A spectral confocal measurement device includes a light source portion, configured to emit a broad-spectrum light beam with a certain wavelength range in a first predetermined path; an optical sampling portion, configured to converge the broad-spectrum light beam emitted from the light source portion on different measurement surfaces of an object to be measured, and output a reflected light in a second predetermined path that is different from a reverse direction of the first predetermined path; and a measurement portion, configured to receive and process the reflected light from the optical sampling portion to obtain a measurement result. The device can improve measurement accuracy and reduce production costs. In addition, a spectral confocal measurement method is also provided.

A control device for controlling a microscope includes: a computation module. The control device: adjusts a sample volume velocity of a sample volume of the microscope relative to the microscope; and adjusts a light sheet velocity of the light sheet of the microscope relative to the microscope based on the sample volume velocity.

The present description relates to a device for line-scanning optical coherence tomographic microscopy. The device comprises an interferometric microscope comprising a reference arm, an object arm configured to receive an object, a beam splitter coupling said object arm and reference arm to a light source and to a sensor, and a first microscope objective arranged on said object arm. It further comprises a one-dimensional confocal spatial filtering device configured to interact with said light source in order to illuminate said object along a focal line located in an object space of the first microscope objective, and a device for unidirectional scanning of said focal line, which device is arranged on said object arm upstream of said first microscope objective and is configured to scan the focal line in a lateral direction (y) substantially perpendicular to an optical axis (z) of said first microscope objective.

A cell area extraction unit (241) extracts a cell area in a phase image that is created based on a hologram obtained by in-line holographic microscope (IHM). A background value acquisition unit (242) obtains a background value from phase values at a plurality of positions outside the cell area. An intracellular phase value acquisition unit (243) averages a plurality of phase values on a sampling line set at a position close to the periphery of a cell, while avoiding a central portion in which the phase value may be lowered in the cell area, to obtain an intracellular phase value. A phase change amount calculation unit (244) obtains the difference between the intracellular phase value and the background value. A phase change amount determination unit (245) compares the value of the difference with thresholds in two levels to determine whether the cell is in an undifferentiated state or an undifferentiation deviant state. It is thereby possible to automatically make a correct determination while removing the influence of a theoretical measurement error by IHM.

Disclosed herein are systems for imaging of samples using an array of micro optical elements and methods of their use. In some embodiments, an optical chip comprising an array of micro optical elements moves relative to an imaging window and a detector in order to scan over a sample to produce an image. A focal plane can reside within a sample or on its surface during imaging. Detecting optics are used to detect back-emitted light collected by an array of micro optical elements that is generated by an illumination beam impinging on a sample. In some embodiments, an imaging system has a large field of view and a large optical chip such that an entire surface of a sample can be imaged quickly. In some embodiments, a sample is accessible by a user during imaging due to the sample being exposed while disposed on or over an imaging window.

The present description relates to a device for line-scanning optical coherence tomographic microscopy. The device comprises an interferometric microscope comprising a reference arm, an object arm configured to receive an object, a beam splitter coupling said object arm and reference arm to a light source and to a sensor, and a first microscope objective arranged on said object arm. It further comprises a one-dimensional confocal spatial filtering device configured to interact with said light source in order to illuminate said object along a focal line located in an object space of the first microscope objective, and a device for unidirectional scanning of said focal line, which device is arranged on said object arm upstream of said first microscope objective and is configured to scan the focal line in a lateral direction (y) substantially perpendicular to an optical axis (z) of said first microscope objective.

The technology disclosed relates to structured illumination microscopy (SIM). In particular, the technology disclosed relates to capturing and processing, in real time, numerous image tiles across a large image plane, dividing them into subtiles, efficiently processing the subtiles, and producing enhanced resolution images from the subtiles. The enhanced resolution images can be combined into enhanced images and can be used in subsequent analysis steps.

The observation device includes an imaging optical system that includes an imaging lens forming an image of an observation target in a cultivation container, an operating section that performs at least one of a first operation of changing a focal length of the imaging optical system, a second operation of moving the imaging lens in an optical axis direction, or a fourth operation of moving the container in the optical axis direction, a detection section that detects a vertical position of the cultivation container, and an operation controller that controls the operating section based on the vertical position of the cultivation container.

An apparatus and method for light field microscopy. The apparatus has a light source for emitting excitation light, an excitation beam path for guiding the excitation light onto and into a sample, a two-dimensionally spatially resolving detector for detecting emission light emitted by the sample as a consequence of the irradiation by the excitation light, and a detection beam path having a microscope objective and a multi-lens array for guiding the emission light onto the two-dimensionally spatially resolving detector. The two-dimensionally spatially resolving detector being arranged in the focal plane of the multi-lens array or in a plane optically conjugate thereto, the excitation beam path being configured to illuminate only a portion of the sample in a field of view of the detection beam path with excitation light, with a device, in particular a scanner, being present for variable positioning of the illuminated portion of the sample in the field of view of the detection beam path and with a variable stop device being present. The variable stop device being configured to restrict an effective field of view of the detection beam path on the basis of the position of the illuminated portion in the field of view. The stop device is an electronic stop device and/or the stop device is arranged in an intermediate image plane of the detection beam path upstream of the multi-lens array.

Techniques for acquiring focused images of a microscope slide are disclosed. During a calibration phase, a “base” focal plane is determined using non-synthetic and/or synthetic auto-focus techniques. Furthermore, offset planes are determined for color channels (or filter bands) and used to generate an auto-focus model. During subsequent scans, the auto-focus model can be used to quickly estimate the focal plane of interest for each color channel (or filter band) rather than re-employing the non-synthetic and/or synthetic auto-focus techniques.