Testcase recommendations are generated for a testcase creator application by training a learning function using metadata of previously generated testcases by parsing the metadata into steptasks, and providing the parsed metadata to the learning function to enable the learning function to determine relationships between the steptasks of the previously generated testcases, and using, by the testcase creator application, the trained learning function to obtain a predicted subsequent steptask for a given type of testcase to be generated. Each steptask describes one of the steps of the testcase using a concatenation of a step number of the one of the steps of the testcase, a module and a submodule to be used to perform of the one of the steps of the testcase, and a function to be performed at the one of the steps of the testcase.

Testcase recommendations are generated for a testcase creator application by training a learning function using metadata of previously generated testcases by parsing the metadata into steptasks, and providing the parsed metadata to the learning function to enable the learning function to determine relationships between the steptasks of the previously generated testcases, and using, by the testcase creator application, the trained learning function to obtain a predicted subsequent steptask for a given type of testcase to be generated. Each steptask describes one of the steps of the testcase using a concatenation of a step number of the one of the steps of the testcase, a module and a submodule to be used to perform of the one of the steps of the testcase, and a function to be performed at the one of the steps of the testcase.

Methods, systems, and devices for direct testing of in-package memory are described. A memory subsystem package may include non-volatile memory, volatile memory that may be configured as a cache, and a controller. The memory subsystem may support direct access to the non-volatile memory for testing the non-volatile memory in the package using a host interface of the memory subsystem rather than using dedicated contacts on the package. To ensure deterministic behavior during testing operations, the memory subsystem may, when operating with a test mode enabled, forward commands received from a host device (such as automated test equipment) to a memory interface of the non-volatile memory and bypass the cache-related circuitry. The memory subsystem may include a separate conductive path that bypasses the cache for forwarding commands and addresses to the memory interface during testing.

Methods, systems, and devices for direct testing of in-package memory are described. A memory subsystem package may include non-volatile memory, volatile memory that may be configured as a cache, and a controller. The memory subsystem may support direct access to the non-volatile memory for testing the non-volatile memory in the package using a host interface of the memory subsystem rather than using dedicated contacts on the package. To ensure deterministic behavior during testing operations, the memory subsystem may, when operating with a test mode enabled, forward commands received from a host device (such as automated test equipment) to a memory interface of the non-volatile memory and bypass the cache-related circuitry. The memory subsystem may include a separate conductive path that bypasses the cache for forwarding commands and addresses to the memory interface during testing.

Technologies for dynamic accelerator selection include a compute sled. The compute sled includes a network interface controller to communicate with a remote accelerator of an accelerator sled over a network, where the network interface controller includes a local accelerator and a compute engine. The compute engine is to obtain network telemetry data indicative of a level of bandwidth saturation of the network. The compute engine is also to determine whether to accelerate a function managed by the compute sled. The compute engine is further to determine, in response to a determination to accelerate the function, whether to offload the function to the remote accelerator of the accelerator sled based on the telemetry data. Also the compute engine is to assign, in response a determination not to offload the function to the remote accelerator, the function to the local accelerator of the network interface controller.

A data access system includes a flash memory, a first inversion circuit, a block buffer memory, an error checking and correcting circuit, a second inversion circuit, and an application circuit. The first inversion circuit inverts a plurality of pieces of data stored in a block of the flash memory to generate a plurality of pieces of inverted data. The block buffer memory stores the plurality of pieces of inverted data. When the ECC circuit determines that the plurality of pieces of inverted data are correctable, the ECC circuit corrects at least one piece of inverted data stored in the block buffer memory. The second inversion circuit inverts the plurality of pieces of inverted data stored in the block buffer memory to generate a plurality of pieces of recovered data. The application circuit receives the plurality of pieces of recovered data and performs a corresponding operation accordingly.

A data access system includes a flash memory, a first inversion circuit, a block buffer memory, an error checking and correcting circuit, a second inversion circuit, and an application circuit. The first inversion circuit inverts a plurality of pieces of data stored in a block of the flash memory to generate a plurality of pieces of inverted data. The block buffer memory stores the plurality of pieces of inverted data. When the ECC circuit determines that the plurality of pieces of inverted data are correctable, the ECC circuit corrects at least one piece of inverted data stored in the block buffer memory. The second inversion circuit inverts the plurality of pieces of inverted data stored in the block buffer memory to generate a plurality of pieces of recovered data. The application circuit receives the plurality of pieces of recovered data and performs a corresponding operation accordingly.

An integrated circuit includes a drivability control circuit and a data output circuit. The drivability control circuit is configured to generate a drivability control signal based on data patterns of a plurality of pieces of data. The data output circuit is configured to control drivability, which is reflected to each of the plurality of pieces of data, based on the drivability control signal.

An image processing apparatus including a plurality of transfer units, a data storage, an image processing processor, and a test circuit. A plurality of captured image data are respectively assigned to the plurality of transfer units and the plurality of transfer units transfer the assigned image data. The data storage unit stores the plurality of image data which are transferred by the plurality of transfer units. The image processing processor performs image processing on the plurality of image data which are stored in the data storage unit. The test circuit tests the image processing processor in a period during which the image data are not input from the data storage unit to the image processing processor.

An image processing apparatus including a plurality of transfer units, a data storage, an image processing processor, and a test circuit. A plurality of captured image data are respectively assigned to the plurality of transfer units and the plurality of transfer units transfer the assigned image data. The data storage unit stores the plurality of image data which are transferred by the plurality of transfer units. The image processing processor performs image processing on the plurality of image data which are stored in the data storage unit. The test circuit tests the image processing processor in a period during which the image data are not input from the data storage unit to the image processing processor.