A method includes storing, by a set of storage units, a set of appended encoded data slices, where an appended encoded data slice of the set of appended encoded data slices includes an encoded data slice of a set of encoded data slices and slice verification information. The method further includes identifying, by a rebuilding agent, one of the set of appended encoded data slices for rebuilding, rebuilding the encoded data slice, generating current slice verification information, and sending an appended rebuilt encoded data slice that includes the rebuilt encoded data slice and the current slice verification information to a storage unit. The method further includes verifying, by the storage unit, the current slice verification information corresponds to the slice verification information, and when the current slice verification information corresponds to the slice verification information, storing the appended rebuilt encoded data slice as a trusted rebuilt encoded data slice.

A memory system for a data processing apparatus includes a fault management unit, a memory controller (such as a memory management unit or memory node controller), and one or more storage devices accessible via the memory controller and configured for storing critical data. The fault management unit detects and corrects a fault in the stored critical data, a storage device or the memory controller. A data fault may be corrected using a copy of the data, or an error correction code, for example. A level of failure protection for the critical data, such as a number of copies, an error correction code or a storage location in the one or more storage devices, is determined dependent upon a failure characteristic of the device. A failure characteristic, such as an error rate, may be monitored and updated dynamically.

Provided herein may be a memory system and a method of operating the memory system. The memory system may include: a memory device comprising a plurality of semiconductor devices each including a plurality of memory blocks; and a controller configured to generate at least one or more descriptors in response to a request from a host, and control internal operations of the plurality of semiconductor devices based on the respective at least one or more descriptors. The controller may generate and manage at least one or more descriptor indexes respectively corresponding to the at least one or more descriptors. When a failure occurs during the internal operations of the plurality of semiconductor devices, at least one descriptor corresponding to a memory block in which the failure has occurred is searched for using the at least one or more descriptor indexes.

A semiconductor device includes first and second CPUs, first and second SPUs for controlling a snoop operation, a controller supporting ASIL D of a functional safety standard and a memory. The controller sets permission of the snoop operation to the first and second SPUs when a software lock-step is not performed. The controller sets prohibition of the snoop operation to the first and second SPUs when the software lock-step is performed. The first CPU executes a first software for the software lock-step, and writes an execution result in a first area for the memory. The second CPU executes a second software for the software lock-step, and writes an execution result in a second area of the memory. The execution result written in the first area is compared with the execution result written in the second area.

In one set of embodiments, a storage system can execute a repair process for a first component of a file or object stored on the storage system, where the repair process is initiated in response to the first component becoming inaccessible by the storage system, and where the file or object is split across a plurality of components including the first component. The executing can include, for each chunk in an address space of the first component starting from an initial chunk pointed to by a cursor: (1) determining whether the chunk is mapped to the first component, (2) if the chunk is mapped to the first component, copying data for the chunk from a mirror copy of the first component to a second component in the plurality of components, and (3) updating the cursor to point to a next chunk in the address space.

A semiconductor device is provided with normal memory cells constituted so as to store user data, reference memory cells constituted so as to generate a reference signal for reading out the normal memory cells, and a control circuit that carries out a defect detecting operation for detecting whether or not the reference memory cell and data stored in the reference memory cell are coincident with expected values on the stored data read out from the reference memory cells. Moreover, it is also provided with a control circuit for executing a defect correcting operation for correcting data to be stored in the reference memory cells that are detected as defective. Furthermore, it is also provided with a control circuit that is configured so as to cut off the reference memory cell detected as defective from the sense amplifier.

A circuit and method for verifying the operation of error checking circuitry. In one example, a circuit includes a memory, a first error checking circuit, a second error checking circuit, and a comparison circuit. The memory includes a data output. The first error checking circuit includes an input and an output. The input of the first error checking circuit is coupled to the data output of the memory. The second error checking circuit includes an input and an output. The input of the second error checking circuit is coupled to the data output of the memory. The comparison circuit includes a first input and a second input. The first input is coupled to the output of the first error checking circuit. The second input is coupled to the output of the second error checking circuit.

A memory dispatcher, including an address decoder configured to decode a write address of received write data; a lockstep processor configured to generate, based on the decoded write address, primary and redundant memory write addresses and corresponding primary and redundant copies of the write data, if the decoded write address corresponds with a lockstep region of the memory; and a comparator coupled to the lockstep processor, and configured to compare the primary and redundant copies of the write data, and to compare the primary and redundant memory write addresses.

A memory device includes a memory array having at least one memory bank, where the at least one memory bank includes a target memory array and a clone memory array. The clone memory array corresponds to the target memory array and is configured to store the same data as in the target memory array. When a command that is applied to the target memory array to perform an operation, the command is also applied to the clone memory array. An error detection method adapted to a memory device having at least one memory bank that comprises a target memory array and a clone memory array is also introduced.

Apparatuses, systems, and methods related to determination of a match between data values stored by several arrays are described. A system using the data values may manage performance of functions, including automated functions critical for prevention of damage to a product, personnel safety, and/or reliable operation, based on whether the data values match. For instance, one apparatus described herein includes a plurality of arrays of memory cells formed on a single memory chip. The apparatus further includes comparator circuitry configured to compare data values stored by two arrays selected from the plurality to determine whether there is a match between the data values stored by the two arrays. The apparatus further includes an output component configured to output data values of one of the two arrays responsive to determination of the match between the data values stored by the two arrays.