Patent classifications
G01T1/295
Method for correcting a spectrum
The invention relates to a method for processing energy spectra of a radiation transmitted by an object irradiated by a source of ionizing radiations, in particular an X radiation, for applications in medical imaging or non-destructive inspection. The method implements a detector comprising a plurality of pixels, each pixel being able to establish a spectrum of the radiation transmitted by the object. The method makes it possible, from a plurality of spectra detected, to establish so-called corrected spectra. Each corrected spectrum is an estimation of the spectrum of a radiation, called primary radiation, transmitted by the object. The invention makes it possible to reduce the influence of the scattering, by the object, of the spectrum emitted by the source.
CAMERA DEVICE AND METHOD FOR SHOOTING LIGHT HAVING AT LEAST TWO WAVELENGTH BANDS
Camera device and method for shooting light having at least two wavelength bands are disclosed. The camera device includes a first camera containing a first lens for receiving light having a first wavelength band; a second camera including a second lens for receiving light having a second wavelength band which is different from the first wavelength band, the second lens being disposed facing the first lens of the first camera; and a parabolic mirror set between the first camera and the second camera, able to let the light having the first wavelength band penetrate therethrough, and at the same time, reflect the light having the second wavelength band. The first camera is a non-fisheye camera. The first lens is a non-fisheye lens. The second camera and the parabolic mirror form a catadioptric camera. The aperture stop of the non-fisheye lens coincides with the focal point of the parabolic mirror.
Microstructure manufacturing method
A microstructure manufacturing method includes forming a first insulating film on an Si substrate, exposing an Si surface by removing a part of the first insulating film, forming a recessed portion by etching the Si substrate from the exposed Si surface, forming a second insulating film on a sidewall and a bottom of the recessed portion, forming an Si exposed surface by removing at least a part of the second insulating film formed on the bottom of the recessed portion, and filling the recessed portion with a metal from the Si exposed surface by electrolytic plating.
Apparatus and method for capturing still images and video using diffraction coded imaging techniques
An apparatus and method are described for capturing images in visible light as well as other radiation wavelengths. In one embodiment, the apparatus comprises: a diffraction coded imaging system including a plurality of apertures arranged in a diffraction coded array pattern with opaque material blocking array elements not containing apertures; and a light- or radiation-sensitive sensor coupled to the diffraction coded imaging system array and positioned at a specified distance behind the diffraction coded imaging system array, the radiation-sensitive sensor configured to sense light or radiation transmitted and diffracted through the apertures in the diffraction coded imaging system array.
LENSLESS IMAGING SYSTEM USING AN IMAGE SENSOR WITH ONE OR MORE ATTENUATING LAYERS
A lens-free imaging system for generating an image of a scene includes an electromagnetic (EM) radiation sensor; a mask disposed between the EM radiation sensor and the scene; an image processor that obtains signals from the EM radiation sensor while the EM radiation sensor is exposed to the scene; and estimates the image of the scene based on, at least in part, the signals and a transfer function between the scene and the EM radiation sensor.
METHOD AND DEVICE FOR CHARACTERIZING AN ELECTRON BEAM
A device for detecting X-rays radiated out of a substrate surface, said device comprising at least one X-ray detector, a resolver grating and a modulator grating, said resolver grating with at least one opening facing towards said X-ray detector is arranged in front of said X-ray detector. Said modulator grating is provided between said resolver grating and said substrate at a predetermined distance from said resolver grating and said substrate, where said modulator grating having a plurality of openings in at least a first direction, wherein said x-rays from said surface is spatially modulated with said modulator grating and resolver grating.
Method and device for characterizing an electron beam
A device for detecting X-rays radiated out of a substrate surface, said device comprising at least one X-ray detector, a resolver grating and a modulator grating, said resolver grating with at least one opening facing towards said X-ray detector is arranged in front of said X-ray detector. Said modulator grating is provided between said resolver grating and said substrate at a predetermined distance from said resolver grating and said substrate, where said modulator grating having a plurality of openings in at least a first direction, wherein said x-rays from said surface is spatially modulated with said modulator grating and resolver grating.
SYSTEM AND METHOD FOR IMAGING WITH PINHOLE ARRAYS
A method and system are provided, for imaging a region of interest with pinhole based imaging. The method comprising: collecting input radiation from the region of interest through a selected set of a plurality of a predetermined number of aperture arrays, each array having a predetermined arrangement of apertures and collecting the input radiation during a collection time period, wherein said selected set of the aperture arrays and the corresponding collection time periods defining a total effective transmission function of the radiation collection, generating image data from the collected input radiation, said image data comprising said predetermined number of image data pieces corresponding to the input radiation collected through the aperture arrays respectively, processing the image data pieces utilizing said total effective transmission function of the radiation collection, and determining a restored image of the region of interest. The set of aperture arrays is preferably selected such that said total effective transmission function provides non-null transmission for spatial frequencies being lower than a predetermined maximal spatial frequency.
METHOD FOR CORRECTING A SPECTRUM
The invention relates to a method for processing energy spectra of a radiation transmitted by an object irradiated by a source of ionizing radiations, in particular an X radiation, for applications in medical imaging or non-destructive inspection. The method implements a detector comprising a plurality of pixels, each pixel being able to establish a spectrum of the radiation transmitted by the object. The method makes it possible, from a plurality of spectra detected, to establish so-called corrected spectra. Each corrected spectrum is an estimation of the spectrum of a radiation, called primary radiation, transmitted by the object. The invention makes it possible to reduce the influence of the scattering, by the object, of the spectrum emitted by the source.
Device for the simultaneous detection, identification, quantification and/or localization of gamma radiation and neutron sources
A mechanical collimator receives particles from a gamma radiation emission source and/or neutron emission source, a material that absorbs neutrons and is virtually transparent to gamma radiation A first detector includes a scintillator crystal with neutron-gamma discrimination capability and a position-sensitive photosensor, coupled to the mechanical collimator. One or more detector blocks have scintillator crystals of gamma or neutron-gamma radiation and position-sensitive photosensors, after the first detector, on a face opposite the mechanical collimator. A processing and acquisition module is connected to the detectors The device is suitable for use in inspections relating to nuclear safety, port safety, nuclear threats and accidents, and hadron-therapy treatments and nuclear medicine.