A reference voltage generator circuit generates a reference voltage corresponding to a power supply voltage. A current/voltage converter circuit converts a photocurrent output by a photoreceiver into voltage, and outputs a voltage obtained by adding the converted voltage and the reference voltage. A sample and hold circuit holds a voltage of a capacitor in response to a sample and hold signal, the capacitor having the voltage input at one end and the reference voltage input at another end. An amplifier circuit outputs an output signal where a voltage held by the sample and hold circuit is amplified with the reference voltage as a reference.

A method is provided for spatially modulating electromagnetic radiation at high frequency where the modulation is phase, polarization or direction of propagation comprises a substrate carrying an ordered array of optical elements in relative motion with respect to an incident beam of electromagnetic radiation to be modulated and measuring the relative motion. The array contains at least three optical elements and at least two different types of optical elements. At least some of the optical elements are formed from and integral to the substrate material. The optical elements may be fabricated on the substrate material by a subtractive process. The electromagnetic radiation to be modulated is incident on a region of the substrate termed the active region. As the substrate moves relative to the incident electromagnetic radiation, the active region also moves and the designation of individual optical elements changes also.

A cantilever linear motion reference device employing two-layer air suspension. By means of a two-layer force sealed air suspension structure, the invention realizes two-dimensional air suspension support and motion guiding and improves the rotational stiffness per unit for an air suspension working surface. By combining accurate driving and feedback control, the invention achieves high speed, high acceleration, high frequency motion, and enables construction of a small-volume, long cantilever, high torque load two-dimensional motion reference device.

A cantilever linear motion reference device employing two-layer air suspension. By means of a two-layer force sealed air suspension structure, the invention realizes two-dimensional air suspension support and motion guiding and improves the rotational stiffness per unit for an air suspension working surface. By combining accurate driving and feedback control, the invention achieves high speed, high acceleration, high frequency motion, and enables construction of a small-volume, long cantilever, high torque load two-dimensional motion reference device.

An optical displacement sensing system is provided. With configuration of an optical sensor disposed on a displacement platform and in cooperation with a broadband light source and an optical spectrum analyzer, when the displacement platform moves, the waveguide grating of the optical sensor is resonated and the reflected light provided with a resonance wavelength is formed. The waveguide grating has the plurality of grating periods, and when the displacement platform moves to a different position to make the broadband light source correspond to a different grating period, the position can correspond to the different resonance wavelength. Therefore, according to the aforementioned configuration, the position is determined according to the different resonance wavelength, instead of using an optical encoder; furthermore, the micrometer-scale or nanometer-scale displacement detection is achieved.

An optical displacement sensing system is provided. With configuration of an optical sensor disposed on a displacement platform and in cooperation with a broadband light source and an optical spectrum analyzer, when the displacement platform moves, the waveguide grating of the optical sensor is resonated and the reflected light provided with a resonance wavelength is formed. The waveguide grating has the plurality of grating periods, and when the displacement platform moves to a different position to make the broadband light source correspond to a different grating period, the position can correspond to the different resonance wavelength. Therefore, according to the aforementioned configuration, the position is determined according to the different resonance wavelength, instead of using an optical encoder; furthermore, the micrometer-scale or nanometer-scale displacement detection is achieved.

An optical position measuring device for recording a relative position of two scales includes the scales. The longitudinal extents of the scales are oriented parallel to a first and second measuring direction. A horizontal plane of movement is spanned by these measuring directions. A light source is configured to emit an illumination beam that is split into at least two sub-beam bundles at the first scale. The sub-beam bundles subsequently impinge on the second scale, which is tilted about the direction of the longitudinal extent thereof relative to the horizontal plane of movement, and are back-reflected to impinge again on the first scale and are recombined there such that a resulting signal beam is subsequently propagated toward a detection unit, via which phase-shifted scanning signals are generatable with respect to a relative movement of the scales along a third perpendicular measuring direction and the first or second measuring direction.

An optical position measuring device for recording a relative position of two scales includes the scales. The longitudinal extents of the scales are oriented parallel to a first and second measuring direction. A horizontal plane of movement is spanned by these measuring directions. A light source is configured to emit an illumination beam that is split into at least two sub-beam bundles at the first scale. The sub-beam bundles subsequently impinge on the second scale, which is tilted about the direction of the longitudinal extent thereof relative to the horizontal plane of movement, and are back-reflected to impinge again on the first scale and are recombined there such that a resulting signal beam is subsequently propagated toward a detection unit, via which phase-shifted scanning signals are generatable with respect to a relative movement of the scales along a third perpendicular measuring direction and the first or second measuring direction.

The present invention provides a position detection apparatus that is provided with a scale and a detector and includes a processing unit configured to perform processing for setting a number of light receiving elements that are consecutive in a direction of relative movement and whose outputs are to be added for the light receiving elements so that, in a first resolution mode, a phase of a component of a fourth spatial frequency lower than a spatial frequency corresponding to a frequency offset amount is detected and, in a second resolution mode for which a resolution is lower than the first resolution mode, a phase of a component of a spatial frequency of an interference image of a second grating pattern is detected.

In order to provide a small detection device capable of detecting an accurate absolute position with a single head, there is provided a detection device including a head including a light source and a detecting unit configured to receive multiplexed light (interference light) of diffracted light obtained by causing light from the light source to enter first two points residing on ax diffraction grating and being separated from each other by a known distance and diffracted light obtained by causing the light from the light source to enter second two points residing on the diffraction grating, being separated from each other by a known distance, and including at least one point being different from the first two points, wherein the diffraction grating includes a first region between the first two points separated from each other by the known distance and a second region between the second two points separated from each other by the known distance, the first and second regions having at least partially different grating interval lengths, and an absolute position on the diffraction grating is detected based on the multiplexed light (interference light) received by the detecting unit.