G02B21/125

Image Processing Process Applied to Colony Counters in Microbiology
20240185392 · 2024-06-06 ·

A method and device for counting colonies in a sample in a medium. A bright field image is generated from light transmitted through the sample and the medium in a bright field configuration and collected by a detection unit, and a dark field image is generated from light scattered from the sample and the medium in a dark field configuration and collected by a detection unit. A fusion image is generated by a computer processing unit by combining two operand images, one an inverted image of the bright field image, and the other the dark field image. Colonies of the sample are counted by the computer processing unit based on processing of the fusion image. A single detection unit can generate the bright and dark field images, or the detection units can be separate. Light and dark diffusing surfaces can be separately retained or formed by a single diffuser.

Image analysis and measurement of biological samples

Methods, devices, apparatus, and systems are provided for image analysis. Methods of image analysis may include observation, measurement, and analysis of images of biological and other samples; devices, apparatus, and systems provided herein are useful for observation, measurement, and analysis of images of such samples. The methods, devices, apparatus, and systems disclosed herein provide advantages over other methods, devices, apparatus, and systems.

System and method for multiple mode inspection of a sample

A system and method for multiple mode inspection of a sample. The system includes a radiation source, an objective lens, a bright field detection module, a dark field detection module and optics. The optics, when the system operates at a first mode, is configured to direct the input beam through a first opening, without substantially blocking any part of the input beam, towards a first region of the objective lens. The optics, when the system operates at a second mode, is configured to direct the input beam through a second opening, without substantially blocking any part of the input beam, towards a second region of the objective lens. The first region of the objective lens differs from the second region of the objective lens.

PARALLEL IMAGING ACQUISITION AND RESTORATION METHODS AND SYSTEMS
20190137753 · 2019-05-09 ·

Certain embodiments pertain to parallel digital imaging acquisition and restoration methods and systems.

Multi-Modal Wide-Angle Illumination Employing a Compound Beam Combiner

Provided is an optical apparatus that includes an illumination assembly which include an extended radiation source emitting radiation with a controllable spatial distribution and telecentric condensing optics, configured to receive and project the emitted radiation with a numerical aperture exceeding 0.3 along a first optical axis onto a field and an imaging assembly that includes a sensor and objective optics configured to image the field along a second optical axis onto the sensor and also a prism combiner positioned between the field and the condensing and objective optics which is configured to combine the first and second optical axes, while reflecting at least one of the optical axes multiple times within the prism combiner.

COUPLING MIRROR OF AN OPTICAL INSPECTION SYSTEM
20240255436 · 2024-08-01 ·

A wafer inspection tool comprising an illumination system having: a field of view (FOV); a light source pupil having a size and shape; a central optical axis; and one or more field angle defining a shape of said FOV extending away from said light source pupil; an objective lens arrangement including an objective and a plurality of interchangeable telescopes coupled thereto, the objective lens arrangement being configured to collect light reflected off a plurality of field points on the wafer and to onwardly transmit a light beam formed from the collected light; and a light separator having a first reflective surface with a transmissive region formed therein and a second surface, wherein said transmissive region is arranged to allow therethrough a central portion of said light beam transmitted from said objective lens arrangement corresponding to the brightfield channel while said reflective surface is arranged to reflect a peripheral portion of said light beam transmitted from said objective lens arrangement corresponding to the darkfield channel; a relay module configured to relay said light source pupil to said transmissive region; wherein said transmissive region has a shape defined as a geometric intersection volume between a model of said illumination light and said reflective surface and said second surface; wherein said model includes a plurality of solids each solid having a cross section of said light source pupil and angled to a field angle of said one or more field angle.

METHOD AND APPARATUS FOR MICROSCOPY

The present invention provides for assessing biological samples for developmental viability utilising microscopy by contemporaneously capturing bright field and dark field images of a biological sample within a time lapse measurement interval.

PHOTOCATHODE INCLUDING SILICON SUBSTRATE WITH BORON LAYER
20190066962 · 2019-02-28 ·

A photocathode is formed on a monocrystalline silicon substrate having opposing illuminated (top) and output (bottom) surfaces. To prevent oxidation of the silicon, a thin (e.g., 1-5 nm) boron layer is disposed directly on the output surface using a process that minimizes oxidation and defects. An optional second boron layer is formed on the illuminated (top) surface, and an optional anti-reflective material layer is formed on the second boron layer to enhance entry of photons into the silicon substrate. An optional external potential is generated between the opposing illuminated (top) and output (bottom) surfaces. The photocathode forms part of novel electron-bombarded charge-coupled device (EBCCD) sensors and inspection systems.

Photocathode including silicon substrate with boron layer

A photocathode is formed on a monocrystalline silicon substrate having opposing illuminated (top) and output (bottom) surfaces. To prevent oxidation of the silicon, a thin (e.g., 1-5 nm) boron layer is disposed directly on the output surface using a process that minimizes oxidation and defects. An optional second boron layer is formed on the illuminated (top) surface, and an optional anti-reflective material layer is formed on the second boron layer to enhance entry of photons into the silicon substrate. An optional external potential is generated between the opposing illuminated (top) and output (bottom) surfaces. The photocathode forms part of novel electron-bombarded charge-coupled device (EBCCD) sensors and inspection systems.

Wavelength multiplexed fourier ptychographic microscopy system and method

The present disclosure relates to Fourier ptychographic microscopy systems and methods. The system includes: a three-color LED array; a microscope, configured to obtain image information with multi-wavelength, and magnify to generate magnified image information; an RGB camera configured to acquire a first color image with a first resolution based on the magnified image information; and a controller, configured to synchronously control the three-color LED array and the RGB camera, in which the three-color LED array is further configured to display a plurality of illumination patterns, the RGB camera is further configured to acquire synchronously a plurality of first color images, and the controller is further configured to restore a single second image with a second resolution according to the plurality of first color images, and the first resolution is less than the second resolution. The present disclosure improves sampling speed.