Systems for reducing reduce downtime include industrial machines, sensor(s) associated therewith, edge agent(s), central controller(s), and display(s). The sensor(s) detect operational parameters (e.g., error condition) of the industrial machines associated therewith. The edge agent(s) receive information (e.g., logging messages) from the industrial machines and/or information from the sensors. The central controller(s). The central controllers receive and transform the information into standardized logging messages that are formatted identically, analyze the standardized logging messages to determine occurrence(s) of a current or anticipated error condition for any of the industrial machines, and transmit an alert and/or notification to the display(s) so users can take corrective action to ensure proper operation of the industrial machines. Such a system can be used in performing a corresponding method for reducing downtime associated with current or anticipated error conditions of such industrial machines.

Systems for reducing reduce downtime include industrial machines, sensor(s) associated therewith, edge agent(s), central controller(s), and display(s). The sensor(s) detect operational parameters (e.g., error condition) of the industrial machines associated therewith. The edge agent(s) receive information (e.g., logging messages) from the industrial machines and/or information from the sensors. The central controller(s). The central controllers receive and transform the information into standardized logging messages that are formatted identically, analyze the standardized logging messages to determine occurrence(s) of a current or anticipated error condition for any of the industrial machines, and transmit an alert and/or notification to the display(s) so users can take corrective action to ensure proper operation of the industrial machines. Such a system can be used in performing a corresponding method for reducing downtime associated with current or anticipated error conditions of such industrial machines.

A numerical controller, which is configured to control maintenance of a machine tool, includes a mode shift part configured to shift an operation mode of the machine tool to a maintenance mode, on the basis of input of a trigger for starting the maintenance of the machine tool, an operation execution part configured to make the machine tool operate on the basis of predetermined maintenance contents; and an output control part configured to control output of an operation result of the machine tool, as a maintenance result. The mode shift part returns the operation mode of the machine tool to a normal operation mode, after the output of the maintenance result by the output control part.

The invention relates to a system and a method for legally compliant documentation of health-relevant and safety-relevant process events in a food processing plant. The system comprises a workstation, an acquisition device, an auditor device, a report generator and a signing device. The acquisition device is assigned to the workstation and is configured to automatically acquire plant-related process variables. The auditor device, on the other hand, is configured to analyze the acquired process variables and identify a trigger event. Further, the auditor device is capable of generating a first data set including at least one of the acquired process variables and/or an information value about the trigger event. The report generator is adapted to determine a signing device responsible for the first data set. In addition, the report generator may generate a requirement data set comprising a signature requirement and at least part of the first data set. This requirement data set may be transmitted to the responsible signing device. The signing device is adapted to generate a requirement data set comprising an electronic signature for at least part of the requirement data set.

The invention relates to a system and a method for legally compliant documentation of health-relevant and safety-relevant process events in a food processing plant. The system comprises a workstation, an acquisition device, an auditor device, a report generator and a signing device. The acquisition device is assigned to the workstation and is configured to automatically acquire plant-related process variables. The auditor device, on the other hand, is configured to analyze the acquired process variables and identify a trigger event. Further, the auditor device is capable of generating a first data set including at least one of the acquired process variables and/or an information value about the trigger event. The report generator is adapted to determine a signing device responsible for the first data set. In addition, the report generator may generate a requirement data set comprising a signature requirement and at least part of the first data set. This requirement data set may be transmitted to the responsible signing device. The signing device is adapted to generate a requirement data set comprising an electronic signature for at least part of the requirement data set.

The objective of the present invention is to acquire maintenance information easily when an alarm is generated. This control device for controlling an industrial machine is provided with: a monitoring unit which monitors the industrial machine to detect an abnormality in the industrial machine; an information acquiring unit which acquires alarm information relating to an alarm pertaining to the abnormality detected by the monitoring unit, and maintenance information relating to maintenance for dealing with the abnormality; and a display control unit which causes the acquired alarm information and maintenance information to be displayed on a display device.

A method for generating a quote for fabrication of a part to be fabricated is disclosed. The method includes receiving, from a customer device associated with a customer, a design request for a part to be fabricated by a fabrication process. The design request includes a three-dimensional (3D) model file representing the part to be fabricated. The method further includes generating a feature vector for the part based on the model file and determining a total height of the part to be fabricated. Further, the method includes identifying one or more candidate orientations for the part to be fabricated and generating, as a function of a geometry of the part and a candidate orientation of the one or more candidate orientations, fabrication parameters for the part to be fabricated, wherein the fabrication parameters include a cost to fabricate the part and estimated completion date.

A method for generating a quote for fabrication of a part to be fabricated is disclosed. The method includes receiving, from a customer device associated with a customer, a design request for a part to be fabricated by a fabrication process. The design request includes a three-dimensional (3D) model file representing the part to be fabricated. The method further includes generating a feature vector for the part based on the model file and determining a total height of the part to be fabricated. Further, the method includes identifying one or more candidate orientations for the part to be fabricated and generating, as a function of a geometry of the part and a candidate orientation of the one or more candidate orientations, fabrication parameters for the part to be fabricated, wherein the fabrication parameters include a cost to fabricate the part and estimated completion date.

Systems and methods of optimizing wafer transport and metrology measurements in a fab are provided. Methods comprise deriving and updating dynamic sampling plans that provide wafer-specific measurement sites and conditions, deriving optimized wafer measurement paths for metrology measurements of the wafers that correspond to the dynamic sampling plan, managing FOUP (Front Opening Unified Pod) transport through the fab, transporting wafers to measurement tools while providing the dynamic sampling plans and the wafer measurement paths to the respective measurement tools before or as the FOUPs with the respective wafers are transported thereto, and carrying out metrology and/or inspection measurements of the respective wafers by the respective measurement tools according to the derived wafer measurement paths. Quantum computing resources may be used to solve the corresponding specific optimization problems, to reduce the required time, improve the calculated solutions and improve the fab yield and accuracy of the produced wafers.

Systems and methods of optimizing wafer transport and metrology measurements in a fab are provided. Methods comprise deriving and updating dynamic sampling plans that provide wafer-specific measurement sites and conditions, deriving optimized wafer measurement paths for metrology measurements of the wafers that correspond to the dynamic sampling plan, managing FOUP (Front Opening Unified Pod) transport through the fab, transporting wafers to measurement tools while providing the dynamic sampling plans and the wafer measurement paths to the respective measurement tools before or as the FOUPs with the respective wafers are transported thereto, and carrying out metrology and/or inspection measurements of the respective wafers by the respective measurement tools according to the derived wafer measurement paths. Quantum computing resources may be used to solve the corresponding specific optimization problems, to reduce the required time, improve the calculated solutions and improve the fab yield and accuracy of the produced wafers.