A manufacturing method of an electronic device is provided by the present disclosure. The method includes: providing a substrate including a non-discarding portion and a discarding portion adjacent to the non-discarding portion; forming a first test wiring extending through the non-discarding portion and the discarding portion; cutting the substrate on a target line, wherein the target line is aligned with a boundary between the non-discarding portion and the discarding portion; performing a first conducting test on the first test wiring; and determining the substrate to be in an off-target cutting state when a result of the first conducting test is a short circuit state, or determining the substrate to be in an on-target cutting state when the result of the first conducting test is an open circuit state.

Provided are a method and an apparatus for detecting pixel defect of optical module, and a device, where the method includes: graying an image obtained by imaging a test binary image by an optical module in a darkroom environment to obtain a first grayscale image; determining a first grayscale area and a second grayscale area corresponding to two gray levels in the test binary image from the first grayscale image; determining a pixel point not matching a grayscale feature of respective grayscale region from the first grayscale area and the second grayscale area respectively as a pixel defect point; and determining the pixel defect of the optical module according to the pixel defect point. The technical solution provided in the present disclosure can detect accurately a pixel defect of an optical module which is advantageous in optimizing the processing technology of the optical module.

The present invention relates to a method, system and computer program product for defect enhancement. According to the method, a plurality of proposed regions from a plurality of images taken for a display panel is obtained. Each of proposed region of the plurality of proposed regions include a suspected defect on the display panel. At least two proposed regions from the plurality of proposed regions that deserve to be superimposed based on a set of conditions is determined. The at least two proposed regions for acquiring an enhanced defect are superimposed.

A display device includes a display panel having a display area and a non-display area. A window is disposed on the display panel. A bezel portion is disposed on the window. The bezel portion at least partially overlaps the non-display area. An adhesive layer is disposed between the display panel and the window. An interlayer is disposed between the bezel portion and the adhesive layer. The interlayer has at least one ultrasound transmitting area overlapping the bezel portion.

The liquid crystal display panel includes a color filter substrate providing with a common electrode layer t; and an array substrate arranged in cell alignment with the color filter substrate and providing with a common electrode line, the array substrate includes a display area and a peripheral area including a plurality of connection areas located on the connection areas and arranged between the color filter substrate and the array substrate; at least one connection area includes a conductive sub-region and a detection sub-region, and the conductive members located on the conductive sub-region are respectively in contact with the common electrode line and the common electrode layer for conducting the common electrode line and the common electrode layer; and the conductive members located on the detection sub-region are respectively in contact with the common electrode layer and a detection pad for conducting the common electrode layer and the detection pad.

A display device includes a lighting device, a display panel, a memory, and a correction circuit. The lighting device includes a light exit area defined into light exit sections corresponding to light sources. The display panel includes a display area opposed to the light exit area and including pixels. The display area includes display sections to be opposed to the light exit sections. The memory stores data of pixel matrix linked to the display sections. The memory stores position data of the pixels that are not opposed to the corresponding light exit sections and deviation data when a position error is caused between the light exit area and the display area. The correction circuit is configured to determine whether the memory stores the position data of the pixels and link new pixel matrix units to the corresponding display sections based on the deviation data if determination result is affirmative.

A touch display panel and a display device utilize one thin film transistor is configured for one touch wiring. The thin film transistor is turned on during the lighting test and a corresponding electrical signal is input, which can change the floating state of the touch wiring. The coupling effect between the touch wiring and a data line can be reduced or eliminated, which reduces interference with a data signal, so that bright-line phenomenon caused by the floating touch wiring interfering with the data line during the lighting test can be improved or eliminated.

A liquid crystal device includes a common electrode as a first electrode, a pixel electrode as a second electrode, a liquid crystal layer to which a drive voltage is applied for one refresh period as a first refresh period, and a measurement circuit that applies an inspection voltage to the liquid crystal layer between the common electrode and the pixel electrode, sets a period that is longer than one refresh period after the application of the inspection voltage is stopped, and measures a voltage between the common electrode and the pixel electrode.

Provided are a method for detecting display screen quality, an apparatus, an electronic device and a storage medium. The method includes: receiving a quality detection request sent by a console deployed on a display screen production line, the quality detection request including a display screen image collected by an image collecting device on the display screen production line; inputting the display screen image into a defect detection model to obtain a defect detection result, the defect detection model being obtained by training historical defective display screen images using a structure of deep convolutional neural networks and an object detection algorithm; and determining, according to the defect detection result, a defect on a display screen corresponding to the display screen image, a defect category corresponding to the defect, and a position corresponding to the defect.

Embodiments of the present disclosure provides a method for detecting variation value comprising selecting a numerical value in a first time interval as a comparison basis; selecting a numerical value in a second time interval as a inspection interval; statistically identifying the numerical value of the inspection interval and the numerical value of the comparison basis are to detect a variation value.