Patent classifications
G02B21/0052
Method and apparatus for enhancing SE detection in mirror-based light imaging charged particle microscopes
Apparatus include a reflector positioned adjacent to a sample location that is situated to receive a charged particle beam (CPB) along a CPB axis from a CPB focusing assembly so that the reflector is situated to receive light emitted from a sample at the sample location based on a CPB-sample interaction or a photon-sample interaction and to direct the light to a photodetector, and a steering electrode situated adjacent to the reflector so as to direct secondary charged particles emitted from the sample based on the CPB-sample interaction away from the reflector and CPB axis. Methods and systems are also disclosed.
Confocal microscope with a pinhole arrangement
A microscope for raster-free, confocal imaging of a sample arranged in a sample space has an illumination arrangement comprising a light source group having light sources which can be switched on individually, a detector arrangement, a pinhole arrangement which comprises a pinhole array and which has a plurality of pinhole elements which are adjacent to one another, wherein there is one pinhole element provided for each light source, and optics which irradiate each pinhole element with radiation of an individual light source of the light source group and confocally illuminate an individual spot located in the sample space, wherein one of the individual spots is associated with each pinhole element, and the individual spots are adjacent to one another in the sample space with respect to an incidence direction of the radiation, and the optics image the individual spots through the pinhole arrangement confocally on the detector arrangement.
ENHANCED-RESOLUTION INFRARED PHOTOACOUSTIC MICROSCOPY AND SPECTROSCOPY
Apparatus and methods for measuring infrared absorption of a sample that includes delivering a pulse of infrared radiation to a region of the sample, delivering pulses of radiation of a shorter wavelength than infrared radiation to a sub-region within the region, and using one or more properties of the induced photoacoustic signals to create a signal indicative of infrared absorption of the sub-region of the sample.
Measurement apparatus configured to control the on/off state of illumination source
There is provided a measurement apparatus including a control unit configured to control an on/off state of illumination that does not contribute to acquisition of measurement data on the basis of an acquisition time period of the measurement data.
DETERMINING AN ERRONEOUS MOVEMENT OF A MICROSCOPE
A device may capture, using a camera associated with a microscope, a first image of interstitial material associated with a first set of optical fibers in a field of view of the camera. The device may perform a comparison of the first image of interstitial material and a second image of interstitial material associated with a second set of optical fibers. The device may determine that the first set of optical fibers does not include an expected set of optical fibers based on a result of performing the comparison. The device may determine an amount by which to adjust the field of view of the camera based on the result of performing the comparison. The device may perform one or more actions.
Solid immersion lens holder and image acquisition device
A solid immersion lens holder includes a first member having a first opening disposing a spherical face portion therein so that a part of the spherical face portion protrudes toward an objective lens side and a second member having a second opening disposing a contact portion therein so that a contact face protrudes toward a side opposite to the objective lens side. The first member includes three protrusion portions extending from an inner face of the first opening toward a center of the first opening and configured to be contactable with the spherical face portion.
Solid immersion lens holder and image acquisition device
A solid immersion lens holder includes a first member having a first opening disposing a spherical face portion therein so that a part of the spherical face portion protrudes toward an objective lens side and a second member having a second opening disposing a contact portion therein so that a contact face protrudes toward a side opposite to the objective lens side. The first member includes three plate members disposed on the objective lens side with respect to the first opening. Each of the three plate members is provided with a protrusion portion capable of contacting the spherical face portion.
Optical sectioning using a phase pinhole
The present invention relates to an arrangement for the generation of images of optical sections of a three-dimensional (3D) volume in space such as an object, scene, or target, comprising: an illumination unit, an optical arrangement for the imaging of the object onto at least one spatially resolving detector, a scanning mechanism for scanning the entire object and a signal processing unit for the implementation of a method for digital reconstruction of a three-dimensional representation of the object from images of said object as obtained by said detector (which may be in a form of a hologram), wherein the optical arrangement includes a diffractive optical element (herein a phase pinhole), realized using a Spatial Light Modulator (SLM) configured to mimic an actual physical pinhole, while allowing the formation of a three-dimensional representation for a specific point of interest in said object, such that for each scanning position a single hologram or an image is recorded.
Functionally integrated laser scanning microscope
A functionally integrated laser scanning microscope for scanning a sample with laser illumination, selectably in a confocal, line or wide-field operating mode, comprising a laser light source, an illumination and detection beam path, a detection device and at least one objective, wherein the illumination and detection beam path has optical means for the configuration of the laser illumination, at least one scanner for scanning the sample with the laser illumination, and a beam splitter for separating illumination and detection light, and controllable optical elements for changing the beam guiding depending on the operating mode selected in each case.
Method and device for the SPIM analysis of a sample
A method for single plane illumination microscopy (SPIM) analysis of a sample includes simultaneously illuminating multiple sample layers by a single sheet of light. Detection light emanating from the individual sample layers is detected at different times and/or at different positions in a detection beam path. The detection beam path is branched using beam splitters and an effective refractive power of the individual beam splitters is zero.