A microtome chuck including a mounting portion having a mating surface operable to removably attach the mounting portion to a sample sectioning device, and an electrical contact operable to electrically connect the mounting portion to a power source. The chuck further including a sample receiving portion coupled to the mounting portion, the sample receiving portion having a sample receiving surface dimensioned to receive a sample, a light source coupled to the sample receiving portion, the light source operable to emit a light from the sample receiving surface and through a sample positioned along the sample receiving surface, and circuitry electrically connecting the light source to the electrical contact of the mounting portion.

The present disclosure is directed to embodiments of microtome devices and methods of their use. In some embodiments, a microtome can be mounted on the built-in stage of a scanning electron microscope and used to perform serial block-face scanning electron microscopy. In some cases, a microtome installed in a scanning electron microscope can cut the sample at a location off the electron beam axis of the scanning electron microscope. In some cases, a microtome can include a capacitive sensor which can measure the location of a blade of the microtome, and the microtome can be computer-controlled by program implemented in MATLAB.

Methods, apparatus and systems for collecting thin tissue samples for imaging. Thin tissue sections may be cut from tissue samples using a microtome-quality knife. In one example, tissue samples are mounted to a substrate that is rotated such that thin tissue sections are acquired via lathing. Collection of thin tissue sections may be facilitated by a conveyor belt. Thin tissue sections may be mounted to a thin substrate (e.g., by adhering thin tissue sections to a thin substrate via a roller mechanism) that may be imaged, for example, by an electron beam (e.g., in an electron microscope). Thin tissue sections may be strengthened before cutting via a blockface thinfilm deposition technique and/or a blockface taping technique. An automated reel-to-reel imaging technique may be employed for collected/mounted tissue sections to facilitate random-access imaging of tissue sections and maintaining a comprehensive library including a large volume of samples.

Methods, apparatuses and systems for facilitating automated or semi-automated collection of tissue samples cut by a microtome. In one example, a collection apparatus may be moved back and forth between respective positions at which the collection apparatus is operatively coupled to a microtome so as to collect cut tissue samples, or routine access to the microtome is provided. Relatively easy movement and positioning of the collection apparatus is facilitated, while at the same time ensuring structural stability and appropriate alignment and/or isolation between the collection apparatus and the microtome. A fluid reservoir receives samples cut by the microtome, and the collection apparatus may collect samples via a conveyor-like substrate disposed near/in the reservoir. A linear movement of the substrate may be controlled based on a cutting rate of the microtome, and the fluid level in the reservoir may be automatically maintained to facilitate effective sample collection.

The disclosure describes assemblies and systems for use in reel-to-reel imaging of ultrathin samples. The assemblies and the systems disclosed herein are adapted for use with a plurality of detectors and are configured for use in a variety of electron microscopes. Also, methods of using such assemblies and systems are disclosed.

Provided is a microtomic system and process for the preparation of sections for microscope examination. A cutting edge in the system can cut through a sample block and produce a section one end of which remains attached to the cutting edge. A voltage generator can generate a voltage and apply the voltage between the cutting edge and a section receiver such as a semiconductor chip grid. Through electrostatic force caused by the voltage, another end of the section can anchor to the section receiver. The section is then spread on the receiver. The system is automatable, highly efficient, and does not need liquid to float sample sections, and can therefore maintain the integration of the sample sections.

Provided is a process of using a microtomic system for the preparation of sections for microscope examination. A cutting edge in the system can cut through a sample block and produce a section one end of which remains attached to the cutting edge. A voltage generator can generate a voltage and apply the voltage between the cutting edge and a section receiver such as a semiconductor chip grid. Through electrostatic force caused by the voltage, another end of the section can anchor to the section receiver. The section is then spread on the receiver. The system is automatable, highly efficient, and does not need liquid to float sample sections, and can therefore maintain the integration of the sample sections.

In a microtome (1) for producing thin sections for histology, there is a danger of collisions between the sample (9) and the cutting edge (7) in setup mode for coarse feed. It is an object of the invention to limit the collision force of such a collision so that it lies within an admissible range and, therefore, damage is avoided, and the microtome (1) is thereby inherently safe in setup mode. It is also an object of the invention, using the same means, to make available methods that resolve collisions and permit automatic approximation between sample (9) and cutting edge (7). The support force of the associated advancing means (18) acting in the advancing device (12) is limited since the otherwise customary screwing of the associated advancing means (18) on the advancing device (12) is replaced, for example, by a spring mounting or by a connection acting with magnetic force. Thus, when the support force is exceeded in the event of a collision, the associated advancing means (18) lift away from their contact face and experience a displacement (30). The collision force is thus limited to the support force. An additional switching off of the electromotive advancing drive and an associated process for resolving a collision via the electrical control (11) forms the basis of a further method for automatic approximation between sample (9) and cutting edge (7), which is likewise inherently safe by using the same means. The microtome (1) according

The present disclosure is directed to embodiments of microtome devices and methods of their use. In some embodiments, a microtome can be mounted on the built-in stage of a scanning electron microscope and used to perform serial block-face scanning electron microscopy. In some cases, a microtome installed in a scanning electron microscope can cut the sample at a location off the electron beam axis of the scanning electron microscope. In some cases, a microtome can include a capacitive sensor which can measure the location of a blade of the microtome, and the microtome can be computer-controlled by program implemented in MATLAB.

A method of sampling a multi-layered material and a micro-sampling tool are described. The sampling method includes penetrating a top surface of a material in a component of interest with a micro-cutting tool to a predetermined depth sufficient to include each layer of the multi-layered material and a portion of the base, without cutting through the full depth of the base, under-cutting from the depth of penetration through the base to define a micro-sample of the multi-layered material, and removing the micro-sample with each layer of the multi-layered material intact. The micro-sampler includes a cutting tool calibrated to cut to a depth no greater than 2 mm, and in some aspects, no greater than 200 microns into a multi-layered material, the material having a top surface and a metallic or ceramic base and a container for removing and storing a micro-sample cut from the material with each layer of the multi-layered material and a portion of the base intact.