A measurement control system for a multi-shaft supported air floatation platform, the system comprising a load feedback unit (5), an execution unit (6), a position measurement unit (7), a safety protection unit (8), a controller (9), a rotating motor (10), and a linear light source 11; the load feedback unit comprises M pressure sensors (5-1) and four differential sensors (5-2); the execution unit comprises M servo voice coil motors (6-1) and M servo voice coil motor drivers (6-2); the position measurement unit comprises a plane grating (7-1), M linear gratings (7-2) a linear array CCD (7-3), a tilt sensor (7-4), M electronic levels (7-5), and an indoor GPS (7-6); the safety protection unit comprises 2M proximity sensors (8-1) and M temperature sensors (8-2); and the linear array CCD consists of no few then six CCDs. The system solves the problems of leveling limitations and narrow application range of existing supporting platforms.

To provide a microchip-type optical measuring apparatus which is able to automatically perform position adjustment of a microchip with respect to an optical axis of laser with high accuracy.

A microchip-type optical measuring apparatus includes an irradiation detection unit which detects light generated by irradiating a microchip with laser, a position adjustment unit which changes a relative position of the microchip with respect to the irradiation detection unit, and a control unit which outputs a movement signal for a position in which an integrated value or an average value of a detected intensity of the light in a preset region becomes high to the position adjustment unit.

To provide a microchip-type optical measuring apparatus which is able to automatically perform position adjustment of a microchip with respect to an optical axis of laser with high accuracy.

A microchip-type optical measuring apparatus includes an irradiation detection unit which detects light generated by irradiating a microchip with laser, a position adjustment unit which changes a relative position of the microchip with respect to the irradiation detection unit, and a control unit which outputs a movement signal for a position in which an integrated value or an average value of a detected intensity of the light in a preset region becomes high to the position adjustment unit.

A control system for operation of an industrial machine includes a processor and a tangible, non-transitory, computer-readable memory communicating with the processor. The tangible, non-transitory computer-readable memory includes instructions that, in response to execution by the processor, cause the processor to perform operations including: receiving image data from an imaging device that monitors an image zone around the industrial machine, and analyzing the image data. The processor further performs operations including determining, based upon the analyzing, that the control system is functional, determining, based upon the analyzing, that the image data includes at least one of a predefined color, a predefined pattern, and a predefined shape, and transmitting a proximity signal to at least one relay module coupled between the processor and the industrial machine to halt operation of the industrial machine.

A control system for operation of an industrial machine includes a processor and a tangible, non-transitory, computer-readable memory communicating with the processor. The tangible, non-transitory computer-readable memory includes instructions that, in response to execution by the processor, cause the processor to perform operations including: receiving image data from an imaging device that monitors an image zone around the industrial machine, and analyzing the image data. The processor further performs operations including determining, based upon the analyzing, that the control system is functional, determining, based upon the analyzing, that the image data includes at least one of a predefined color, a predefined pattern, and a predefined shape, and transmitting a proximity signal to at least one relay module coupled between the processor and the industrial machine to halt operation of the industrial machine.

A control system for monitoring operation of an industrial machine includes a processor and a tangible, non-transitory, computer-readable memory communicating with the processor. The tangible, non-transitory computer-readable memory includes instructions that, in response to execution by the processor, cause the processor to perform operations including: receiving image data from an imaging device that monitors an image zone around the industrial machine, analyzing the image data, generating, based upon the analyzing, operational data associated with the industrial machine, and transmitting the operational data to a display that is communicatively coupled to the control system.

A control system for monitoring operation of an industrial machine includes a processor and a tangible, non-transitory, computer-readable memory communicating with the processor. The tangible, non-transitory computer-readable memory includes instructions that, in response to execution by the processor, cause the processor to perform operations including: receiving image data from an imaging device that monitors an image zone around the industrial machine, analyzing the image data, generating, based upon the analyzing, operational data associated with the industrial machine, and transmitting the operational data to a display that is communicatively coupled to the control system.

To provide a microchip-type optical measuring apparatus which is able to automatically perform position adjustment of a microchip with respect to an optical axis of laser with high accuracy. A microchip-type optical measuring apparatus includes an irradiation detection unit which detects light generated by irradiating a microchip with laser, a position adjustment unit which changes a relative position of the microchip with respect to the irradiation detection unit, and a control unit which outputs a movement signal for a position in which an integrated value or an average value of a detected intensity of the light in a preset region becomes high to the position adjustment unit.

To provide a microchip-type optical measuring apparatus which is able to automatically perform position adjustment of a microchip with respect to an optical axis of laser with high accuracy. A microchip-type optical measuring apparatus includes an irradiation detection unit which detects light generated by irradiating a microchip with laser, a position adjustment unit which changes a relative position of the microchip with respect to the irradiation detection unit, and a control unit which outputs a movement signal for a position in which an integrated value or an average value of a detected intensity of the light in a preset region becomes high to the position adjustment unit.

A numerical controller includes a command analysis unit that generates movement command data by analyzing a program command and an axis travel calculation unit that, when the program command commands movement of a tool in a direction of a first straight axis orthogonal to an axis of rotation of a workpiece, converts a command value based on the program command for the movement of the tool in the direction of the first straight axis into a command value for a rotation angle of a turret, and a position of the tool is controlled in accordance with a rotation command for the turret based on the command value for the rotation angle of the turret calculated by the axis travel calculation unit, instead of the command based on the program command for the movement in the direction of the first straight axis.