G01N2021/8636

Measuring device

A measuring device includes: an irradiator that irradiates electromagnetic waves to an inspection object; a light collector having a reflecting surface that guides, to a light-collecting surface, electromagnetic waves whose incident angle with respect to an incident end facing the inspection object is within a predetermined angle, among the electromagnetic waves that have been transmitted through the inspection object; and a detector that detects the electromagnetic waves guided to the light-collecting surface. The measuring device measures a characteristic of the inspection object based on the detected electromagnetic waves.

PINHOLE DETECTION DEVICE

The problem solved by the present invention is to provide a pinhole detection device with an improved accuracy of detecting pinholes. The detection unit of the pinhole detection device includes a plurality of optical fibers that transmit light that has passed through the object to be inspected. The plurality of optical fibers are arranged side by side while facing a light source. When a maximum detectable angle at which the pinhole with respect to an optical axis of the light source is detectable is defined as ?, a maximum angle of incidence of light that can be transmitted by the optical fiber with respect to the optical axis of the light source is set in a range of ?+0? to ?+5?.

MEASURING DEVICE

A measuring device includes: an irradiator that irradiates electromagnetic waves to an inspection object; a light collector having a reflecting surface that guides, to a light-collecting surface, electromagnetic waves whose incident angle with respect to an incident end facing the inspection object is within a predetermined angle, among the electromagnetic waves that have been transmitted through the inspection object; and a detector that detects the electromagnetic waves guided to the light-collecting surface. The measuring device measures a characteristic of the inspection object based on the detected electromagnetic waves.

SAMPLE MANUFACTURING METHOD, SAMPLE MANUFACTURING KIT, OBSERVATION METHOD, AND OBSERVATION DEVICE
20180361377 · 2018-12-20 · ·

Provided is a sample manufacturing method that includes: a step of forming a hanging drop consisting of a liquid drop of a medium solution in a hanging state while causing at least one cell aggregate to be encapsulated in the liquid drop of the medium solution, the medium solution becoming substantially transparent upon gelling or solidifying; and a step of causing the hanging drop to gel or solidify by causing a promoting factor that promotes gelling or solidification of the medium solution to act on the hanging drop.

PHOTOLUMINESCENT IMAGING OF SEMICONDUCTOR SAMPLES

A method and apparatus for photoluminescent imaging of a sample are disclosed.

CONVEYANCE DEVICE, CONVEYANCE SYSTEM, AND HEAD CONTROL METHOD

A conveyance device includes a conveyor to convey a conveyed object, a head unit to perform an operation on the conveyed object, a sensor to obtain surface data of the conveyed object, provided for each head unit, and at least one processor. The processor is configured to calculate a first detection result including at least one of a position, a speed of movement, and an amount of movement of the conveyed object based on the surface data, set a detection area based on the first detection result, calculate a second detection result using the detection area according to the first detection result. The processor is further configured to control operation of the at least one head unit based on the second detection result.

Shape inspection apparatus for metallic body and shape inspection method for metallic body

[Object] To perform shape inspection of a metallic body in a simple way at higher speed with higher density. [Solution] An apparatus of the present invention includes: a measurement apparatus configured to irradiate a metallic body with at least two illumination light beams, and measure reflected light separately; and an arithmetic processing apparatus configured to calculate information used for shape inspection of the metallic body on the basis of measurement results. The measurement apparatus includes a plurality of illumination light sources configured to emit strip-shaped illumination light having different peak wavelengths, and a plurality of monochrome line sensor cameras that have band-pass filters and are aligned vertically above a surface of the metallic body and set to capture images of the same portion of the metallic body by their respective shift lenses, the number of the monochrome line sensor cameras being the same as the number of the peak wavelengths of the emitted illumination light. At least two of the plurality of illumination light sources are provided in a manner that an angle formed by a normal direction to the surface of the metallic body and an optical axis of the first illumination light source is substantially equal to an angle formed by the normal direction and an optical axis of the second illumination light source and the two illumination light sources face each other with the line sensor cameras therebetween in a relative movement direction of the metallic body and the measurement apparatus.

SHAPE INSPECTION APPARATUS FOR METALLIC BODY AND SHAPE INSPECTION METHOD FOR METALLIC BODY

[Object] To perform shape inspection of a metallic body in a simple way at higher speed with higher density.

[Solution] An apparatus of the present invention includes: a measurement apparatus configured to irradiate a metallic body with at least two illumination light beams, and measure reflected light separately; and an arithmetic processing apparatus configured to calculate information used for shape inspection of the metallic body on the basis of measurement results. The measurement apparatus includes a plurality of illumination light sources configured to emit strip-shaped illumination light having different peak wavelengths, and a plurality of monochrome line sensor cameras that have band-pass filters and are aligned vertically above a surface of the metallic body and set to capture images of the same portion of the metallic body by their respective shift lenses, the number of the monochrome line sensor cameras being the same as the number of the peak wavelengths of the emitted illumination light. At least two of the plurality of illumination light sources are provided in a manner that an angle formed by a normal direction to the surface of the metallic body and an optical axis of the first illumination light source is substantially equal to an angle formed by the normal direction and an optical axis of the second illumination light source and the two illumination light sources face each other with the line sensor cameras therebetween in a relative movement direction of the metallic body and the measurement apparatus.

Shape inspection apparatus for metallic body and shape inspection method for metallic body

To inspect the shape of a metallic body further accurately, regardless of surface roughness of the metallic body. A shape inspection apparatus for a metallic body according to the present invention includes: a measurement apparatus configured to irradiate a metallic body with at least two illumination light beams, and measure reflected light of the two illumination light beams from the metallic body separately; and an arithmetic processing apparatus configured to calculate information used for shape inspection of the metallic body on the basis of luminance values of the reflected light. The measurement apparatus includes a first illumination light source and a second illumination light source configured to irradiate the metallic body with strip-shaped illumination light having mutually different peak wavelengths, and a color line sensor camera configured to measure reflected light of first illumination light and reflected light of second illumination light, separately. The first illumination light source and the second illumination light source are provided in a manner that their optical axes form substantially equal angles with a direction of regular reflection of an optical axis of the color line sensor camera at a surface of the metallic body. A wavelength difference between a peak wavelength of the first illumination light and a peak wavelength of the second illumination light is equal to or more than 5 nm and equal to or less than 90 nm.

Supercontinuum laser based web gauging system

A web gauging system and methods of using the web gauging system are described. The web gauging system includes a supercontinuum Laser providing a light beam. A beam expander is configured to expand the light beam and provide an expanded beam to a sample illumination area. A detector unit configured to detect a sample light from the illumination area. A moving web can be placed in the illumination area, where the web gauging system measures parameters of the web.