An optical examination device is designed to detect properties of a semiconductor component. The device comprises a first illumination arrangement, a second illumination arrangement and an imaging device, where the first illumination arrangement emits infrared light onto a first surface of the semiconductor component, which faces away from the imaging device (camera). The infrared light fully penetrates the semiconductor component at least proportionally. The second illumination arrangement emits visible light onto a second surface of the semiconductor component, which faces the imaging device. The imaging device is designed and arranged to detect the light spectrum emitted from both the first and the second illumination arrangement, and as a result of a subsequent image evaluation on the basis of both the visible and the infrared light spectrum, to provide a separate image reduction for determining property defects or damage of the semiconductor component.

The invention relates to an apparatus for inspecting printed images for a printing or finishing machine with continuously moving printed products with an image detection device (3) with at least one camera (7), which is set up to detect a multi-line section of a recording region (5). In accordance with the invention, the device is characterized by an evaluation device (8) which is set up to process at least two partial areas of the multi-line section as one strip image each, and has a validation mode in which at least two strip images of a test image are compared with each other to check whether deviations of the strip images are detected. In a method according to the invention for validating the inspection algorithms, a stencil (20; 40) is placed in a recording region (5) of the device (1) for print image inspection, at least two multi-line strip images are acquired and compared with each other to determine whether deviations between a first and a second pattern are detected.

The present disclosure generally relates to machine vision systems, illumination sources for use in machine vision systems, and components for use in the illumination sources. More specifically, the present disclosure relates to machine vision systems incorporating multi-function illumination sources, multi-function illumination sources, and components for use in multi-function illumination sources.

The invention concerns, amongst others, a device (1) for specific illumination of at least one biological sample, the device (1) comprising a multitude of cavities (2), each cavity (2) representing an internal space (3) being capable of holding the biological sample. The internal spaces (3) are each partially surrounded by a wall element (4) comprising windows (5) for observing and/or illuminating the internal spaces (3). In order to protect the internal spaces (3) from the ingress of light, the wall element (4) comprises a light-proof material. Each window (5) comprises at least one switchable element (8) being of switchable color and/or light transmittance. By the switchable elements (8), light exposure of the biological sample in the internal space (3) of each cavity (2) can be controlled so that unintended light exposure can be effectively avoided when illumination of the sample does not occur and/or the device (1) is stored or transported.

Disclosed is a surface foreign substance detector for a transparent or translucent film. The surface foreign substance detector for a transparent or translucent film according to the present invention comprises: an optical unit; an optical housing accommodating the optical unit therein; a light emission unit emitting light to the film; and a film holder providing a loading surface such that the film can be loaded thereon and made of a light-absorbing material capable of absorbing light or reflecting the light at a predetermined ratio or less. According to the present invention, the holder supporter is manufactured by using a material capable of generating a predetermined electrostatic force or more between the holder supporter and the foreign substances floating in a surrounding space to prevent foreign substances floating or scattered in a surrounding work space from being moved to the film side, thereby improving detection reliability.

A portable lighting device has an upright configuration and a folded configuration. In the upright configuration, the portable lighting device provides lighting directed to a workspace area. In the folded configuration, the legs of the portable lighting device are rotated into a compact position for transport or storage. The portable lighting device includes lugs to hold one or more objects, which helps increase the surface area of the workspace. The portable lighting device is suitable for different uses of tradespersons and hobbyists. For example, a user can use the portable lighting device while working on radio-controlled car or electrical or hardware repairs.

An optical examination device is designed to detect properties of a semiconductor component. The device comprises a first illumination arrangement, a second illumination arrangement and an imaging device, where the first illumination arrangement emits infrared light onto a first surface of the semiconductor component, which faces away from the imaging device (camera). The infrared light fully penetrates the semiconductor component at least proportionally. The second illumination arrangement emits visible light onto a second surface of the semiconductor component, which faces the imaging device. The imaging device is designed and arranged to detect the light spectrum emitted from both the first and the second illumination arrangement, and as a result of a subsequent image evaluation on the basis of both the visible and the infrared light spectrum, to provide a separate image reduction for determining property defects or damage of the semiconductor component.

An imaging lighting device of an appearance inspection device images a product T. A controller of the appearance inspection device causes an imaging control unit to obtain an image, a preprocessing unit to position the product and remove background of the product, a color space processing unit to perform color space processing for emphasizing a defect such as a flaw and a dent of the product and to create a color space processing image, and an assessment unit to make an quality assessment of the product using a learned model obtained through machine learning of quality assessment of the product using the color space processing image.

Accuracy of detecting abnormalities on the surface of a workpiece is improved. An appearance inspection apparatus for inspecting the appearance of a workpiece is provided. The appearance inspection apparatus for inspecting the appearance of the workpiece includes a first lighting unit that irradiates the workpiece with light, a first imaging unit that images the workpiece irradiated by the first lighting unit, a first detection unit that detects a first defect from an image captured by the first imaging unit, a second lighting unit that irradiates the workpiece with light, a second imaging unit that images the workpiece irradiated by the second lighting unit, and a second detection unit that detects a second defect from an image captured by the second imaging unit. The first lighting unit uses coaxial epi-illumination, and the second lighting unit uses coaxial epi-illumination and dome illumination.

Disclosed is a surface foreign substance detector for a transparent or translucent film. The surface foreign substance detector for a transparent or translucent film according to the present invention comprises: an optical unit; an optical housing accommodating the optical unit therein; a light emission unit emitting light to the film; and a film holder providing a loading surface such that the film can be loaded thereon and made of a light-absorbing material capable of absorbing light or reflecting the light at a predetermined ratio or less. According to the present invention, the holder supporter is manufactured by using a material capable of generating a predetermined electrostatic force or more between the holder supporter and the foreign substances floating in a surrounding space to prevent foreign substances floating or scattered in a surrounding work space from being moved to the film side, thereby improving detection reliability.