A patrol check system according to one aspect of the present invention includes at least one data collection device installed in a first position in an area in which facilities are installed, the data collection device being configured to collects measured values indicating a state of at least one facility installed in a first range around the first position, the facility belonging to a check target of the data collection device, the measured values being measured by a measurement device installed in the facility, and a patrol check device configured to acquire the measured values collected by the data collection device, and reflect the acquired measured values in a check result of a check record in which check items to be performed on the facility belonging to the check target of the data collection device are included.

A human-machine interface (HMI) system comprises a local operation device, a display device, a HMI display control device and a communication control device. The local operation device generates a local operation signal. The display device shows a display image corresponding to a display signal. The HMI display control device generates the display signal according to the local operation signal or a remote operation signal. The communication control device comprises a wireless communication connection port for connecting with a remote operation device. The communication control device transmits the local operation signal to the HMI display control device, transmits the display signal to the display device, and selectively transmits the display signal to the remote operation device. The communication control device outputs the remote operation signal to the HMI display control device when the communication control device determines itself receives the remote operation signal but does not receive the local operation signal.

A method, a computer system and an apparatus are disclosed for inspection recipe generation for the automated inspection of semiconductor devices. In order to generate the inspection recipe a reference data set is used. Automatic inspection is carried out with an initial recipe on images of dies of the reference data set (reference wafermap). The detected inspection results from the automatic inspection are classified and the classified inspection results are compared with an expert classification of defects in dies. Overkill and underkill numbers are automatically generated. According to the overkill and underkill numbers the inspection recipe parameters are modified. Automatic inspection is repeated if the detection and/or the classification are below a predefined threshold.

Tools and techniques are described to create a controller wiring board. A user, using a user interface associated with a controller, can determine which devices will be attached to a controller. The features of the devices may be already known by the controller. The controller can change wiring terminal types depending on the requirements of the devices wired to the controllers. In some embodiments, a device is wired to a module associated with the controller. The controller can signal to the module to modify its wiring terminal to match the needs of the device to be wired to that location.

A control system for a technical plant, in particular a process or manufacturing plant, includes an operator station server and an operator station client, wherein the operator station server includes a computer implemented visualization service that transmits a plant mimic diagram to the operator station client that visually presents the plant mimic diagram to an operator of the control system, where a digital process image of the technical plant is implemented on the operator station server, the operator station server additionally enables the operator to continuously monitor a runtime operator specifiable state of an operator-specifiable measuring device of the technical plant, where the operator station server additionally notifies the operator of a state change of the measuring device, independently of a visual presentation of the plant mimic diagram, and where the measuring device state is obtainable from the digital process image of the technical plant implemented on the operator station server.

The disclosure relates to a method and system for intelligent visualization in the monitoring of process and/or system data used in technical processes and in the operation of technical systems. The behavior of signals in the past is analyzed and used for a future optimized visualization. Continuously running online algorithms support the system operator by detecting and correspondingly highlighting deviations from the historically observed signal patterns.

A device management system includes a storage unit which stores, in advance and in correlation with device identification information set in each steam controller, location information indicating a location of each steam controller. The storage unit further stores in advance work patterns for the steam controller according to a classification based on a device type and an installation state of the steam controller. The system further includes a data extraction unit configured to extract from the storage unit the location information from the device identification information based on detection information. The data extraction unit is further configured to extract a corresponding work pattern from the device type and the installation state specified from the device identification information. A work information generation unit is included for generating work information including the extracted location information and work pattern for each work-target device.

A test system comprises a plurality of test devices which are connected to a plurality of machines and which perform a basic test, and a test management device which is connected to the plurality of test devices via a network. The test management device includes an additional test setting part which sets an additional test for determining a cause of an abnormality when determining that the machine has the abnormality. The test management device includes an adjustment part which sets the test device that performs the additional test. The adjustment part determines that the basic test planned to be performed by the test device that performs the additional test is performed by the other test device.

An abnormality detection procedure development apparatus (10) includes: a parameter setting unit (14) that sets a parameter verification range, with respect to the parameter relating to abnormality determination which is included in an abnormality detection procedure for a mechanical apparatus; an evaluation unit (15) that causes the value of the parameter to be changed in the parameter verification range, and, with respect to each of the values of the parameter that are changed, evaluates abnormality detection performance of the abnormality detection procedure; and a display unit (19) on which a performance evaluation table that is a listing of abnormality detection performances which are evaluated by the evaluation unit (15) is displayed with respect to each of the values of the parameter.

A system for remotely monitoring a process or equipment comprises: processing means for receiving one or more sensed outputs representative of one or more environmental conditions and/or process parameters and/or equipment conditions; interface means configurable by a user for selecting a subset of the one or more sensed outputs and for defining at least one output data string dependent on the one or more sensed outputs; and communication means for transmitting the at least one output data string.