A data storage device includes a memory device and a controller coupled to the memory device. The controller is configured to receive new debug information, determine that a debug buffer does not have any available free entries for the new debug information, compare the priority information to a lowest priority information of old debug information stored in the debug buffer, remove a most recent old debug information that has a lowest priority information from the debug buffer, and place the new debug information and corresponding priority information in the debug buffer.

A method for processing data, includes: acquiring data packets having respective serial numbers and transmitted between a first microcontroller unit (MCU) and a second MCU of a smart device, the second MCU being provided in a Wireless Fidelity (Wi-Fi) module of the smart device; and processing and displaying the acquired data packets based on the respective serial numbers so as to debug the second MCU.

A tester instruction generation unit generates a tester instruction for terminals of a plurality of devices connected to a tester based on an instruction of a user program and causes an instruction storage unit to store the tester instruction. A transfer mode setting unit sets a transfer mode to either a successive transfer mode or a batch transfer mode, based on the number of tester instructions in the instruction storage unit or an instruction of the user program. A transfer control unit transmits the tester instruction in the instruction storage unit to the tester in accordance with the set transfer mode.

Technologies are described for simulating requests to backend applications using a generic application programming interface (API). The requests can be received, from frontend web applications, by a simulation service that operates the generic API. For example, the simulation service can receive and process actions to create entries for entities, actions to return entries for entities, actions to delete entries for entities and/or other actions. The simulation service can perform the requested actions and return results. The simulation service can support arbitrary entities and entity and without using definitions of predefined entities or properties.

An arrangement for the partial release of a debug interface of a programmable hardware component, whereby a first logic for the programmable hardware component can be stored in a configuration memory and a configuration device is designed to program the programmable hardware component via a configuration interface of the programmable hardware component according to the first logic. The configuration device is further designed to register a programming process of the programmable hardware component which occurs via the debug interface according to a second logic and, upon termination of the programming process occurring via the debug interface, reprograms the programmable hardware component according to the first logic.

Methods, systems, and devices for error detection event mechanism are described. The memory system may identify a fault condition and transmit, to a host system, a message indicating a first indication that the fault condition exists at the memory system. In some cases, the memory system may set, in a register of the memory system, a second indication indicating a type of the fault condition based on identifying the fault condition. The memory system may perform a recovery procedure based on the first indication and the second indication.

An interconnect offload component arranged to operate in an offloading mode, and a memory access component for enabling access to a memory element for functional data transmitted over a debug network of a signal processing device.

In the offloading mode the interconnect offload component is arranged to receive functional data from an interconnect client component for communication to a destination component, and forward at least a part of the received functional data to a debug network for communication to the destination component via the debug network.

The memory access component is arranged to receive a debug format message transmitted over the debug network, extract functional data from the received debug format message, said functional data originating from an interconnect client component for communication to a memory element, and perform a direct memory access to the memory element comprising the extracted functional data.

An integrated circuit (IC) includes a plurality of intellectual properties (IPs), each of the plurality of IPs includes a test logic. A first memory controller provides user data received from at least one of the plurality of IPs to a first memory in a first operation mode. A scanner gathers debugging data from the test logics of the plurality of IPs in a second operation mode. And a second memory controller receives the debugging data from the scanner and provides the debugging data to the first memory in the second operation mode.

A processing device in a memory system receives, from a host system, a request for a debug slave address associated with a system management bus port of a memory sub-system and sends a response comprising the debug slave address to the host system. The processing device receives, from the host system, a request to enable the system management bus port to receive a request for debug information directed to the debug slave address, receives, from the host system, the request for debug information directed to the debug slave address, and sends the debug information to the host system over a system management bus coupled to the system management bus port of the memory sub-system.

An apparatus comprises a first semiconductor chip comprising a first communication controller to receive first debug data from a second semiconductor chip; a memory to store the first debug data from the second semiconductor chip and second debug data of the first semiconductor chip; and a second communication controller to transmit the first debug data from the second semiconductor chip and the second debug data of the first semiconductor chip to an output port of the first semiconductor chip.