An image processing apparatus includes an output value obtaining unit, a first interpolation unit, a second interpolation unit, an image generation unit, and a first edge detection unit. The output value obtaining unit obtains respective output values of a plurality of light-receiving elements from an image sensor including the plurality of light-receiving elements arranged two-dimensionally. The first interpolation unit uses a first interpolation algorithm to interpolate a pixel value. The second interpolation unit uses a second interpolation algorithm to interpolate a pixel value. The image generation unit generates an image based on a pixel value, which is interpolated by the first interpolation unit. The first edge detection unit detects an edge using a first edge detection algorithm based on a pixel value, which is interpolated by the second interpolation unit.

Techniques for acquiring focused images of a microscope slide are disclosed. During a calibration phase, a “base” focal plane is determined using non-synthetic and/or synthetic auto-focus techniques. Furthermore, offset planes are determined for color channels (or filter bands) and used to generate an auto-focus model. During subsequent scans, the auto-focus model can be used to quickly estimate the focal plane of interest for each color channel (or filter band) rather than re-employing the non-synthetic and/or synthetic auto-focus techniques.

A base assembly includes an imaging sensor having a sensor surface to receive a sample, and a platform connected to the base assembly. The base assembly includes (a) an aperture configured to receive a lid surface of a lid in a position to define an imaging space between the sensor surface and the lid surface and (b) a movement portion movable toward and away from the base assembly. The platform and the base assembly are configured to limit contact between the sample and the base assembly other than at the sensor surface.

A microscope system includes: a light source unit that emits linear illumination parallel to a first direction; an objective lens that condenses the linear illumination onto a measurement target region; an acquisition unit that acquires a first optical signal indicating a light intensity value of light emitted from the measurement target region by the linear illumination; and a focus control unit that controls at least one of a relative position or a relative posture of the light source unit and an imaging unit that generates the first optical signal on a basis of a light intensity distribution of the first optical signal.

Methods and apparatuses are disclosed whereby structured illumination microscopy (SIM) is applied to a scanning microscope, such as a confocal laser scanning microscope or sample scanning microscope, in order to improve spatial resolution. Particular aspects of the disclosure relate to the discovery of important advances in the ability to (i) increase light throughput to the sample, thereby increasing the signal/noise ratio and/or decreasing exposure time, as well as (ii) decrease the number of raw images to be processed, thereby decreasing image acquisition time. Both effects give rise to significant improvements in overall performance, to the benefit of users of scanning microscopy.

The image processing system includes a scanner, a pixelated photon detector (PPD), and at least one processor. The at least one processor displays a setting screen on a display unit. The setting screen is a screen for setting an identification range that is a range of gradation to be identified. The at least one processor displays a second image obtained by converting a first image on the display unit. The second image is an image obtained by converting the first image based on at least the identification range. The first image is generated based on an intensity signal of light detected by a PPD and a scanning position by the scanner.

Corrected images are produced with an apparatus that includes a detector and a control unit. In a first operating mode, a plurality of image tiles of an object are captured as a plurality of image pixels. The control unit generates commands to capture each image, such that it partially overlaps with at least one other image tile in an image tile overlap region having a minimum size. Each captured image tile and/or a resultant image is combined pixel-wise by calculation in a brightness correction image. In a second operating mode, the brightness correction image is produced by capturing a plurality of correction image tiles of the object as a plurality of image pixels, and control commands are generated, so the object is moved relative to a detection beam path and a size of a correction image overlap region is greater than the minimum size of the image tile overlap region.

An optical inspection system for detecting sub-micron features on a sample component. The system may have a controller, a camera responsive to the controller for capturing images, an objective lens able to capture submicron scale features on the sample component, and a pulsed light source. The pulsed light source may be used to generate light pulses. The camera may be controlled to acquire images, using the objective lens, only while the pulsed light source is providing light pulses illuminating a portion of the sample component. Relative movement between the sample component and the objective lens is provided to enable at least one of a desired subportion or an entirety of the sample component to be scanned with the camera.

Provided are a device for analyzing a large-area sample based on an image, a device for analyzing a sample based on an image by using a difference in medium characteristic, and a method for measuring and analyzing a sample by using the same. The device for analyzing a large-area sample includes a first sensor array including a plurality of sensors which are disposed while being spaced apart from each other in a first direction, a second sensor array including a plurality of sensors, which are disposed while being spaced apart from each other in the first direction, and spaced apart from the first sensor array in a second direction, and a control unit to obtain image data for a cell included in the sample by using sensing data of the sensor on the sample, in which the sample is interposed between the first sensor array and the second sensor array. An active area of one of the sensor in the first sensor array overlaps an active area of one of the sensors in the second sensor array, in the second direction.

An optical arrangement for an inclined-plane microscope, includes: an optical illumination and detection arrangement, an optical erecting unit for imaging the real intermediate image on a detector, wherein an optical axis of the erecting unit is inclined with respect to an optical axis of the optical illumination and detection arrangement and is oriented substantially perpendicularly to the real intermediate image plane, and an attachment element arranged on the erecting unit, extending in a direction of the real intermediate image, and forming an interface which is oriented substantially parallel to the real intermediate image plane, wherein beam paths of the illumination light and of the scattered and/or fluorescent light transmitted by the illumination and detection arrangement are coupled in and intersect on the image side of the illumination and detection arrangement, and wherein the beam path of the illumination light is spaced apart from the interface.