A process is provided for imaging a surface of a specimen with an imaging system that employs a BD objective having a darkfield channel and a bright field channel, the BD objective having a circumference. The specimen is obliquely illuminated through the darkfield channel with a first arced illuminating light that obliquely illuminates the specimen through a first arc of the circumference. The first arced illuminating light reflecting off of the surface of the specimen is recorded as a first image of the specimen from the first arced illuminating light reflecting off the surface of the specimen, and a processor generates a 3D topography of the specimen by processing the first image through a topographical imaging technique. Imaging apparatus is also provided as are further process steps for other embodiments.

An illumination module (101) for an optical apparatus comprises a light source unit (102), which is configured to selectively emit light along a multiplicity of beam paths (112) in each case. The illumination module (101) also comprises a multiplicity of optical elements (201-203) arranged with lateral offset from one another, wherein each optical element (201-203) of the multiplicity of optical elements (201-203) is configured to transform at least one corresponding beam path (112) of the multiplicity of beam paths.

The present invention concerns an image conversion module (09) that comprises an optical interface (10) for establishing an optical path (07). The image conversion module (09) further comprises a beam splitting element (13) on the optical path (07). The beam splitting element (13) is configured for splitting a beam entering the optical interface (10, 11) on the optical path (07) into a first optical subpath (14) and a second optical subpath (16). The image conversion module (09) further comprises a microelectromechanical optical system (17) that is configured for enhancing a depth of field on the first optical subpath (14) that is directed to a first optoelectronic submodule (21). The image conversion module (09) further comprises a second optoelectronic submodule (24) having an electronic sensor (26) on the second optical subpath (16). The second optoelectronic submodule (24) is configured for acquiring additional data on the sample (02).

A microscope comprising an illumination assembly, an image capture device and a processor can be configured to selectively identify regions of a sample comprising artifacts or empty space. By selectively identifying regions of the sample that have artifacts or empty space, the amount of time to generate an image of the sample and resources used to generate the image can be decreased substantially while providing high resolution for appropriate regions of the computational image. The processor can be configured to change the imaging process in response to regions of the sample that comprises artifacts or empty space. The imaging process may comprise a higher resolution process to output higher resolution portions of the computational image for sample regions comprising valid sample material, and a lower resolution process to output lower resolution portions of the computational image for sample regions comprising valid sample material.

A Light-Emitting Diode (LED) illuminator-condenser capable of supplying bright-field, dark-field, fluorescence, oblique, and phase-contrast illumination under Khler-like conditions. A single lens may be permanently focused on the specimen plane. Illumination conditions may be made by a combination of uniform LEDs, collimating masks and diffusers. LEDs may be arranged in one or more ring-shaped patterns.

Fiducial marking systems provided for forming a global coordinate system for a visual system having a limited field of view. The fiducial marking system includes a target surface that is movable relative to the visual system and a visual pattern associated with the target surface. The visual pattern includes a plurality of first lines and a plurality of second lines. Each first line is spaced by a first distance from each adjacent first line and each second line is spaced by a second distance from each adjacent second line, wherein the first distance is different than the second distance. Additionally, the first distance and the second distance are selected such that at least one first line and at least one second line are within the field of view at all relative positions of the visual system and the target surface.

A dermatoscope which can focus at a certain depth, e.g. below the top surface of the skin. Light sources are provided for creating shadows of a skin lesion and an image acquisition device to take images from which a 3D reconstruction can be made.

Methods, devices, apparatus, and systems are provided for image analysis. Methods of image analysis may include observation, measurement, and analysis of images of biological and other samples; devices, apparatus, and systems provided herein are useful for observation, measurement, and analysis of images of such samples. The methods, devices, apparatus, and systems disclosed herein provide advantages over other methods, devices, apparatus, and systems.

A fluorescence microscopy inspection system includes light sources able to emit light that causes a specimen to fluoresce and light that does not cause a specimen to fluoresce. The emitted light is directed through one or more filters and objective channels towards a specimen. A ring of lights projects light at the specimen at an oblique angle through a darkfield channel. One of the filters may modify the light to match a predetermined bandgap energy associated with the specimen and another filter may filter wavelengths of light reflected from the specimen and to a camera. The camera may produce an image from the received light and specimen classification and feature analysis may be performed on the image.

A process is provided for imaging a surface of a specimen with an imaging system that employs a BD objective having a darkfield channel and a bright field channel, the BD objective having a circumference. The specimen is obliquely illuminated through the darkfield channel with a first arced illuminating light that obliquely illuminates the specimen through a first arc of the circumference. The first arced illuminating light reflecting off of the surface of the specimen is recorded as a first image of the specimen from the first arced illuminating light reflecting off the surface of the specimen, and a processor generates a 3D topography of the specimen by processing the first image through a topographical imaging technique. Imaging apparatus is also provided as are further process steps for other embodiments.