G01J1/26

LITHOGRAPHIC METHOD

A method of patterning lithographic substrates, the method comprising using a free electron laser to generate EUV radiation and delivering the EUV radiation to a lithographic apparatus which projects the EUV radiation onto lithographic substrates, wherein the method further comprises reducing fluctuations in the power of EUV radiation delivered to the lithographic substrates by using a feedback-based control loop to monitor the free electron laser and adjust operation of the free electron laser accordingly.

CONFIGURABLE OPTICAL TRANSDUCERS USING AN OPTICAL MODULATOR AND ONE OR MORE LENSES
20180039070 · 2018-02-08 ·

A configurable optical device may include an optical transducer, a multi-lens arrangement, and a controllable optical modulator. The optical transducer is configured to convert light to electrical signals or to convert electrical signals to light. The multi-lens arrangement is positioned to redirect at least some of the light to or from the optical transducer. The controllable optical modulator is provided between the multi-lens arrangement and the optical transducer. The controllable optical modulator is coupled to receive and spatially modulate light to or from the optical transducer. The optical modulator is selectively controllable to steer and/or shape the light to a selected distribution of light from the multi-lens arrangement onto the optical transducer and/or from the optical transducer onto the multi-lens arrangement.

Light sensor having partially opaque optic

A rearview assembly for a vehicle is provided that includes: a housing configured for mounting to the vehicle; a rearview element disposed in the housing that displays images of a scene exterior of the vehicle; a light sensor assembly disposed in the housing; and a controller for receiving the electrical signal of the light sensor and for adjusting a brightness of the images displayed by the rearview element. The light sensor includes a light sensor for outputting an electrical signal representing intensity of light impinging upon a light-receiving surface of the light sensor, and a secondary optical element configured to receive light, wherein the light passes through the secondary optical element to the light sensor, the secondary optical element including a tint material that is substantially color neutral for attenuating light passing therethrough.

Light sensor having partially opaque optic

A rearview assembly for a vehicle is provided that includes: a housing configured for mounting to the vehicle; a rearview element disposed in the housing that displays images of a scene exterior of the vehicle; a light sensor assembly disposed in the housing; and a controller for receiving the electrical signal of the light sensor and for adjusting a brightness of the images displayed by the rearview element. The light sensor includes a light sensor for outputting an electrical signal representing intensity of light impinging upon a light-receiving surface of the light sensor, and a secondary optical element configured to receive light, wherein the light passes through the secondary optical element to the light sensor, the secondary optical element including a tint material that is substantially color neutral for attenuating light passing therethrough.

Auto-darkening filter of welding shield

An auto-darkening filter of a welding shield has a brightness-sensing unit, an optical shutter and a processor. The brightness-sensing unit generates a first signal or a second signal. In a high-sensitivity mode, the processor controls the optical shutter to operate in a dark state or a bright state depending on intensity of the first signal being higher or lower than a threshold value. In a low-sensitivity mode, the processor controls the optical shutter to operate in the bright state when intensity of the second signal is lower than the threshold value, and automatically change to the high-sensitivity mode from the low-sensitivity mode when intensity of the second signal is higher than the threshold value.

Auto-darkening filter of welding shield

An auto-darkening filter of a welding shield has a brightness-sensing unit, an optical shutter and a processor. The brightness-sensing unit generates a first signal or a second signal. In a high-sensitivity mode, the processor controls the optical shutter to operate in a dark state or a bright state depending on intensity of the first signal being higher or lower than a threshold value. In a low-sensitivity mode, the processor controls the optical shutter to operate in the bright state when intensity of the second signal is lower than the threshold value, and automatically change to the high-sensitivity mode from the low-sensitivity mode when intensity of the second signal is higher than the threshold value.

INFRARED IMAGING DEVICE, FIXED PATTERN NOISE CALCULATION METHOD, AND FIXED PATTERN NOISE CALCULATION PROGRAM
20170163884 · 2017-06-08 · ·

An infrared imaging device includes an imaging element including a plurality of infrared detection pixels which are two-dimensionally arranged, a diaphragm, and a FPN calculation unit which acquires a first captured image data obtained by capturing an image using the imaging element in a state in which an F-number of the diaphragm is set to a first value and a second captured image data obtained by capturing an image using the imaging element in a state in which the F-number is set to a second value while a motion picture is being captured, and calculates fixed pattern noise included in captured image data obtained by capturing an image using the imaging element based on the acquired first captured image data, the acquired second captured image data, the first value, and the second value.

INFRARED IMAGING DEVICE, FIXED PATTERN NOISE CALCULATION METHOD, AND FIXED PATTERN NOISE CALCULATION PROGRAM
20170163884 · 2017-06-08 · ·

An infrared imaging device includes an imaging element including a plurality of infrared detection pixels which are two-dimensionally arranged, a diaphragm, and a FPN calculation unit which acquires a first captured image data obtained by capturing an image using the imaging element in a state in which an F-number of the diaphragm is set to a first value and a second captured image data obtained by capturing an image using the imaging element in a state in which the F-number is set to a second value while a motion picture is being captured, and calculates fixed pattern noise included in captured image data obtained by capturing an image using the imaging element based on the acquired first captured image data, the acquired second captured image data, the first value, and the second value.

Laser Projection System
20170114992 · 2017-04-27 · ·

A laser projection system having built-in safety systems is disclosed. Further disclosed is a method of operating a laser projection system such that safe operation is a factor only of meeting a threshold distance between the laser unit and an audience member. To accomplish safe operation at the threshold distance, the laser projection system is pre-calibrated to operate below maximum permitted exposure levels at the threshold distance. In this manner of operation, laser lighting can be accomplished by non-laser professionals without the complexity, external sensors, and need for calibration at the venue.

ATTENUATED LIGHT BEAM PEAK FREQUENCY MODIFICATION
20170082874 · 2017-03-23 · ·

According to an example, a plurality of pixels of a modulator upon which an input light beam impinges may be modulated to apply a first asymmetrical attenuation pattern on the input light beam and to direct a first attenuated light beam from the modulator and a first power level of the first attenuated light beam may be measured. The plurality of pixels may be modulated to apply a second asymmetrical attenuation pattern on the input light beam and to direct a second attenuated light beam from the modulator, and a second power level of the second attenuated light beam may be measured. A difference between the first power level and the second power level may be calculated and a modified peak frequency for an attenuated light beam from the calculated difference may be calculated.