Patent classifications
G01T1/2971
SYSTEMS AND METHODS FOR IMAGING AND DATA PROCESSING
The embodiments of the present disclosure provide a method, system, and readable medium for data processing. The method may include: obtaining one or more data processing parameters, the one or more data processing parameters being determined based on a reference detector module; obtaining target data of a target object collected by one or more signal detectors; and processing the target data based on the one or more data processing parameters.
Collimatorless Combined Compton and Proximity Imaging Technology
Gamma cameras are provided. The subject gamma cameras include an analysis region comprising a spatial area configured to receive a sample, a first detector head positioned to receive gamma radiation from the analysis region, the first detector head including a first scatterer and a first absorber parallel to the first scatterer, and a second detector head positioned on the opposite side of the analysis region relative to the first detector head, the second detector head including a second scatterer and a second absorber parallel to the second scatterer. Systems and methods for practicing the invention are also provided.
METHOD FOR SCANNING A PART IN A SCANNING APPARATUS
A method of scanning a part comprises setting software scanning parameters of a scanning apparatus to produce an image. Setting the software scanning parameters includes setting an output voltage to a maximum output value, for example 450 kV and setting an output current and a magnification so that a power/voxel ratio of the scanning apparatus is in a range of between 2 and 3, for instance, between 2.25 and 2.75. The method further comprises scanning the part.
Photon flux modulation to improve dynamic range in photon counting detectors
Systems and methods for improving radiographic scanning. In an example, the technology relates to a system for performing radiographic scanning. The system includes a photon source configured to emit photons. The system also includes a photon counting detector for detecting photons emitted from the photon source after passing through a target. The photon counting detector comprising first pixels having a first size and second pixels having a second size, and the first size is greater than the second size.
Energy bin event counting system
One embodiment is a method for binning charge events in a photon-counting CT scanning system comprising a plurality of discriminators, wherein each discriminator is associated with a respective one of a plurality of threshold voltage levels, the method comprising detecting a transition in a signal output from one of the discriminators; and incrementing a count corresponding to the threshold voltage level associated with the one of the discriminators only if the detected discriminator output signal transition was immediately preceded by an opposite transition in the discriminator output signal.
PHOTON FLUX MODULATION TO IMPROVE DYNAMIC RANGE IN PHOTON COUNTING DETECTORS
Systems and methods for improving radiographic scanning. In an example, the technology relates to a system for performing radiographic scanning. The system includes a photon source configured to emit photons. The system also includes a photon counting detector for detecting photons emitted from the photon source after passing through a target. The photon counting detector comprising first pixels having a first size and second pixels having a second size, and the first size is greater than the second size.
DETECTORS FOR COMPUTED TOMOGRAPHY SCANNERS AND RELATED ASSEMBLIES AND SYSTEMS
Detectors for computed tomography scanners may include a cathode, a cadmium telluride material, a cadmium zinc telluride material, or a silicon material adjacent to the cathode, and an array of anodes located on a side of the cadmium telluride material, the cadmium zinc telluride material, or the silicon material opposite the cathode, A substrate may be located proximate to the array of anodes, anodes of the array of anodes electrically connected to the substrate. A microelectronic device may be located on a side of the substrate opposite the cadmium telluride material, the cadmium zinc telluride material or the silicon material. The microelectronic device may be electrically connected to the substrate with the microelectronic device mounted to the substrate in a flip-chip orientation. Electrically conductive elements may be located adjacent to the microelectronic device and electrically connected to the substrate.
ENERGY BIN EVENT COUNTING SYSTEM
One embodiment is a method for binning charge events in a photon-counting CT scanning system comprising a plurality of discriminators, wherein each discriminator is associated with a respective one of a plurality of threshold voltage levels, the method comprising detecting a transition in a signal output from one of the discriminators; and incrementing a count corresponding to the threshold voltage level associated with the one of the discriminators only if the detected discriminator output signal transition was immediately preceded by an opposite transition in the discriminator output signal.