Patent classifications
G
PHYSICS
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G01
MEASURING; TESTING
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G01B
MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
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9/00
Measuring instruments characterised by the use of optical techniques
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G01B9/02055
Reduction or prevention of errors; Testing; Calibration
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G01B9/02062
Active error reduction, i.e. varying with time
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G01B9/02064
by particular adjustment of coherence gate, i.e. adjusting position of zero path difference in low coherence interferometry
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G01B9/02065
using a second interferometer before or after measuring interferometer
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