When an observation target is enabled to be observed by a plurality of types of measuring methods having different principles, to make it possible switch an illuminating method in a plurality of ways to increase types of observation targets that can be observed. An observation target SP is illuminated by at least one of coaxial epi-illumination 24 and non-coaxial epi-illumination 25. A focus search is performed on the basis of an image acquired by a first light receiving element 50. The observation target SP is illuminated by a light source 26. The focus search is performed on the basis of a signal acquired by a second light receiving element 51.

Methods and systems for collecting high definition images of spent firearm cartridges under different illumination conditions described herein. Features indicative of firing pin impact with each spent firearm cartridge are extracted and compared to features extracted from different spent firearm cartridges. The likelihood that the cartridges were fired from the same firearm is determined based on the differences between the extracted features. A cartridge fixture locates a spent firearm cartridge inside an imaging chamber illuminated by different combinations of illumination devices located in different locations with respect to the spent firearm cartridge. Collected images are filtered by a trained image feature filter to extract features indicative of a firing pin strike. Features extracted from different spent firearm cartridges are compared to determine the likelihood that the spent firearm cartridges were fired from the same firearm based on one or more error metrics characterizing feature differences.

Methods, devices, apparatus, and systems are provided for image analysis. Methods of image analysis may include observation, measurement, and analysis of images of biological and other samples; devices, apparatus, and systems provided herein are useful for observation, measurement, and analysis of images of such samples. The methods, devices, apparatus, and systems disclosed herein provide advantages over other methods, devices, apparatus, and systems.

The disclosed technology relates to an inspection apparatus that includes a stage configured to retain a specimen for inspection, an imaging device having a field of view encompassing at least a portion of the stage to view a specimen retained on the stage, and a plurality of lights disposed on a moveable platform. The inspection apparatus can further include a control module coupled to the imaging device, each of the lights and the moveable platform. The control module is configured to perform operations including: receiving image data from the imaging device, where the image data indicates an illumination landscape of light incident on the speciment; and automatically modifying, based on the image data, an elevation of the moveable platform or an intensity of one or more of the lights to adjust the illumination landscape. Methods and machine-readable media are also contemplated.

A lighting device for an imaging optical device such as a microscope is provided. The lighting device illuminates an object to be analyzed in an imaging optical device for microscopic analysis in at least two different contrasting techniques. The lighting device has light sources for the illumination, where the light sources are associated with a contrasting technique are controllable independently from each other.

Provided is an optical apparatus using reflection geometry. The optical apparatus includes a lens element disposed to face an object to be measured, a light source generating an incident beam that passes through the lens element to be incident on the object, and a photodetector receiving light that is scattered by the object. The incident beam is obliquely incident on the object off an optical center axis of the lens element, without passing through the optical center axis. The scattered light is transmitted to the photodetector by passing through the optical center axis of the focusing lens element and a region therearound.

An imaging device includes a camera and an illuminator. The illuminator is positioned and configured to illuminate an article through an illuminator tunable filter disposed along an optical axis and capture an image of the article through a camera tunable filter arranged along the optical axis. Imaging arrangements and imaging methods are also described.

Certain aspects pertain to epi-illumination Fourier ptychographic imaging systems and methods for high resolution imaging of thick samples.

Certain aspects pertain to Fourier ptychographic imaging systems, devices, and methods such as, for example, high NA Fourier ptychographic imaging systems and reflective-mode NA Fourier ptychographic imaging systems.

A magnifying observation apparatus obtains a plurality of first luminance images by controlling an illumination section so as to illuminate an observation target with illumination light from a first illumination direction and controlling a change section and an imaging section so as to image the observation target, obtains a plurality of second luminance images by controlling the illumination section so as to illuminate the observation target with illumination light from a second illumination direction symmetric with the first illumination direction about an optical axis and controlling the change section and the imaging section so as to image the observation target in a plurality of different focal positions, and generates a roughness enhancement image that enhances roughness on the surface of the observation target by applying depth synthesis and roughness enhancement.