Patent classifications
G06F18/2431
Intelligent recognition and extraction of numerical data from non-numerical graphical representations
Embodiments of the invention are directed to systems, methods, and computer program products for a unique platform for analyzing, classifying, extracting, and processing information from graphical representations. Embodiments of the inventions are configured to provide an end to end automated solution for extracting data from graphical representations and creating a centralized database for providing graphical attributes, image skeletons, and other metadata information integrated with a graphical representation classification training layer. The invention is designed to receive a graphical representation for analysis, intelligently identify and extract objects and data in the graphical representation, and store the data attributes of the graphical representation in an accessible format in an automated fashion.
Generation of expanded training data contributing to machine learning for relationship data
An apparatus identifies partial tensor data that contributes to machine learning using tensor data in a tensor format obtained by transforming training data having a graph structure. Based on the partial tensor data and the training data, the apparatus generates expanded training data to be used in the machine learning by expanding the training data.
FEATURE AMOUNT SELECTION METHOD, FEATURE AMOUNT SELECTION PROGRAM, FEATURE AMOUNT SELECTION DEVICE, MULTI-CLASS CLASSIFICATION METHOD, MULTI-CLASS CLASSIFICATION PROGRAM, MULTI-CLASS CLASSIFICATION DEVICE, AND FEATURE AMOUNT SET
The present invention is to provide a multi-class classification method, a multi-class classification program, and a multi-class classification device which can robustly and highly accurately classify a sample having a plurality of feature amounts into any of a plurality of classes based on a value of a part of the selected feature amount. In addition, the present invention is to provide a feature amount selection method, a feature amount selection program, a feature amount selection device, and a feature amount set used for such multi-class classification. The present invention handles a multi-class classification problem involving feature amount selection. The feature amount selection is a method of literally selecting in advance a feature amount needed for each subsequent processing (particularly, the multi-class classification in the present invention) from among a large number of feature amounts included in a sample. The multi-class classification is a discrimination problem that decides which of a plurality of classes a given unknown sample belongs to.
FEATURE AMOUNT SELECTION METHOD, FEATURE AMOUNT SELECTION PROGRAM, FEATURE AMOUNT SELECTION DEVICE, MULTI-CLASS CLASSIFICATION METHOD, MULTI-CLASS CLASSIFICATION PROGRAM, MULTI-CLASS CLASSIFICATION DEVICE, AND FEATURE AMOUNT SET
The present invention is to provide a multi-class classification method, a multi-class classification program, and a multi-class classification device which can robustly and highly accurately classify a sample having a plurality of feature amounts into any of a plurality of classes based on a value of a part of the selected feature amount. In addition, the present invention is to provide a feature amount selection method, a feature amount selection program, a feature amount selection device, and a feature amount set used for such multi-class classification. The present invention handles a multi-class classification problem involving feature amount selection. The feature amount selection is a method of literally selecting in advance a feature amount needed for each subsequent processing (particularly, the multi-class classification in the present invention) from among a large number of feature amounts included in a sample. The multi-class classification is a discrimination problem that decides which of a plurality of classes a given unknown sample belongs to.
UNKNOWN OBJECT CLASSIFICATION FOR UNSUPERVISED SCALABLE AUTO LABELLING
Classifying unknown samples for scalable automatic labeling are disclosed. Unknown samples are soft labeled at edge nodes. When a node cannot soft label a sample, a candidate node is selected. The candidate node is selected based on why the sample cannot be labelled. The sample is communicated to the candidate node for labeling. If the candidate node is unsuccessful, a different candidate node may be identified to process and label the sample.
UNKNOWN OBJECT CLASSIFICATION FOR UNSUPERVISED SCALABLE AUTO LABELLING
Classifying unknown samples for scalable automatic labeling are disclosed. Unknown samples are soft labeled at edge nodes. When a node cannot soft label a sample, a candidate node is selected. The candidate node is selected based on why the sample cannot be labelled. The sample is communicated to the candidate node for labeling. If the candidate node is unsuccessful, a different candidate node may be identified to process and label the sample.
System and method for multiclass classification of images using a programmable light source
An apparatus, system and process for identifying one or more different tissue types are described. The method may include applying a configuration to one or more programmable light sources of an imaging system, where the configuration is obtained from a machine learning model trained to distinguish between the one or more different tissue types captured in image data. The method may also include illuminating a scene with the configured one or more programmable light sources, and capturing image data that includes one or more types of tissue depicted in the image data. Furthermore, the method may include analyzing color information in the captured image data with the machine learning model to identify at least one of the one or more different tissue types in the image data, and rendering a visualization of the scene from the captured image data that visually differentiates tissue types in the visualization.
System and method for multiclass classification of images using a programmable light source
An apparatus, system and process for identifying one or more different tissue types are described. The method may include applying a configuration to one or more programmable light sources of an imaging system, where the configuration is obtained from a machine learning model trained to distinguish between the one or more different tissue types captured in image data. The method may also include illuminating a scene with the configured one or more programmable light sources, and capturing image data that includes one or more types of tissue depicted in the image data. Furthermore, the method may include analyzing color information in the captured image data with the machine learning model to identify at least one of the one or more different tissue types in the image data, and rendering a visualization of the scene from the captured image data that visually differentiates tissue types in the visualization.
Neural network training device, system and method
A device includes image generation circuitry and convolutional-neural-network circuitry. The image generation circuitry, in operation, generates a digital image representation of a wafer defect map (WDM). The convolutional-neural-network circuitry, in operation, generates a defect classification associated with the WDM based on: the digital image representation of the WDM and a data-driven model associating WDM images with classes of a defined set of classes of wafer defects and generated using a training data set augmented based on defect pattern orientation types associated with training images.
Neural network training device, system and method
A device includes image generation circuitry and convolutional-neural-network circuitry. The image generation circuitry, in operation, generates a digital image representation of a wafer defect map (WDM). The convolutional-neural-network circuitry, in operation, generates a defect classification associated with the WDM based on: the digital image representation of the WDM and a data-driven model associating WDM images with classes of a defined set of classes of wafer defects and generated using a training data set augmented based on defect pattern orientation types associated with training images.