A switched-capacitor integrator is described having the contribution to offset from the charge injection mismatch of switches connected to the summing nodes mitigated by using a switching scheme that conveys basically all the charge injection to the output, thus preventing net offset from being integrated.

A switched-capacitor integrator is described having the contribution to offset from the charge injection mismatch of switches connected to the summing nodes mitigated by using a switching scheme that conveys basically all the charge injection to the output, thus preventing net offset from being integrated.

Some embodiments of the invention may include an eddy current nondestructive evaluation device. The eddy current nondestructive evaluation device may include a rotating body; a motor coupled with the rotating body such that the motor rotates the rotating body; a permanent magnet coupled with the rotating body; a pickup coil coupled with the rotating body; and an integrator circuit electrically coupled with the pickup coil that integrates a voltage from the pickup coil to produce integrated voltage data.

A summing circuit, including a capacitor, a switching circuit capable of connecting the capacitor between a first node (ana) and a second node (ref), between a third node and the second node in a first connection direction or between the third node and the second node in a second connection direction, an integrator coupled to the third node, a hysteresis comparator coupled to the output of the integrator, and a counter coupled to the output of the hysteresis comparator.

Numerous embodiments for processing the current output of a vector-by-matrix multiplication (VMM) array in an artificial neural network are disclosed. The embodiments comprise a summer circuit and an activation function circuit. The summer circuit and/or the activation function circuit comprise circuit elements that can be adjusted in response to the total possible current received from the VMM to optimize power consumption.

A physical quantity measurement device includes a sensor element having a coupling capacitance formed between a drive electrode and a detection electrode, and a circuit device having a drive circuit adapted to supply a drive signal to the drive electrode, a detection circuit adapted to detect physical quantity information corresponding to a physical quantity based on a detection signal from the detection electrode, and a fault diagnosis circuit, and the fault diagnosis circuit has an electrostatic leakage component extraction circuit adapted to extract an electrostatic leakage component due to the coupling capacitance from one of the detection signal and an amplified signal of the detection signal, and performs a fault diagnosis based on the electrostatic leakage component extracted.

A physical quantity measurement device includes a sensor element having a coupling capacitance formed between a drive electrode and a detection electrode, and a circuit device having a drive circuit adapted to supply a drive signal to the drive electrode, a detection circuit adapted to detect physical quantity information corresponding to a physical quantity based on a detection signal from the detection electrode, and a fault diagnosis circuit, and the fault diagnosis circuit has an electrostatic leakage component extraction circuit adapted to extract an electrostatic leakage component due to the coupling capacitance from one of the detection signal and an amplified signal of the detection signal, and performs a fault diagnosis based on the electrostatic leakage component extracted.

An example SC integrator can include first and second sampling capacitors, an amplifier, an integrating capacitor, coupled at least to an output of the amplifier, and a switching arrangement. The SC integrator can be configured for adding (i.e., integrating in the integrating capacitor) sign-inverted samples of a flicker noise of the amplifier at one or more cycles of a master clock and can be configured for keeping the time distance/delay between those samples relatively small across a range of master clock frequencies.

An example SC integrator can include first and second sampling capacitors, an amplifier, an integrating capacitor, coupled at least to an output of the amplifier, and a switching arrangement. The SC integrator can be configured for adding (i.e., integrating in the integrating capacitor) sign-inverted samples of a flicker noise of the amplifier at one or more cycles of a master clock and can be configured for keeping the time distance/delay between those samples relatively small across a range of master clock frequencies.

Some embodiments include apparatuses having a first circuit portion, a second circuit portion, and a third circuit portion. The first circuit portion includes a first transistor to receive a first signal of a differential signal pair and a second transistor to receive a second signal of the differential signal pair. The second circuit portion is coupled to the first and second transistors and a first supply node, the second circuit portion including a first output node and a second output node to provide an output signal pair based on the differential signal pair. The third circuit portion includes a first diode-connected transistor coupled between the first output node and a second supply node and a second diode-connected transistor coupled between the second output node and the second supply node.