Patent classifications
G01N21/3563
LENS-FREE INFRARED MULTISPECTRAL IMAGING DEVICE AND MANUFACTURING METHOD
The invention provides a lens-free infrared imaging device (1) intended to image a sample (2), comprising at least one light source (3, 3a, 3b) configured to emit a light according to several wavelengths of the infrared range, and at least one sensor (4) configured to detect some of the light emitted having interacted with the sample, said sensor comprising a plurality of pixels (41), the device being characterised in that the sensor (4) is configured to detect a reflective part of the light emitted. The invention also provides a method for manufacturing this device.
LENS-FREE INFRARED MULTISPECTRAL IMAGING DEVICE AND MANUFACTURING METHOD
The invention provides a lens-free infrared imaging device (1) intended to image a sample (2), comprising at least one light source (3, 3a, 3b) configured to emit a light according to several wavelengths of the infrared range, and at least one sensor (4) configured to detect some of the light emitted having interacted with the sample, said sensor comprising a plurality of pixels (41), the device being characterised in that the sensor (4) is configured to detect a reflective part of the light emitted. The invention also provides a method for manufacturing this device.
Infrared (IR) spectroscopy system
A system is provided comprising an FTIR spectrometer configured to obtain a Fourier Transformed infrared (FTIR) spectrum of a Peripheral Blood Mononuclear Cells (PBMC) sample of the subject; a data processor operable with the FTIR spectrometer, and configured to analyze the infrared (IR) spectrum of the Peripheral Blood Mononuclear Cells (PBMC) sample of the subject by assessing a characteristic of the sample of the subject at at least one wavenumber; and an output unit, configured to generate an output indicative of the presence of a solid tumor, based on the infrared (IR) spectrum. Other embodiments are also provided.
Infrared (IR) spectroscopy system
A system is provided comprising an FTIR spectrometer configured to obtain a Fourier Transformed infrared (FTIR) spectrum of a Peripheral Blood Mononuclear Cells (PBMC) sample of the subject; a data processor operable with the FTIR spectrometer, and configured to analyze the infrared (IR) spectrum of the Peripheral Blood Mononuclear Cells (PBMC) sample of the subject by assessing a characteristic of the sample of the subject at at least one wavenumber; and an output unit, configured to generate an output indicative of the presence of a solid tumor, based on the infrared (IR) spectrum. Other embodiments are also provided.
IDENTIFICATION METHOD OF PLASTIC MICROPARTICLES
Provided is an identification method of plastic microparticles, including: performing an infrared analysis on plastic microparticles to identify whether the plastic microparticles include polyethylene terephthalate, polyethylene, polypropylene, or nylon 66, wherein the identification is to determine whether the plastic microparticles have a characteristic peak of each plastic, and the characteristic peak is selected from signals that do not overlap and interfere with each other in the infrared spectrum signals of each plastic.
IDENTIFICATION METHOD OF PLASTIC MICROPARTICLES
Provided is an identification method of plastic microparticles, including: performing an infrared analysis on plastic microparticles to identify whether the plastic microparticles include polyethylene terephthalate, polyethylene, polypropylene, or nylon 66, wherein the identification is to determine whether the plastic microparticles have a characteristic peak of each plastic, and the characteristic peak is selected from signals that do not overlap and interfere with each other in the infrared spectrum signals of each plastic.
System and method to calibrate a plurality of wafer inspection system (WIS) modules
Various embodiments of systems and methods for calibrating wafer inspection system modules are disclosed herein. More specifically, the present disclosure provides various embodiments of systems and methods to calibrate the multiple spectral band values obtained from a substrate by a camera system included within a WIS module. In one embodiment, multiple spectral band values are red, green, and blue (RGB) values. As described in more detail below, the calibration methods disclosed herein may use a test wafer having a predetermined pattern of thickness changes or color changes to generate multiple spectral band offset values. The multiple spectral band offset values can be applied to the multiple spectral band values obtained from the substrate to generate calibrated RGB values, which compensate for spectral responsivity differences between camera systems included within a plurality of WIS modules.
SPECTRAL ANALYSIS OF A SAMPLE
Apparatus and methods for spectral analysis of a sample are described, for example for carrying out Raman or other optical or spectroscopic analysis of samples such as pharmaceutical dosage forms, including oral solid dosage forms such as tablets or capsules. Such apparatus may comprise delivery optics arranged to direct probe light to a delivery region of the sample, collection optics arranged to collect probe light scattered from a collection region of the sample, and a spectrometer having an entrance port, the spectrometer being arranged to receive the collected probe light from the collection optics at the entrance port of the spectrometer, and to detect spectral features in the received probe light. In particular, the collection optics may comprise Koehler integration optics arranged to process the collected probe light such that the collected light from each point of the collection region is distributed across the entrance port of the spectrometer.
Method And Apparatus For Determining A Force Applied To A Sample During An Optical Interrogation Technique
An optical measurement system measurement system for examining a sample. The measurement system comprises an internally reflective element, a stage, an optical assembly, a chassis, and a sensor. The internally reflective element has a contact surface. The stage is positioned below the internally reflective element. The stage and the internally reflective element are configured to apply a force to the sample. The optical assembly comprises a light source and a light detector. The optical assembly is configured to scan the sample by directing source light from the light source towards the contact surface and detecting source light optically interacting with the contact surface by the light detector. The chassis is configured to support the optical assembly and the internally reflective element. The sensor is mounted to the chassis and configured to detect the force applied to the sample by the internally reflective element and the stage.
Method And Apparatus For Determining A Force Applied To A Sample During An Optical Interrogation Technique
An optical measurement system measurement system for examining a sample. The measurement system comprises an internally reflective element, a stage, an optical assembly, a chassis, and a sensor. The internally reflective element has a contact surface. The stage is positioned below the internally reflective element. The stage and the internally reflective element are configured to apply a force to the sample. The optical assembly comprises a light source and a light detector. The optical assembly is configured to scan the sample by directing source light from the light source towards the contact surface and detecting source light optically interacting with the contact surface by the light detector. The chassis is configured to support the optical assembly and the internally reflective element. The sensor is mounted to the chassis and configured to detect the force applied to the sample by the internally reflective element and the stage.