Method of characterizing particles suspended in a fluid dispersant by light diffraction, comprising: obtaining measurement data from a detector element, the detector element being arranged to measure the intensity of scattered light; identifying a measurement contribution arising from light scattered by inhomogeneities in the dispersant; processing the measurement data to remove or separate the measurement contribution arising from light scattered by inhomogeneities in the dispersant; calculating a particle size distribution from the processed measurement. The detector element is one of a plurality of detector elements from which the measurement data is obtained. The detector elements are arranged to measure the intensity of scattered light at a plurality of scattering angles, the plurality of scattering angles distributed over a plurality of angles about an illumination axis. Identifying a measurement contribution arising from light scattered by inhomogeneities in the dispersant comprises identifying measured scattered light that is asymmetric about the illumination axis.

An illumination system includes a measurement stage on which a measurement target is located, a light-providing part having illumination sections providing multi-directional incident lights to the measurement target, a light-receiving part receiving single-directional reflection lights reflected by the measurement target according to the multi-directional incident lights, and a processing part that performs acquiring a first distribution of intensities the single-directional reflection lights with respect to the multi-directional incident lights, acquiring, from the first distribution, a second distribution of intensities of multi-directional reflections lights with respect to a single-directional incident light, and determining material of the measurement target based on parameters of the second distribution. A method of recognizing material using the illumination system and a computer readable non-transitory recording medium recording a program embodying the method are provided.

The present disclosure relates to a calibration insert for the adjustment, calibration, and/or implementation of a function test of an optical sensor that is designed to measure at least one measurand in a medium by means of light, the calibration insert including: an inlet cross-section through which light enters into the calibration insert; an outlet cross-section through which light exits from the calibration insert; and at least one blocking element that is arranged between the inlet cross-section and the outlet cross-section, wherein the blocking element does not entirely let through the light, independently of its wavelength, from the inlet cross-section to the outlet cross-section. Instead, the blocking element partially absorbs, reflects, or scatters the light, wherein the ratio of the intensity of the light at the outlet cross-section to the intensity of the light at the inlet cross-section corresponds to a value of the measurand.

An illumination system for recognizing material includes a measurement stage, a light-providing part, a light-receiving part, and a processing part. The measurement stage is upwardly open and the measurement target is located on the measurement stage. The light-providing part includes a plurality of illumination sections providing incident lights to the measurement target, and provides multi-directional incident lights to the measurement target from multiple upper directions at which the measurement stage is open. The light-receiving part receives single-directional reflection lights reflected by the measurement target according to the multi-directional incident lights provided by the light-providing part. The processing part acquires a multi-directional intensity distribution of multi-directional reflection lights reflected by the measurement target according to a single-directional incident light from the single-directional reflection lights reflected by the measurement target according to the multi-directional incident lights, and determines material of the measurement target from the multi-directional intensity distribution of reflection lights. Thus, material of an object may be easily and accurately known at a low cost.

A measuring device includes a light-emitting unit that radiates light onto an object, a first lens that changes a divergence degree of the light, a diaphragm having an aperture that reduces a diameter of the light, a second lens that converges and radiates the light onto the object, a light-receiving unit that receives at least part of the light that has been reflected by the object and that has passed through the second lens, a measuring unit that measures the object by using results related to the light-receiving unit, a reflector whose angle with respect to the light is adjustable, and a correction unit that varies a light-receiving position on the light-receiving unit by varying the reflector's angle and corrects a light amount of the light-emitting unit and a sensitivity of the light-receiving unit by using results obtained at each light-receiving position.

Method of characterizing particles suspended in a fluid dispersant by light diffraction, comprising: obtaining measurement data from a detector element, the detector element being arranged to measure the intensity of scattered light; identifying a measurement contribution arising from light scattered by inhomogeneities in the dispersant; processing the measurement data to remove or separate the measurement contribution arising from light scattered by inhomogeneities in the dispersant; calculating a particle size distribution from the processed measurement. The detector element is one of a plurality of detector elements from which the measurement data is obtained. The detector elements are arranged to measure the intensity of scattered light at a plurality of scattering angles, the plurality of scattering angles distributed over a plurality of angles about an illumination axis. Identifying a measurement contribution arising from light scattered by inhomogeneities in the dispersant comprises identifying measured scattered light that is asymmetric about the illumination axis.

An illumination system for recognizing material includes a measurement stage, a light-providing part, a light-receiving part, and a processing part. The measurement stage is upwardly open and the measurement target is located on the measurement stage. The light-providing part includes a plurality of illumination sections providing incident lights to the measurement target, and provides multi-directional incident lights to the measurement target from multiple upper directions at which the measurement stage is open. The light-receiving part receives single-directional reflection lights reflected by the measurement target according to the multi-directional incident lights provided by the light-providing part. The processing part acquires a multi-directional intensity distribution of multi-directional reflection lights reflected by the measurement target according to a single-directional incident light from the single-directional reflection lights reflected by the measurement target according to the multi-directional incident lights, and determines material of the measurement target from the multi-directional intensity distribution of reflection lights. Thus, material of an object may be easily and accurately known at a low cost.

A measuring device includes a light-emitting unit that radiates light onto an object, a first lens that changes a divergence degree of the light, a diaphragm having an aperture that reduces a diameter of the light, a second lens that converges and radiates the light onto the object, a light-receiving unit that receives at least part of the light that has been reflected by the object and that has passed through the second lens, a measuring unit that measures the object by using results related to the light-receiving unit, a reflector whose angle with respect to the light is adjustable, and a correction unit that varies a light-receiving position on the light-receiving unit by varying the reflector's angle and corrects a light amount of the light-emitting unit and a sensitivity of the light-receiving unit by using results obtained at each light-receiving position.

Disclosed herein is a spectrometer device for detecting incident radiation generated by an object and a spectrometer system

The spectrometer device and the spectrometer system for detecting incident radiation generated by an object includes: a measurement window, a detector array, an optical filter, and at least one optical element configured for modifying the field of view of at least one pixelated sensor by increasing at least one overlap between the field of views of the at least two pixelated sensors.

Further described herein is the advantage that the spectrometer device and the spectrometer system are robust against the granularity of an object, particularly by providing a sensor signal that may be correlated in a common measurement result, as the fields of view of the single pixelated sensors have an increased overlap.