An automated test equipment (ATE) system includes a plurality of test blades each coupled to a test blade connector and mounted on a circular track; a central reference clock (CRC) having an origin point at a center of the circle; and a clock/sync connector coupled to the CRC through a zero skew clock connection to one or more sync buses, wherein each instrument utilizes the CRC to coordinate its testing process with another instrument.

Metadata of a target data record set population is used to generate a test data record set population for use in data storage system testing. The metadata includes values for metadata parameters for individual target data record sets. The target data record set population as a whole has metadata parameter values distributed among sets of value ranges. A group of proportions is calculated for each set of value ranges. A test data record set population is generated based on the groups of proportions. As generated, the test data record set population meets a set of predetermined criteria.

Systems, apparatuses and methods may provide for receiving one or more debug communications and programming, via a bus, a set of debug registers with debug information corresponding to the one or more debug communications. Additionally, tunnel logic hardware may be instructed to transfer the debug information from the set of debug registers to one or more test access ports of an intelligent device such as a non-volatile memory storage unit having a microcontroller. In one example, if it is detected that debug permission has been granted during a boot process, a control status register may be unlocked. If, on the other hand, the debug permission is not detected during the boot process, the control status register may be locked. Accordingly, an enable bit of the control status register may be used to activate the tunnel logic hardware only if the control status register is unlocked.

Embodiments relate to pre-silicon device testing using a persistent command table. An aspect includes receiving a value for a persistent command parameter from a user. Another aspect includes determining whether the value of the persistent command parameter is greater than zero. Another aspect includes based on determining whether the value of the persistent command parameter is greater than zero, selecting a number of commands equal to the value of the persistent command parameter from a regular command table of a driver of a device under test. Another aspect includes adding the selected commands to the persistent command table of the driver. Another aspect includes performing testing of the device under test via the driver using only commands that are in the persistent command table of the driver.

A management controller may be configured to control connectivity among a host system processor, a primary ROM, and a recovery ROM in accordance with a plurality of modes of operation including at least a normal mode that occurs in response to absence of a corruption of the ROM code in which the management controller causes the host system processor to be communicatively coupled to the primary ROM and communicatively decoupled from the recovery ROM, such that the host system processor loads and executes the ROM code during boot of the host system, and a primary ROM recovery mode that occurs in response to presence of the corruption of the ROM code in which the management controller causes the host system processor to be coupled to the primary ROM and the recovery ROM, such that the host system processor loads and executes the recovery code during boot of the host system.

Embodiments relate to pre-silicon device testing using a persistent command table. An aspect includes receiving a value for a persistent command parameter from a user. Another aspect includes determining whether the value of the persistent command parameter is greater than zero. Another aspect includes based on determining whether the value of the persistent command parameter is greater than zero, selecting a number of commands equal to the value of the persistent command parameter from a regular command table of a driver of a device under test. Another aspect includes adding the selected commands to the persistent command table of the driver. Another aspect includes performing testing of the device under test via the driver using only commands that are in the persistent command table of the driver.

Data is replicated into a memory cache and cache inhibited memory in data segments with segment size that provides non-naturally aligned data boundaries to reduce the time needed to generate test cases for testing a processor. Placing data in the non-naturally aligned data boundaries allows replicated testing of the memory cache and cache inhibited memory while preserving double word and quad word boundaries in segments of the replicated test data. This allows test cases generated for cacheable memory to be replicated and used for cache inhibited memory. The processor can then use a single test replicated in this manner by branching back and using the next slice of the replicated test data in the memory cache and cache inhibited memory.

Methods and systems for performing efficient integration tests on mobile device for contactless data transfers are described. Rather than performing contactless communications with a variety of test user devices (e.g., test smart cards), which may be time consuming and may present physical difficulty, a mobile device can simulate the result of these communications using a simulator application operating on the mobile device. A contactless communication application, also operating on the mobile device, can communicate with the simulator application in order to generate interaction payloads based on stored data records corresponding to the test user devices. These interaction payloads can then be transmitted by the mobile device to a processing computer. Later, the mobile device may receive a response from the processing computer or another computer system, indicating if the interaction payloads were successfully received and interpreted. This in turn may indicate if the integration test was successful.

An approach for improving efficiency of cycle-reproducible debug in a multi-core environment is provided. The approach executes an exerciser image on one or more cores, wherein the exerciser image includes one or more different seeds. The approach determines a seed from the one or more different seeds that locates a fail-condition. Responsive to determining a seed from the one or more different seeds that locates the fail condition, the approach determines an upper bound and a lower bound of the fail-condition. The approach determines an exact cycle where the fail-condition occurs. The approach constructs a multi-cycle trace for the fail-condition.

In an example, a system-on-chip (SoC) includes a hardware power-on-reset (POR) sequencer circuit coupled to a POR pin. The SoC further includes a platform management unit (PMU) circuit, coupled to the hardware POR sequencer circuit, the PMU including one or more central processing units (CPUs) and a read only memory (ROM). The SoC further includes one or more processing units configured to execute a boot process. The hardware POR sequencer circuit is configured to initialize the PMU. The one or more CPUs of the PMU are configured to execute code stored in the ROM to perform a pre-boot initialization.