In a method of measuring moisture in corn, an ear of corn is operatively coupled to a moisture meter and an amount of moisture is determined while the ear of corn is being grown on a corn plant. The moisture meter can use a spectrometry to determine the amount of moisture in the corn. A moisture meter includes a corn interface configured to conformingly engage the ear of corn when pressed against the ear of corn to form an optical seal about an opening through which the spectrometer determines the amount of moisture in the corn to inhibit ambient light from passing between the corn interface and the ear of corn into the at least one opening.

Provided is a contactless internal measurement device including an electromagnetic wave irradiation unit that irradiates an electromagnetic wave to a measurement subject, and an electromagnetic wave receiver that detects the electromagnetic wave reflected by the measurement subject. The electromagnetic wave irradiation unit is disposed to reduce a polarization component of the electromagnetic wave detected by the electromagnetic wave receiver, the polarization component being the same as a polarization component of the electromagnetic wave irradiated by the electromagnetic wave irradiation unit.

In an embodiment a sensor device includes a first optoelectronic emitter configured to irradiate a spot with electromagnetic rays, a second optoelectronic emitter configured to irradiate the spot with electromagnetic rays, a detector configured to detect electromagnetic rays from the first and second emitters reflected at or transmitted through the spot, wherein the electromagnetic rays of the first emitter have a wavelength in a range of 1400-1500 nm, wherein the electromagnetic rays of the second emitter have a wavelength in a range of 900-1100 nm, and wherein the second emitter is configured to emit at least one further electromagnetic signal, the one further electromagnetic signal not being used for measuring a humidity.

In an embodiment a sensor device includes a first optoelectronic emitter configured to irradiate a spot with electromagnetic rays, a second optoelectronic emitter configured to irradiate the spot with electromagnetic rays, a detector configured to detect electromagnetic rays from the first and second emitters reflected at or transmitted through the spot, wherein the electromagnetic rays of the first emitter have a wavelength in a range of 1400-1500 nm, wherein the electromagnetic rays of the second emitter have a wavelength in a range of 900-1100 nm, and wherein the second emitter is configured to emit at least one further electromagnetic signal, the one further electromagnetic signal not being used for measuring a humidity.

Disclosed is a method analysing plastic preforms, wherein plastic preforms are transported along a predetermined transport path by a transport device and an infrared absorption coefficient is determined in at least one region of the plastic preform, wherein, in order to determine the infrared absorption coefficient of the plastic preform, infrared radiation is applied to the plastic preform by a first radiation device and radiation passing through the plastic preform is received by at least one receiving device and an infrared absorption behaviour of the plastic preform is determined from this received radiation, wherein the radiation device acts upon the plastic preforms with infrared radiation in a predetermined wavelength range and an evaluation device evaluates the radiation as a function of its wavelength in a wavelength range from 1500 nm to 2000 nm.

In a measurement apparatus or a measurement method, an information processing apparatus executes: a process of specifying a bunch of grapes to be measured on the basis of detection of grasping of the bunch of grapes by a gripper; and a process of starting to measure the number of pieces of the specified bunch of grapes.

The disclosure relates to methods and systems for the analysis of compounds in a crystalline state and/or undergoing crystallization. Two-dimensional correlation (2DCOS) and co-distribution analysis (2DCDS) analysis plots can be generated and analyzed. Asynchronous plots can aid in establishing a sequential order of events. Positive cross peaks that correlate with auto peaks associated with aggregation can be identified. The auto peaks can be referenced to quickly discern the regions of the molecule most perturbed, which would indicate a driver for the crystallization state of the molecule. One can define which functional group types (e.g., region) are most perturbed (positive, intense auto peak) and observe how the different auto peaks begin to have greatest intensity change. These changes in auto peaks in the synchronous plots for the different stages of crystallization can provide information as to the dynamics of the process from amorphous to crystalline state.

The disclosure relates to methods and systems for the analysis of compounds in a crystalline state and/or undergoing crystallization. Two-dimensional correlation (2DCOS) and co-distribution analysis (2DCDS) analysis plots can be generated and analyzed. Asynchronous plots can aid in establishing a sequential order of events. Positive cross peaks that correlate with auto peaks associated with aggregation can be identified. The auto peaks can be referenced to quickly discern the regions of the molecule most perturbed, which would indicate a driver for the crystallization state of the molecule. One can define which functional group types (e.g., region) are most perturbed (positive, intense auto peak) and observe how the different auto peaks begin to have greatest intensity change. These changes in auto peaks in the synchronous plots for the different stages of crystallization can provide information as to the dynamics of the process from amorphous to crystalline state.

A material analytical sensor includes an emitter that irradiates a material with irradiation light including a wavelength region related to estimation of an amount of a component of the material, a controller that controls an irradiation cycle of the irradiation light, a receiver that receives reflected light from the material to output as a pulse signal and receives disturbance light to output as a noise signal, an integrator that samples N pulse signals during a predetermined period and integrates the sampled N pulse signals to obtain a first integrated value, and samples N noise signals during a same period as the predetermined period with a same cycle as the irradiation cycle and integrates the sampled N noise signals to obtain a second integrated value, and an extractor that deducts the second integrated value from the first integrated value to extract an amount of the reflected light.

A material analytical sensor includes an emitter that irradiates a material with irradiation light including a wavelength region related to estimation of an amount of a component of the material, a controller that controls an irradiation cycle of the irradiation light, a receiver that receives reflected light from the material to output as a pulse signal and receives disturbance light to output as a noise signal, an integrator that samples N pulse signals during a predetermined period and integrates the sampled N pulse signals to obtain a first integrated value, and samples N noise signals during a same period as the predetermined period with a same cycle as the irradiation cycle and integrates the sampled N noise signals to obtain a second integrated value, and an extractor that deducts the second integrated value from the first integrated value to extract an amount of the reflected light.