The invention relates to radiofrequency transponder circuits, and in particular to such transponder circuits having a unique identifier. Embodiments disclosed include a radiofrequency transponder circuit (100) comprising an antenna module (101), a control circuit (103) and a memory (104), the transponder circuit (100) being configured to respond to a read command received via the antenna module (101) by the control circuit (103) reading and transmitting an identifier stored in the memory (104) via the antenna module (101), wherein the control circuit (103) is configured to perform an integrity check on data stored in the memory (104) upon being powered up by a reader field a first time via the antenna module (101) and to not perform the integrity check for a predetermined time period upon being powered up by a reader field subsequent times via the antenna module (101).

An RFID reader, RFID tag, and method thereof for performing a write check of tag data. According to an exemplary embodiment, the RFID reader may include: a transmitter to transmit a write check command to an RFID tag; a receiver to receive a response including a check value of data, which needs a write check, from an RFID tag that has received the write check command; and a controller to perform information transmission and reception processes, and check data written on the RFID tag by using the received response.

According to an exemplary embodiment, a method of detecting edge cracks in a die under test is provided. The method includes the following operations: receiving a command signal; providing power from the command signal; providing a response signal based on the command signal; and self-destructing based on the command signal.

A semiconductor device employs at least one of semiconductor chip groups. The semiconductor device includes a semiconductor chip included in the semiconductor chip groups, and a package. The semiconductor chip includes an information recording region on which is recorded a first piece of identification information indicating to which group of the semiconductor chip groups the semiconductor chip belongs based on a first category. The information recording region includes a plurality of fuses selectively blown in accordance with the first piece of identification information. Indicated on the package is a second piece of identification information indicating to which group of the semiconductor chip groups the semiconductor chip belongs based on a second category. The first and second pieces of identification information are combined together to identify the semiconductor chip from among the semiconductor chip groups.

A debug method implemented by a first near field communication (NFC) device includes a step of storing, in a memory of the first NFC device, one or more parameters which are associated with the operation of the first NFC device during a communication with a second distant NFC device. The first NFC device then uses an answer to select (ATS) communication, sent in response to receipt of an answer to select (ATS) communication, to send the stored one or more parameters to the second distant NFC device.

A system and method is described for an automated RFID quality control process. The method may include configuring an RFID manufacturing press with quality control specifications, manufacturing a batch of RFID inlays, executing a performance test on each RFID inlay, comparing the results of the performance test to the quality control specifications, and determining a pass or fail status for the batch of RFID inlays based on the results of the performance test. The system may include an RFID manufacturing press having at least one lane, at least one interrogator antenna, and programmable control logic for the RFID manufacturing press, wherein the programmable control logic is adapted to execute a performance test on each RFID relay of a batch of RFID relays output by the manufacturing press, compare the results of the performance test to user-configurable quality control specifications, and determine whether the batch of RFID relays meets the specifications.

A card including a data transmission mechanism using annex transmission channels. A method is described for the transmission of data by a chip card at an end of its life using hidden communication channels different from standard communication channels of the card. The data are transmitted by modulating a binary signal that results from a modification of a hardware parameter of the card.

A Radio Frequency Identification (RFID) tag IC stores an identifier and a check code. The IC determines whether the stored identifier is corrupted by comparing it to the check code. If the stored identifier does not correspond to the check code then the IC may terminate operation or indicate an error. The IC may also reconstruct the correct identifier from the check code.

This disclosure relates to inline testing of RFID inlays. A test system includes a test interface without moving parts and a marking device. The test interface an array of antennas, a radio frequency identification (RFID) reader to interrogate RFID inlays to be tested; and a circuit configured to selectively connect the RFID reader to the antenna in the array of antenna. The test interface performs a primary scan of all of the RFID inlays to be tested and, when not all of the RFID inlays respond, a secondary scan to determine which of the RFID inlays failed to respond. The marking devices mark any of the identified RFID inlays that failed to respond.