A device configured to periodically monitor operational activity of hardware components within a computing system infrastructure. The device is further configured to detect an issue that is associated with a hardware component, to identify commands that are sent to the hardware component to resolve the first issue, and to identify a test environment configuration for simulating the effect of sending the commands to the hardware component on the computing system infrastructure. The device is further configured to generate a solution script based on the identified commands and a testing script based on the identified test environment configuration, and to store an association between the first issue, the solution script, and the testing script in a script map.

A method for testing an integrated circuit, comprising: accessing a database associated with a test template, wherein said test template is configured to test a selected function of the integrated circuit; storing, in said database, data corresponding to at least partial predicted results of one or more random instruction sequences generated based on said test template; generating, by an automated test generation tool, a random instruction sequence based on said test template; executing said instruction sequence by a hardware exerciser, in the integrated circuit; and comparing results of said instruction sequence with said at least partial predicted results, to verify a function of said integrated circuit.

The automated test equipment is configured to establish communication, e.g. by uploading a program to the DUT using a first interface, such as a debug interface or a generic interface having access to the processing unit for external control. A typical use case of the first interface is debug access to the DUT, which typically requires limited data rates. In the case of the invention the first interface is an ATE access for test execution. The first interface configures the DUT to open a second interface running at much higher data rate, which is higher than the first interface, for additional communication. Additionally, the second interface may have extended capabilities compared to the first interface, such as presenting its own memory to the processing unit of the DUT as a normal system memory.

A memory controller coupled to a memory device and configured to control access operations of the memory device includes a host interface and a microprocessor. The microprocessor is coupled to the host interface and configured to set a value of a predetermined parameter to a specific value after the memory controller powers up and start to perform a link flow to try to establish a transmission link via the host interface. The predetermined parameter is one of a plurality of capability parameters of the host interface and the predetermined parameter is related to reception of the host interface. After the link flow is completed, the microprocessor is further configured to identify an object device with which the host interface establishes the transmission link according to the specific value and at least one of a plurality of attribute parameters associated with the transmission link.

A method and computer program for generating code coverage information during testing of a code sequence are described, in which the code sequence comprises decisions, each having one or more conditions as inputs. The method includes executing the code sequence on target processing circuitry under the control of test stimuli and maintaining, in memory, a code coverage table for at least one decision. When a decision is evaluated, a bitstring is created within a storage element, each position in the bitstring being associated with one of the conditions and the value in that position representing the value of that condition used in evaluating the decision. The bitstring is used to identify the entry, in the code coverage table associated with the evaluated decision, for that combination of values of the conditions, and a confirmation value is recorded in that entry, indicating that the decision has been evaluated for that entry.

Embodiments of the present disclosure provide a test method and apparatus for a control chip, and an electronic device, which relate to the field of semiconductor device test technologies. The control chip includes a built-in self-test BIST circuit. The method is performed by the BIST circuit. The method includes: reading first test vectors stored in a first target memory chip; sending the first test vectors to the control chip; receiving first output information returned by the control chip in response to the first test vectors; and acquiring a first test result of the control chip based on the first output information and the first test vectors corresponding to the first output information. By means of the technical solutions provided in the embodiments of the present disclosure, so that a storage space for test vectors can be enlarged, and the test efficiency can be increased.

A device configured to periodically monitor operational activity of hardware components within a computing system infrastructure. The device is further configured to detect an issue that is associated with a hardware component, to identify commands that are sent to the hardware component to resolve the first issue, and to identify a test environment configuration for simulating the effect of sending the commands to the hardware component on the computing system infrastructure. The device is further configured to generate a solution script based on the identified commands and a testing script based on the identified test environment configuration, and to store an association between the first issue, the solution script, and the testing script in a script map.

A method of assessing impact of applications executed by a computing device on a memory of the computing device includes: storing, in the memory, (i) a plurality of reference write operation sizes, and (ii) for each reference write operation size, a corresponding reference endurance indicator defining a write endurance; executing, at a processor of the computing device interconnected with the memory, a monitor application simultaneously with a test application; via execution of the monitor application at the processor: generating a usage profile for the test application, the usage profile defining a measured write operation size and a measured write operation rate for write operations initiated by the test application; determining an impact indicator for the test application based on the usage profile, the reference write operation sizes and the reference endurance indicators; and presenting the impact indicator.

A method includes receiving tester configuration data, test pattern data, and tester operation data; configuring a circuit for performing a designated test evaluation; generating a stimulus waveform; converting the stimulus waveform to an analog stimulus signal; transferring the analog stimulus signal to a first terminal of a MTJ DUT at reception of a trigger timing signal; generating time traces based on the trigger timing signal; generating a response signal at a second terminal of the MTJ DUT and across a termination resistor as the analog stimulus signal is transferred through the MTJ DUT; converting the response signal to a digitized response signal indicating its voltage amplitude; and performing the designated test evaluation and analysis function in the configurable circuit based on voltage amplitudes and time values of the stimulus waveform, the digitized response signal, and the timing traces.

A method and computer program for generating code coverage information during testing of a code sequence are described, in which the code sequence comprises decisions, each having one or more conditions as inputs. The method includes executing the code sequence on target processing circuitry under the control of test stimuli and maintaining, in memory, a code coverage table for at least one decision. When a decision is evaluated, a bitstring is created within a storage element, each position in the bitstring being in associated with one of the conditions and the value in that position representing the value of that condition used in evaluating the decision. The bitstring is used to identify the entry, in the code coverage table associated with the evaluated decision, for that combination of values of the conditions, and a confirmation value is recorded in that entry, indicating that the decision has been evaluated for that entry.