G06V10/145

USING AN ILLUMINATION SEQUENCE PATTERN FOR BIOMETRIC AUTHENTICATION

Technology described herein includes a method that includes receiving, at one or more processing devices, data corresponding to a first image, and determining, by the one or more processing devices based on the received data, that a first set of pixel values of the first image corresponds to illumination of a first representative wavelength, and at least a second set of pixel values of the first image corresponds to illumination of a second representative wavelength. The illuminations of the first and second representative wavelengths constitute at least a portion of a first illumination sequence pattern used in capturing the first image. The method also includes determining that the first illumination sequence pattern matches a second illumination sequence pattern associated with a device from which the first image is expected to be received, and in response, initiating a biometric authentication process for authenticating a subject represented in the first image.

USING AN ILLUMINATION SEQUENCE PATTERN FOR BIOMETRIC AUTHENTICATION

Technology described herein includes a method that includes receiving, at one or more processing devices, data corresponding to a first image, and determining, by the one or more processing devices based on the received data, that a first set of pixel values of the first image corresponds to illumination of a first representative wavelength, and at least a second set of pixel values of the first image corresponds to illumination of a second representative wavelength. The illuminations of the first and second representative wavelengths constitute at least a portion of a first illumination sequence pattern used in capturing the first image. The method also includes determining that the first illumination sequence pattern matches a second illumination sequence pattern associated with a device from which the first image is expected to be received, and in response, initiating a biometric authentication process for authenticating a subject represented in the first image.

Obstacle detection device, driving assistance system, and obstacle detection method

A first light projector projects first slit light that spreads in the width direction of a vehicle in a direction other than a direction parallel to a contact ground surface. A second light projector projects second slit light that spreads in the width direction of the vehicle in a direction parallel to the contact ground surface. An obstacle detection unit detects an obstacle using a captured image of an area surrounding the vehicle where the first slit light and the second slit light are projected.

System to determine item footprint

Footprint data of an item that is representative of a boundary of the item and where that boundary is located is obtained using occlusion of a projected line. Line projectors are arranged at opposite sides of a conveyor belt and at an angle that is acute with respect to a plane of the conveyor belt and produce lines on the conveyor belt within a measurement area. As an item moves past the measurement area, the sides of the item occlude a portion of the projected lines. Cameras acquire a series of images as the object moves with respect to the measurement area. The images are processed to determine where the projected lines were occluded. An edge point is then determined representative of that location. One or more lines may be fitted to a plurality of edge points to determine the boundary of the item.

METHOD FOR LOCATION OBJECTS IN ALTERNATIVE REALITY, ELECTRONIC DEVICE, AND NON-TRANSITORY STORAGE MEDIUM
20240013425 · 2024-01-11 ·

An object location method to obtain location information of an object based on positioning light comprises: emitting a first positioning light, to scan a preset region where the object is located to obtain a characteristic value of each of multiple standard regions in the preset region, wherein the preset region comprises multiple standard regions; determining a basic region where the object is located according to the characteristic value of each standard region, wherein each of the standard region comprises multiple basic regions; and emitting a second positioning light to the basic regions where the object is located and to obtain coordinates of the object. An electronic device and a non-transitory storage medium are also provided.

METHOD FOR LOCATION OBJECTS IN ALTERNATIVE REALITY, ELECTRONIC DEVICE, AND NON-TRANSITORY STORAGE MEDIUM
20240013425 · 2024-01-11 ·

An object location method to obtain location information of an object based on positioning light comprises: emitting a first positioning light, to scan a preset region where the object is located to obtain a characteristic value of each of multiple standard regions in the preset region, wherein the preset region comprises multiple standard regions; determining a basic region where the object is located according to the characteristic value of each standard region, wherein each of the standard region comprises multiple basic regions; and emitting a second positioning light to the basic regions where the object is located and to obtain coordinates of the object. An electronic device and a non-transitory storage medium are also provided.

