Apparatus, sensor chips and techniques for optical sensing of substances by using optical sensors on sensor chips.

A device, including: an end-emitting optical fiber including a first end and a second end; a light extraction plate including a light scattering structure; and a light diffuser film disposed above the light scattering structure. Also disclosed are systems including the device.

Absolute temperature measurements of integrated photonic devices can be accomplished with integrated bandgap temperature sensors located adjacent the photonic devices. In various embodiments, the temperature of the active region within a diode structure of a photonic device is measured with an integrated bandgap temperature sensor that includes one or more diode junctions either in the semiconductor device layer beneath the active region or laterally adjacent to the photonic device, or in a diode structure formed above the semiconductor device layer and adjacent the diode structure of the photonic device.

A photonic integrated circuit including a semiconductor substrate having integrate a semiconductor light source configured to emit coherent light of at least the first wavelength and the second wavelength, the semiconductor light source having a first factor; a waveguide structure optically coupled to the semiconductor light source, the waveguide structure having a second Q factor that is higher than the first Q factor, the waveguide structure configured to form an optical cavity for at least the light of the first wavelength and the second wavelength; an optical output structure configured to optically couple the waveguide structure with a plurality of optical channels to transmit light of the first wavelength and the second wavelength from the waveguide structure to the plurality of optical channels.

An optical density measuring apparatus and an optical waveguide capable of increasing the degree of design freedom are provided. The optical density measuring apparatus is for measuring density of a gas or a liquid to be measured and includes a light source capable of irradiating light into a core layer, a detector capable of receiving light propagated through the core layer, and an optical waveguide. The optical waveguide includes a substrate and the core layer, which includes a diffraction grating unit and a light propagation unit capable of propagating light in an extending direction of the light propagation unit. The diffraction grating unit and a portion of the core layer are separated in the thickness direction of the optical waveguide.

An aeronautical composite structure configured to monitor a physical status of a bonded portion between structural components using a multi-core optical fiber. A method and system for monitoring the physical status of a bonded portion in an aeronautical composite structure also uses a multi-core optical fiber. More particularly, the invention relates to a structure and method for monitoring the physical status of a bonded portion of an aeronautical composite structure from its manufacturing to its use in flight using a multi-core optical fiber.

The exemplary embodiments provide an optical fiber sensor and a vector measuring device which measure a motion of a subject using a double Bragg grating formed in a core with a helical structure and measure a chiral motion inflection point vector.

A multilayer stack comprises a surface wherein a predetermined region is defined for enclosing a device provided on the multilayer stack, the region being encircled by a welding zone defined on the surface, the welding zone being suitable for being welded by a welding radiation beam to a capping structure. It also comprises a first layer embedded within the multilayer stack, including at least one embedded component suitable for being functionally connected to the device provided on the multilayer stack. It furthermore comprises at least a second layer over the first layer comprising a shielding structure positioned between the at least one component of the first layer and the welding zone defined on the surface, the shielding structure being adapted to limit the welding depth of the welding radiation beam provided on the welding zone.

A planar optical waveguide device (3) and a temperature measurement system. The system comprises a detection light source (1), a photoelectric detector (2), a planar optical waveguide device (3), and a measurement optical fiber (4). The planar optical waveguide device (3) comprises a substrate (5). The substrate (5) is internally provided with N temperature detection channels (31). Each of the temperature detection channels (31) comprises an incident light path (311), a reflected light path (312), and an emergent light path (313). In the N temperature measurement channels (31) arranged in parallel, a point of intersection is provided between the incident light path (311) of one temperature measurement channel (31) and the reflected light path (312) of at least one of the other temperature measurement channels (31). The detection light source (1) is in communication with the incident light path (311). The photoelectric detector (2) is in communication with the reflected light path (312). The measurement optical fiber (4) is in communication with the emergent light path (313). A FBG sensor is provided within the measurement optical fiber (4). During a multi-channel temperature measurement, the point of intersection is provided between an incident light path (311) of one temperature measurement channel (31) and the reflected light path (312) of at least one of the other temperature measurement channels (31) in the N temperature measurement channels (31) arranged in parallel so as to achieve transmission, measurement, and demodulation of optical signals. A planar optical waveguide device (3) and a temperature measurement system. The system comprises a detection light source (1), a photoelectric detector (2), a planar optical waveguide device (3), and a measurement optical fiber (4). The planar optical waveguide device (3) comprises a substrate (5). The substrate (5) is internally provided with N temperature detection channels (31). Each of the temperature detection channels (31) comprises an incident light path (311), a reflected light path (312), and an emergent light path (313). In the N temperature measurement channels (31) arranged in parallel, a point of intersection is provided between the incident light path (311) of one temperature measurement channel (31) and the reflected light path (312) of at least one of the other temperatur

A photonic device has a substrate with one or more optical resonators having a first resonant frequency response relative to temperature and a different second resonant frequency response relative to temperature. A first waveguide optically couples a first light beam having a first frequency to a first optical resonator and a second waveguide optically couples a second light beam having a second frequency to a second optical resonator. An optical shifter may shift an optical characteristic of the second light beam. A detector converts output light from the photonic device into an electric signal having a characteristic indicative of a physical condition, such as temperature, of the photonic device. In some cases, output light from the one or more optical resonators is combined and a temperature of the photonic device is determined from a beat frequency in the combined light. One or more multimode optical resonators may be used.