a given two-cycle test pattern and data quantifying a delta delay for the given two-cycle test pattern corresponding to a given candidate defect of a plurality of candidate defects of a given cell type of the plurality of cell types in the IC design. An IC test engine extracts an input to output propagation delay for each cell instance from a standard delay format (SDF) file for the IC design and generates cell-aware test patterns for each cell instance of each cell type in the IC design based on the plurality of fault rules files and the extracted input to output propagation delays.

A circuit debug apparatus for debugging an integrated circuit that causes a functional fault may include a processor configured to extract a scan pattern of a scan chain of the integrated circuit while the integrated circuit is in a scan mode. The scan pattern includes a plurality of logic states for a corresponding plurality of logic circuits of the integrated circuit. The processor may also be configured to apply a modified scan pattern to the integrated circuit while the integrated circuit is in the scan mode, where the modified scan pattern includes a test pattern configured to eliminate the functional fault. The processor may be further configured to determine whether the integrated circuit with the modified scan pattern produces the functional fault while the integrated circuit is in a functional mode.

A circuit includes a test circuit in an integrated circuit to test signal timing of a logic circuit under test in the integrated circuit. The signal timing includes timing measurements to determine if an output of the logic circuit under test changes state in response to a clock signal. The test circuit includes a bit register that specifies which bits of the logic circuit under test are to be tested in response to the clock signal. A configuration register specifies a selected clock source setting from multiple clock source settings corresponding to a signal speed. The selected clock source is employed to perform the timing measurements of the specified bits of the bit register.

A system for data creation, storage, analysis, and training while margin testing includes a margin test generator coupled through an interface to a Device Under Test (DUT). The margin test generator is structured to modify test signals for testing the DUT during one or more testing states of a test session to create testing results. The testing results are stored in a data repository along with a DUT identifier of the DUT tested during the test session. A comparator determine whether any results of the DUT test results match a predictive outcome that is based from an analysis of previous DUT tests. If so, a message generator produces an indication that the tested DUT matched the predictive outcome.

An implementation of a system disclosed herein includes a decompressor logic with the capability to vary a level of decompression of a scanning input signal based on value of compression program bits and a compressor logic to generate a scanning output signal, the compressor logic including a plurality of XOR logics, wherein the output of the plurality of XOR logics is selected based on the compression program bits.

A circuit includes a test circuit in an integrated circuit to test signal timing of a logic circuit under test in the integrated circuit. The signal timing includes timing measurements to determine if an output of the logic circuit under test changes state in response to a clock signal. The test circuit includes a bit register that specifies which bits of the logic circuit under test are to be tested in response to the clock signal. A configuration register specifies a selected clock source setting from multiple clock source settings corresponding to a signal speed. The selected clock source is employed to perform the timing measurements of the specified bits of the bit register.

A method of identifying cell-internal defects: obtaining a circuit design of an integrated circuit, the circuit design including netlists of one or more cells coupled to one another; identifying the netlist corresponding to one of the one or more cells; injecting a defect to one of a plurality of circuit elements and one or more interconnects of the cell; retrieving a first current waveform at a location of the cell where the defect is injected by applying excitations to inputs of the cell; retrieving, without the defect injected, a second current waveform at the location of the cell by applying the same excitations to the inputs of the cell; and selectively annotating, based on the first current waveform and the second current waveform, an input/output table of the cell with the defect.