A re-scan microscope for forming an image of a sample is disclosed. The system comprises an illumination optical system for directing, and optionally focusing, illumination light at the sample herewith providing an illumination light spot at the sample. The illumination light spot causes emission light from the sample. The microscope system further comprises a detection optical system for focusing at least part of the emission light onto an imaging plane of an imaging system herewith causing an emission light spot on the imaging plane. The microscope system also comprises a rotatable element for, when rotating, moving the illumination light spot over and/or through the sample and simultaneously moving the emission light spot over said imaging plane of the imaging system. The rotatable element comprises at least two reflective surfaces.

The invention relates to an optical assembly for scanning excitation radiation and/or manipulation radiation in a laser scanning microscope. The optical assembly according to the invention is characterized in that in addition to a first and a second focusing device, a third focusing device is provided in order to generate a third pupil plane which is optically conjugated to a first pupil plane, a third beam deflecting device is arranged on the third pupil plane in order to deflect the excitation radiation and/or manipulation radiation, a first beam deflecting means is provided between the second focusing device and the second pupil plane and the second pupil plane and the third focusing device in order to deflect the excitation radiation and/or manipulation radiation coming from the third focusing device while bypassing the second beam deflecting device in the direction of the second focusing device, a fourth focusing device is provided for generating a fourth pupil plane which is optically conjugated to the third pupil plane, and a variable second beam deflecting means is arranged on the fourth pupil plane in order to switch an optical beam path between a first beam path and a second beam path. The invention additionally relates to a laser scanning microscope.

An optical system for a light-sheet microscope comprises transporting optics configured to project, into a sample, a light sheet for illuminating a sample plane positioned obliquely to an optical axis of the transporting optics and to project the illuminated sample plane into an intermediate image space. The transporting optics comprises an interchanging system that includes a first light-deflection element and a second light-deflection element. The interchanging system is configured to switch an illumination direction along which the light sheet illuminates the sample by alternately introducing the first light-deflection element and the second light-deflection element into a beam path of the transporting optics. The first light-deflection element causes a partial image inversion in only one direction. The second light-deflection element causes a complete image inversion in two directions.

A confocal scanner (21) according to the present disclosure includes a first pinhole array disk (211a), a second pinhole array disk (211b), a condensing element array disk (212) located between the first pinhole array disk (211a) and the second pinhole array disk (211b), a connecting shaft (213) connecting the first pinhole array disk (211a), the second pinhole array disk (211b), and the condensing element array disk (212), and a motor (214) configured, together with the connecting shaft (213), to rotate the first pinhole array disk (211a), the second pinhole array disk (211b), and the condensing element array disk (212). The first pinhole array disk (211a) is located at a first focal plane, the second pinhole array disk (211b) is located at a second focal plane, and a diameter of first pinholes and a diameter of second pinholes are different from each other.

A confocal scanner (21) according to the present disclosure includes a first pinhole array disk (211a), a second pinhole array disk (211b), a condensing element array disk (212) located between the first pinhole array disk (211a) and the second pinhole array disk (211b), a connecting shaft (213) connecting the first pinhole array disk (211a), the second pinhole array disk (211b), and the condensing element array disk (212), and a motor (214) configured, together with the connecting shaft (213), to rotate the first pinhole array disk (211a), the second pinhole array disk (211b), and the condensing element array disk (212). The first pinhole array disk (211a) is located at a first focal plane, the second pinhole array disk (211b) is located at a second focal plane.

A method and microscopy system are useful for recording an image of a sample region. A laser beam is directed onto the sample region with interface(s). An objective lens facilitates images the laser beam on a focusing point which lies on the optical axis of the objective lens or an axis parallel thereto, and which lies in a focusing plane. The objective lens and the sample region are displaced with respect to one another in relative fashion along the optical axis of the objective lens to different relative displacement positions. Intensity values of the laser beam are captured for a respective relative displacement position. A respective highest intensity value for a respective displacement position, a curve of the highest intensity values, and a reference relative displacement position from at least one maximum of the curve, are determined. Image(s) of the sample region is/are captured at the reference relative displacement position.

Upstream a microscope objective lens, a polarization direction of a light beam is tilted with a first electro-optical deflector between a first polarization direction with which the light beam is deflected by a first polarization beam splitter by a first angle and a second polarization direction with which it is deflected by a second angle. With a second electro-optical deflector, the polarization direction of the light beam is tilted between a third polarization direction with which the light beam is deflected by a second polarization beam splitter by a third angle and a fourth polarization direction with which it is deflected by a fourth angle. By rotating the polarization direction of the light beam by means of the first and second electro-optical deflectors in a coordinated way the light beam is tilted about a fixed point in a pupil of the objective lens.

A system for illuminating a microscopy specimen includes an illumination source configured to emit a light that travels along an illumination path to illuminate the microscopy specimen placed on an optical detection path of an optical microscope. The system also includes optical elements in the illumination path and configured to at least in part transform the light from the illumination source into a light sheet illuminating the microscopy specimen. The optical elements include an electronically tunable lens configured to vary a focal distance of the electronically tunable lens to dynamically vary a position of a waist of the light sheet illuminating the microscopy specimen. The optical elements include a deflector configured to vertically move the light sheet to illuminate the microscopy specimen at different horizontal planes.

An optical probe assembly as a confocal endomicroscope includes an optical focusing stage that focuses an output beam onto a sample and a mirror scanning stage that is movable for scanning the output beam in both a lateral two dimensional plane and an axial direction, using a side-view configuration. The side-view configuration allows for output beam illumination and fluorescent imaging of the sample with greater imaging resolution and improved access to hard to reach tissue within a subject.

A illumination arrangement for a microscope for illuminating a sample with a light sheet includes an illumination input configured to feed an illumination beam along an optical axis of the illumination arrangement and an illumination output which faces a sample side and is configured to output the illumination beam to the sample side. A focusing optical system is provided with a set depth of focus. At least one optical modification element is configured to geometrically modify the illumination beam. Different rays of the illumination beam intersect the optical axis within an axis intersection region at the illumination output. The axis intersection region extends over at least the depth of focus of the focusing optical system along the optical axis.