ENHANCED MATERIAL DETECTION BY STEREO BEAM PROFILE ANALYSIS

A detector (110) for determining at least one material property of at least one object (112) is proposed. The detector (110) comprises at least one projector (116) configured for illuminating the object (112) with at least one illumination pattern (118) comprising a plurality of illumination features (120); at least one first camera (122) having at least one first sensor element, wherein the first sensor element has a matrix of first optical sensors, the first optical sensors each having a light-sensitive area, wherein each first optical sensor is designed to generate at least one sensor signal in response to an illumination of its respective light-sensitive area by a reflection light beam propagating from the object (112) to the first camera (122), wherein the first camera (122) is configured for imaging at least one first reflection image comprising a plurality of first reflection features generated by the object (112) in response to illumination by the illumination features (120), wherein the first camera (122) is arranged such that the first reflection image is imaged under a first direction of view to the object (112); at least one second camera (124) having at least one second sensor element, wherein the second sensor element has a matrix of second optical sensors, the second optical sensors each having a light-sensitive area, wherein each second optical sensor is designed to generate at least one sensor signal in response to an illumination of its respective light-sensitive area by a reflection light beam propagating from the object (112) to the second camera (124), wherein the second camera (124) is configured for imaging at least one second reflection image comprising a plurality of second reflection features generated by the object (112) in response to illumination by the illumination feature (120), wherein the second camera (124) is arranged such that the second reflection image is imaged under a second direction of view to the object (112), wherein the first direction of view and the second direction of view differ; at least one evaluation device (126) configured for evaluating the first reflection image and the second reflection image, wherein the evaluation comprises matching the first reflection features and the second reflection features and determining a combined material property of matched pairs of first and second reflection features by analysis of their beam profiles.

ENHANCED MATERIAL DETECTION BY STEREO BEAM PROFILE ANALYSIS

A detector (110) for determining at least one material property of at least one object (112) is proposed. The detector (110) comprises at least one projector (116) configured for illuminating the object (112) with at least one illumination pattern (118) comprising a plurality of illumination features (120); at least one first camera (122) having at least one first sensor element, wherein the first sensor element has a matrix of first optical sensors, the first optical sensors each having a light-sensitive area, wherein each first optical sensor is designed to generate at least one sensor signal in response to an illumination of its respective light-sensitive area by a reflection light beam propagating from the object (112) to the first camera (122), wherein the first camera (122) is configured for imaging at least one first reflection image comprising a plurality of first reflection features generated by the object (112) in response to illumination by the illumination features (120), wherein the first camera (122) is arranged such that the first reflection image is imaged under a first direction of view to the object (112); at least one second camera (124) having at least one second sensor element, wherein the second sensor element has a matrix of second optical sensors, the second optical sensors each having a light-sensitive area, wherein each second optical sensor is designed to generate at least one sensor signal in response to an illumination of its respective light-sensitive area by a reflection light beam propagating from the object (112) to the second camera (124), wherein the second camera (124) is configured for imaging at least one second reflection image comprising a plurality of second reflection features generated by the object (112) in response to illumination by the illumination feature (120), wherein the second camera (124) is arranged such that the second reflection image is imaged under a second direction of view to the object (112), wherein the first direction of view and the second direction of view differ; at least one evaluation device (126) configured for evaluating the first reflection image and the second reflection image, wherein the evaluation comprises matching the first reflection features and the second reflection features and determining a combined material property of matched pairs of first and second reflection features by analysis of their beam profiles.

System For Detecting Surface Type Of Object And Artificial Neural Network-Based Method For Detecting Surface Type Of Object
20240011916 · 2024-01-11 ·

A system for detecting a surface type of an object includes a driver component, a driver component, and a plurality of photosensitive elements. The surface of the object is divided along a first direction into a plurality of areas, and the driver component sequentially moves one of the plurality of areas to a detection position. The light source component faces the detection position and provides light of a plurality of spectra that are different from one another to illuminate the detection position. The photosensitive elements face different sections of the area at the detection position, to capture detection images of different sections of the area located at the detection position under the light of each of the spectra. One photosensitive axis of the photosensitive elements is parallel to the normal line while another photosensitive axis of the photosensitive elements is between the normal line and the first direction.

System For Detecting Surface Type Of Object And Artificial Neural Network-Based Method For Detecting Surface Type Of Object
20240011916 · 2024-01-11 ·

A system for detecting a surface type of an object includes a driver component, a driver component, and a plurality of photosensitive elements. The surface of the object is divided along a first direction into a plurality of areas, and the driver component sequentially moves one of the plurality of areas to a detection position. The light source component faces the detection position and provides light of a plurality of spectra that are different from one another to illuminate the detection position. The photosensitive elements face different sections of the area at the detection position, to capture detection images of different sections of the area located at the detection position under the light of each of the spectra. One photosensitive axis of the photosensitive elements is parallel to the normal line while another photosensitive axis of the photosensitive elements is between the normal line and the first direction.