G06V10/752

Method of Aligning Virtual and Real Objects
20230274517 · 2023-08-31 ·

A method for aligning the positions and orientations of a real object and a virtual object in real space, the virtual object corresponding to a virtual replica of the real object, the method comprising visualizing at least one alignment feature superimposed on or replacing a representation of the virtual object in a field of view containing the real object, wherein the alignment feature is indicative of a position and orientation of the virtual object in real space, and wherein the at least one alignment feature complements a shape and/or surface pattern of the real object, such that the alignment feature and the real object form a composite object with complementing patterns and/or shapes in the field of view, when the real object and the virtual object are aligned.

System and Method of Determining a Curve

A neural network is configured to process image data captured by a vehicle-mounted camera. The neural network includes common processing layers (a trunk) and separate, parallelizable processing layers (branches). An object detection branch of the neural network is trained to detect objects that may be visible from the vehicle-mounted camera, such as cars, trucks, and traffic signs. A curve determination branch is trained to detect and parameterize salient curves, such as lane boundaries and road boundaries. The curve determination branch itself is configured with a trunk and branch architecture, having both common and separate processing layers. A first branch computes a likelihood that a curve is present in a given location of the image data and a second branch further localizes the curve within the given location if such a curve is present. Training of the different branches of the neural network may be decoupled.

Image-based decomposition for fast iterative solve of complex linear problems

A system and method are disclosed for solving a supply chain planning problem modeled as a linear programming (LP) problem. Embodiments include receiving a matrix formulation of at least a portion of the LP problem representing a supply chain planning problem for a supply chain network, generating an image based on the matrix formulation to identify connected components, partitioning the matrix formulation based, at least in part, on the connected components constraint into at least two partitions, formulating an LP subproblem from each of the at least two partitions, and solving the LP subproblems to generate a global solution to the supply chain planning problem.

Method and apparatus for recognizing landmark in panoramic image and non-transitory computer-readable medium
11734790 · 2023-08-22 · ·

Disclosed are a method and apparatus for recognizing a landmark in a panoramic image. The method includes steps of performing projection transformation on the panoramic image so as to generate a projection image; conducting semantic segmentation on the projection image so as to determine a landmark region and a road surface region; correcting distortion in the landmark region so as to produce a corrected landmark region; and recognizing the landmark in the corrected landmark region.

METHOD FOR VISUAL LOCALIZATION AND RELATED APPARATUS
20220148302 · 2022-05-12 ·

Visual localization method and related apparatus are disclosed. In the method, a first candidate image sequence is determined from image library, the image library being configured to construct electronic map, image frames in the first candidate image sequence being sequentially arranged according to degrees of matching with first image, and the first image being an image collected by a camera; an order of the image frames in the first candidate image sequence is adjusted according to target window to obtain second candidate image sequence, the target window being multiple successive image frames including target image frame and determined from the image library, the target image frame being an image matching with second image, which is collected by the camera before the first image is collected, in the image library; and target posture of the camera when the first image is collected is determined according to the second candidate image sequence.

SYSTEM AND COMPUTER-IMPLEMENTED METHOD FOR IMAGE DATA QUALITY ASSURANCE IN AN INSTALLATION ARRANGED TO PERFORM ANIMAL-RELATED ACTIONS, COMPUTER PROGRAM AND NON-VOLATILE DATA CARRIER
20230252615 · 2023-08-10 ·

An imaging system registers image data (D.sub.img) in connection with an installation performing at least one action relating to an animal. A system for image data quality assurance contains a control unit and a digital storage unit. The control unit obtains image data (D.sub.img) registered by the imaging system when the installation is in an idle mode. The control unit analyzes the obtained image data (D.sub.img) to determine if a cleaning action to remove dirt (D) from a front window of the imaging system has been performed. If it is determined that such a cleaning action has been performed, control unit (120) causes a point in time for the cleaning action to be recorded in the digital storage unit (130) for use performance tracking of the installation in conjunction with the cleaning actions.

Image segmentation confidence determination
11763460 · 2023-09-19 ·

Examples for determining a confidence level associated with image segmentation are disclosed. A confidence level associated with a collective image segmentation result can be determined by generating multiple individual segmentation results each from the same image data. These examples can then aggregate the individual segmentation results to form the collective image segmentation result and measure the spread of each individual segmentation result from the collective image segmentation result. The measured spread of each individual segmentation result can then be used to determine the confidence level associated with the collective image segmentation result. This can allow a confidence level associated with the collective image segmentation result to be determined. This confidence level may be determined without needing a ground truth to compare to the collective image segmentation result.

GATING MACHINE LEARNING PREDICTIONS ON MEDICAL ULTRASOUND IMAGES VIA RISK AND UNCERTAINTY QUANTIFICATION
20210350529 · 2021-11-11 ·

A facility for processing a medical imaging image is described. The facility applies each of a number of constituent models making up an ensemble machine learning models to the image to produce a constituent model result that predicts a value for each pixel of the image. The facility aggregates the results produced by the constituent models of the plurality to determine a result of the ensemble machine learning model. For each of the pixels of the accessed image, the facility determines a measure of variation among the values predicted for the pixel among the constituent models. Facility determines a confidence measure for the ensemble machine learning model result based at least in part on for how many of the pixels of the accessed image a variation measure is determined that exceeds a variation threshold.

Nail contour detecting device, nail contour detecting method and storage medium
11170250 · 2021-11-09 · ·

A nail contour detecting device including a processor, wherein the processor obtains first feature point data of a first nail contour which is a nail contour detected from a first nail image obtained by imaging a nail of a finger or a toe, and second feature point data of a second nail contour which is a nail contour detected from a second nail image obtained by imaging a nail of the same finger or toe as the first nail image; and the processor obtains one nail contour based on the first feature point data and the second feature point data.

SEMICONDUCTOR WAFER MEASUREMENT METHOD AND SYSTEM

A method of analyzing a semiconductor wafer includes obtaining a graphic data system (GDS) file corresponding to the semiconductor wafer, using GDS information from the GDS file to provide coordinates of a layout feature of the semiconductor wafer to an electron microscope, using the electron microscope to capture a raw image from the semiconductor wafer based on the coordinates of the layout feature, and performing a measurement operation on the raw image.