Patent classifications
G02F1/1309
METHOD, DEVICE AND SYSTEM FOR DETERMINING LIGHT-LEAKAGE DEGREE OF DISPLAY PANEL AND TEST FIXTURE
The present disclosure provides a method, an apparatus and a system for determining a light-leakage degree of a display panel, and a test fixture, and relates to the field of display technologies. When a light-leakage detection device detected that the plurality of sub-regions includes at least one light-leakage sub-region, the light-leakage detection device can determine a light-leakage degree of the display panel based on an average of brightness values of the plurality of sub-regions and a brightness value of the light-leakage sub-region. Compared with a way that an inspector manually determines a light-leakage degree, the light-leakage detection device can automatically determine the light-leakage degree of the display panel based on brightness values of the sub-regions by the method according to the embodiment of the present disclosure, thereby effectively improving the reliability and accuracy of the light-leakage degree of the display panel as determined.
EVALUATION INDEX CALCULATION DEVICE, EVALUATION INDEX CALCULATION METHOD, AND EVALUATION INDEX CALCULATION PROGRAM
The present disclosure provides an evaluation index calculation device, an evaluation index calculation method, and an evaluation index calculation program which are capable of diversifying an evaluation index representing an optical state of a light control sheet. The evaluation index calculation device acquires an evaluation image of an imaging target in a predetermined environment, captured via a light control sheet, and calculates a degree of obscuring caused by the light control sheet in the evaluation image, as an evaluation index, through image analysis of the evaluation image.
Device and method for detecting the sparkle effect of a transparent sample arranged in front of an image source
A device for detecting a sparkle effect of a transparent sample arranged in front of an image source, to which also a first polarizer having an optical axis of polarization is associated, wherein the detection device includes an imaging system, and wherein the transparent sample, the first polarizer and the imaging system are arranged along an optical path originated from the image source. The detection device includes a second polarizer, arranged between the transparent sample and the imaging system, having an optical axis of polarization directed at ninety degrees with respect to the optical axis of polarization of the first polarizer.
DISPLAY DEVICE INCLUDING AN ADHESIVE LAYER
A display device includes a display panel having a display area and a non-display area. A window is disposed on the display panel. A bezel portion is disposed on the window. The bezel portion at least partially overlaps the non-display area. An adhesive layer is disposed between the display panel and the window. An interlayer is disposed between the bezel portion and the adhesive layer. The interlayer has at least one ultrasound transmitting area overlapping the bezel portion.
Adhesion defect detection apparatus and adhesion defect detection method using the same
An adhesion defect detection apparatus includes an inspection window having a first dummy area, a second dummy area, and an inspection area disposed between the first dummy area and the second dummy area. A first shape changer is disposed on the inspection window. The first shape changer is configured to change a shape of the inspection window in a first direction. A second shape changer is disposed outside of both the first dummy area and the second dummy area. The second shape changer is configured to change a shape of the inspection window in a second direction that is perpendicular to the first direction.
LIQUID CRYSTAL DISPLAY DEVICE AND LINE DEFECT DETECTION METHOD
A liquid crystal display device includes a liquid crystal panel and a driver that drives the liquid crystal panel. The driver includes a control unit that executes a display process of displaying an image on the liquid crystal panel, a touch detection process of detecting a touch on the liquid crystal panel, and a line defect determination process of determining the presence of a line defect in the liquid crystal panel. In the line defect determination process, the control unit applies a drive signal to each sensor electrode, determines whether a detection value detected from each of the sensor electrodes when the drive signal is applied meets a predetermined determination criterion, and determines that the line defect has occurred when the sensor electrodes whose detection values meet the determination criterion among the plurality of sensor electrodes are linearly distributed.
SHORTING BAR, DISPLAY PANEL, AND DISPLAY DEVICE
The present disclosure provides a shorting bar, a display panel, and a display device. The shorting bar includes test lines, wherein each test wire includes: a base substrate; an insulation layer disposed on the base substrate, wherein one or more via holes are formed in the insulation layer; one or more metal wires disposed in the insulation layer, wherein each of the metal wires are at least partially exposed in one of the via holes; and a conductive layer at least partially disposed in the via holes and covering the exposed metal wires, wherein the conductive layer is a strippable conductive layer.
Display substrate, display device and test method of display substrate
A display substrate, a display device and a test method of the display substrate are disclosed. The display substrate includes a display region and a peripheral region. The peripheral region includes: a first leading wire extending in a first direction and including a first end and a second end; a first test wire electrically connected with the first leading wire at a first position of the first test wire between the first end and the second end; the display region includes first signal wires of first group extending in a second direction, two first signal wires arranged outermost in the first direction among the first signal wires of first group are respectively connected with the first end and the second end, and remaining first signal wires among the first signal wires of first group are connected with the first leading wire between the first end and the second end.
Substrate edge test apparatus, system, and method
An apparatus for testing an edge portion of a substrate, includes a first illumination source configured to irradiate light to an end portion of the edge portion of the substrate; a second illumination source configured to irradiate light to a lower portion of the edge portion; a third illumination source configured to irradiate light to an upper portion of the edge portion; and first to third photographing portions, respectively corresponding to the first to third illumination sources, wherein the first illumination source comprises a C-shaped cross-section and comprises a first curved surface facing the end portion of the edge portion, the second illumination source comprises a half C-shaped cross-section and comprises a second curved surface facing the lower portion of the edge portion, and the third illumination source comprises a half C-shaped cross-section and comprises a third curved surface facing the upper portion of the edge portion.
PINHOLE MITIGATION FOR OPTICAL DEVICES
Methods, apparatus, and systems for mitigating pinhole defects in optical devices such as electrochromic windows. One method mitigates a pinhole defect in an electrochromic device by identifying the site of the pinhole defect and obscuring the pinhole to make it less visually discernible. In some cases, the pinhole defect may be the result of mitigating a short-related defect