The disclosure provides a resistance variable memory that can realize high integration. The resistance variable memory of the disclosure includes a plurality of transistors formed on a surface of a substrate, and a plurality of variable resistance elements stacked on the surface of the substrate in a vertical direction. One electrode of each of the variable resistance elements is commonly electrically connected to one electrode of one transistor, and another electrode of each of the variable resistance elements is respectively electrically connected to a bit line, and another electrode of each of the transistors is electrically connected to a source line, and each gate of transistors in a row direction is commonly connected to a word line.

A method of operating a synapse array includes applying a pulse sequence to a resistor coupled between a row and a column of the synapse array, and in response to the applying the pulse sequence, lowering a conductance level of the resistor. Each pulse of the pulse sequence includes a pulse number, an amplitude, a leading edge, a pulse width, and a trailing edge, the trailing edge having a duration longer than a duration of the leading edge, and applying the pulse sequence includes increasing the pulse number while increasing one of the amplitude, the pulse width, or the trailing edge duration.

A crossbar circuit is provided. The crossbar circuit includes one or more bit lines, one or more word lines, one or more cell devices connected between the bit lines and the word lines, one or more analog-to-digital converters (ADCs) connected to the one or more bit lines, one or more digital-to-analog converters (DACs) connected to the one or more word lines, one or more access controls connected to the one or more cell devices and configured to select a cell device in the one or more cell devices and to program the selected cell device, and a slew rate controller connected to the one or more bit lines. The first slew rate controller is configured to receive an input signal or a bias and output a slew-rate controlled signal.

A computer includes: a memristor array including memristors arranged at intersections between word lines and a first bit line in the memristor array and at intersections between the word lines and second bit lines in the memristor array; an adder circuit configured to obtain sum voltages for the second bit lines by adding first voltages generated according to currents that flow in the second bit lines when a first pattern is supplied to the word lines to difference voltages between a reference voltage generated according to a current that flows in the first bit line when a second pattern is supplied to the word lines and second voltages generated according to currents that flow in the second bit lines when a second pattern is supplied to the word lines; and a detection circuit that detects a second bit line that corresponds to a maximum value of the sum voltages.

According to an embodiment, a phase-change memory device comprises: an upper electrode and a lower electrode; a phase-change layer in which a crystal state thereof is changed by heat supplied by the upper electrode and the lower electrode; and a selector which selectively switches the heat supplied by the upper electrode and the lower electrode to the phase-change layer, wherein the selector is formed of a compound which includes a transition metal in the phase-change material so as to have a high resistance when the crystalline state of the selector is crystalline and so as to have a low resistance when the crystalline state of the selector is non-crystalline.

Techniques are provided for programming a self-selecting memory cell that stores a first logic state. To program the memory cell, a pulse having a first polarity may be applied to the cell, which may result in the memory cell having a reduced threshold voltage. During a duration in which the threshold voltage of the memory cell may be reduced (e.g., during a selection time), a second pulse having a second polarity (e.g., a different polarity) may be applied to the memory cell. Applying the second pulse to the memory cell may result in the memory cell storing a second logic state different than the first logic state.

A memory cell, includes first and second main terminals, an auxiliary terminal; M memristor(s) between the main terminals, M≥1; M primary switch(es), each in parallel with a memristor; and a secondary switch between the second main terminal and the auxiliary terminal. It is configured for writing to at least one memristor by opening each primary switch in parallel with the at least one memristor, closing each other primary switch, closing the secondary switch and applying a corresponding programming voltage between the first main terminal and the auxiliary terminal; and for reading at least one memristor by opening each primary switch in parallel with the at least one memristor, closing each other possible primary switch, opening the secondary switch and measuring a corresponding electrical quantity between the main terminals.

The present invention relates to a synapse and synaptic array, and a computing system using the same. The synaptic device according to an exemplary embodiment of the present invention includes a transistor in which a synaptic input signal is applied to any one electrode of source and drain electrodes; and a plurality of two-terminal variable resistance memory devices in which a first electrode is electrically globally connected to a gate electrode of the transistor, wherein a separate memory voltage is applied to a second electrode of each variable resistance memory device to adjust a gate voltage applied to the gate electrode, thereby controlling a synaptic output signal which is output to the other one of the source and drain electrodes.

One embodiment provides a resistive random-access memory (RRAM) based convolutional block including a complementary pair of RRAMs having a first RRAM and a second RRAM, a programming circuit coupled to the complementary pair of RRAMs, and a XNOR sense amplifier circuit coupled to the complementary pair of RRAMs. The programming circuit is configured to receive a kernel bit from a kernel matrix, program the first RRAM to at least one selected from a group consisting of a low resistive state (LRS) and a high resistive state (HRS) based on the kernel bit, and program the second RRAM to other of the LRS and the HRS. The XNOR sense amplifier circuit is configured to receive an input bit from an input matrix, perform a XNOR operation between the input bit and the kernel bit read from the complementary pair of RRAMs, and output a XNOR output based on the XNOR operation.

Embodiments disclosed include memory cell operating methods, memory cell programming methods, memory cell reading methods, memory cells, and memory devices. In one embodiment, a memory cell includes a wordline, a first bitline, a second bitline, and a memory element. The memory element is electrically connected to the wordline and selectively electrically connected to the first bitline and the second bitline. The memory element stores information via a resistive state of the memory element. The memory cell is configured to convey the resistive state of the memory element via either a first current flowing from the first bitline through the memory element to the wordline or a second current flowing from the wordline through the memory element to the second bitline.