Various embodiments include components (e.g., a processor in a vehicle advanced driver assistance system) configured to identify subsystems that require testing in order to verify their compliance with a safety requirement. The components may determine whether verification of compliance requires that the subsystems be tested at PON, at POFF, during runtime or a combination thereof, dynamically determine the achievable parallelism for testing the identified subsystems, dynamically determine coverage level requirements for performing or executing built in self tests (BISTs) on each identified subsystem, and perform or execute the BISTs on the subsystems at the determined level of parallel and at the determined coverage level.

The invention relates to a debugging system and a debugging method of a multi-core processor. The debugging system includes a debugging host, a target processor, and a mapping and protocol conversion device. The debugging host includes a debugger, and the target processor includes a plurality of cores. The mapping and protocol conversion device is connected between the debugging host and the target processor, identifies a core architecture to which each of the cores belongs, and maps each of the cores respectively to at least one thread of at least one process according to the core architecture to which each of the cores belongs. Afterwards, the debugger executes a debugging procedure on the target processor according to the process and the thread corresponded to each of the cores.

A method for operating a control unit of a motor vehicle. A status inquiry is transmitted by a watchdog unit to a first monitoring unit, which is implemented on a first processor core of a multicore processor. A status response is ascertained by the first monitoring unit as a function of the status inquiry. A fault is ascertained by the watchdog unit as a function of the status response.

The present invention provides a vehicle control device with which, even when an abnormality is detected in a core in a multi-core processor, it is possible to reduce the time needed until the core in which the abnormality is detected restarts and re-executes application software. The present invention is characterized by being provided with: a diagnostic means for carrying out a diagnostic process when starting a processor core, the diagnostic process including hardware diagnosis performed by hardware and software diagnosis performed using software after the hardware diagnosis; and a diagnostic process information change processing means for changing the method for executing the diagnostic process when all of the processor cores are started and when one of the processor cores is restarted.

An integrated circuit comprises a set of processor cores, wherein each processor core of the set of processor cores includes BIST logic circuitry and multiple memory blocks coupled to the BIST logic circuitry. Each processor core further includes multiple power control circuitry, where each power control circuitry of the multiple power control circuitry is coupled to a respective processor core of the set of processor cores, multiple isolation circuitry, where each isolation circuitry of the multiple isolation circuitry is coupled to a respective processor core of the set of processor cores, a built-in-self repair (BISR) controller coupled to the each of the set of processor cores, each of the multiple power control circuitry, and each of the multiple isolation circuitry, and a safety controller coupled to the BISR controller, the multiple power control circuitry, and to the multiple isolation circuitry.

A program operating to test a computer has a limit to the number of certain components that it can utilize, less than the number of those components included in the computer. A resource allocator program receives a signal to modify allocation of resources to the programs executing in the computer. The resource allocator detects that the computer is operating in a mode for testing and selects a subset of the components not allocated to the program to swap for those presently allocated. The resource allocator can receive the signal repeatedly to complete testing the computer.

A method of monitoring thread execution within a multicore processor architecture which comprises a plurality of interconnected processor elements for processing the threads, the method comprising receiving a plurality of thread parameter indicators of one or more parameters relating to the function and/or identity and/or execution location of a thread or threads, comparing at least one of the thread parameter indicators with a first plurality of predefined criteria each representative of an indicator of interest, and generating an output consequential upon thread parameter indicators which have been identified to be of interest as a result of the said comparison.

A method includes holding a definition of multiple software-implemented tests for testing one or more hardware units of an Integrated Circuit (IC), and of invocation conditions that specify whether the tests are permitted to run. The tests are applied to the hardware units at least partially in parallel, using a processor in the IC, by repeatedly tracking respective execution states of the tests and evaluating the invocation conditions, and invoking a test that currently does not run but is permitted to run in accordance with the invocation conditions.

Apparatus and a method for processor core self-testing are disclosed. The apparatus comprises processor core circuitry to perform data processing operations by executing data processing instructions. Separate self-test control circuitry causes the processor core circuitry to temporarily switch from a first state of executing the data processing instructions to a second state of executing a self-test sequence of instructions, before returning to the first state of executing the data processing instructions without a reboot of the processor core circuitry being required. There is also self-test support circuitry, wherein the processor core circuitry is responsive to the self-test sequence of instructions to cause an export of at least one self-test data item via the self-test support circuitry to the self-test control circuitry.

During functional/normal operation of an integrated circuit including multiple independent processing elements, a selected independent processing element is taken offline and the functionality of the selected independent processing element is then tested while the remaining independent processing elements continue functional operation. To minimize voltage drops resulting from current fluctuations produced by the testing of the processing element, clocks used to synchronize operations within each partition of a processing element are staggered. This varies the toggle rate within each partition of the processing element during the testing of the processing core, thereby reducing the resulting voltage drop. This may also improve test quality within an automated test equipment (ATE) environment.