A non-transitory computer-readable recording medium stores an analysis program for causing a computer to execute a process including: reading circuit data; trying to generate test data for a delay fault to be targeted; analyzing whether an underkill is caused when the targeted delay fault results in a redundant fault; and presenting circuit modification locations to avoid the underkill, based on an analysis result, when the underkill is caused.

A circuit device is provided with a first codec including a first portion of a logic circuit and a second codec including a second portion of the logic circuit. The circuit device can also include a plurality of first scan chains coupled to the first codec and configured to shift a delayed test vector onto the first codec, wherein the delayed test vector is a test vector with a phase delay. A plurality of second scan chains can be coupled to the second codec and configured to shift the test vector onto the second codec.

In an approach, a processor receives an input indicative of a set of registers, the set of registers being configured for obtaining output data from a design-under-test (DUT) in a field-programmable gate array (FPGA) module. A processor executes a set of instructions for monitoring the output data in the set of registers;. A processor generates data indicative of at least one portion of changes of the output data in the set of registers during the execution of the set of instructions. A processor causes a separate machine to analyze the data via utilizing an interface to send the data to the separate machine.

A semiconductor integrated circuit includes scan chains, each of which includes a serial connection of sequential circuits and performs a shift register operation in a scan test; and an integrated clock gating (ICG) chain composed by coupling, to one another, ICG circuits, each of which individually supplies a corresponding one of the scan chains with a circuit clock signal to operate the sequential circuits. In the ICG chain, an ICG enable propagation signal for controlling timing when the ICG circuits output the circuit clock signals propagates through a signal line and is input sequentially to the ICG circuits. The ICG circuits output the circuit clock signals at respective timings that are different among the scan chains.

Provided are scan device and method of diagnosing scan chain fault. The scan device for diagnosing a fault includes a scan partition including a plurality of scan chains which include path control scan flipflops connected to scan flipflops in cascade. In the scan partition, connection paths of the scan flipflops are controllable. The connection paths of the path control scan flipflops are controlled to detect a position of a fault such that a fault range in the scan partition is reduced to diagnose the fault.

An apparatus of a multi-chip package (MCP) of a functional safety system, comprises a processor to be configured as a master chip in a master-slave arrangement with a slave chip in the MCP, and a memory coupled to the processor to store one or more infield test scan patterns. The processor includes a bock to couple the master chip to the slave chip via a high-speed input/output (IO) interface to retrieve the one or more infield test scan patterns from the memory via the master chip, and to provide the one or more infield test scan patterns to the slave chip via the high-speed IO interface in response to the functional safety system entering an infield test mode.

A system and method for dynamically protecting against security vulnerabilities in a reconfigurable signal chain. The system includes a signal chain formed from at least a first component connected with a second component. The first component has a set of source outputs and a first authentication block, and the second signal chain component has a set of destination inputs and a second authentication block. The system also includes a signal chain configurator that populates the first authentication block with at least one validated endpoint from the set of destination inputs. A signal chain integrity block, which is communicatively coupled with the first authentication block and the second authentication block, identifies a source-destination pair from one or more endpoint pairs formed from the at least one validated endpoint and the set of source outputs. The signal chain integrity block propagates the source-destination pair to the first authentication block and the second authentication block. The second authentication block authenticates any received input using the source-destination pair.

An integrated circuit includes a flip-flop circuit and a gating circuit. The flip-flop circuit is arranged to receive an input data for generating a master signal during a writing mode according to a first clock signal and a second clock signal, and to output an output data according to the first clock signal and the second clock signal during a storing mode. The gating circuit is arranged for generating the first clock signal and the second clock signal according to the master signal and an input clock signal. When the input clock signal is at a signal level, the first clock signal and the second clock signal are at different logic levels. When the input clock signal is at another signal level, the first clock signal and the second clock signal are at a same logic level determined according to a signal level of the master signal.

This disclosure describes a reduced pin bus that can be used on integrated circuits or embedded cores within integrated circuits. The bus may be used for serial access to circuits where the availability of pins on ICs or terminals on cores is limited. The bus may be used for a variety of serial communication operations such as, but not limited to, serial communication related test, emulation, debug, and/or trace operations of an IC or core design. Other aspects of the disclosure include the use of reduced pin buses for emulation, debug, and trace operations and for functional operations.

An error rate measuring apparatus that inputs a PAM4 signal of a known pattern as a test signal to a device under test W, receives a signal from the device under test W compliant with the input of the test signal, and measures whether or not an FEC operation of the device under test W is possible based on a comparison result of the received signal and the test signal includes an operation unit that sets one Codeword length and one FEC Symbol length of the FEC as a setting parameter to the signal received from the device under test W according to a communication standard of the device under test W, and a display unit that parallel-displays MSB data and LSB data of each piece of symbol string data obtained by receiving and converting the signal from the device under test W on a display screen.