Patent classifications
G01N2021/8816
AUTOMATED INSPECTION OF FOREIGN MATERIALS, CRACKS AND OTHER SURFACE ANOMALIES
An inspection system for detecting defects in a workpiece can include an illumination source for illuminating a first section of the workpiece with a patterned light, wherein the illumination source does not illuminate a second section of the workpiece. The inspection system further includes a feedback camera for imaging the first section and producing a first output, and a background camera for imaging the second section and producing a second output. A processor compares the first output with the second output, and a controller alters the patterned light that is output by the illumination source based on the comparison. This feedback control continues until the background is suitably homogeneous or camouflaged compared to the defect, such that the visibility and/or detectability of the defect is increased.
BAFFLES FOR THREE-DIMENSIONAL SENSORS HAVING SPHERICAL FIELDS OF VIEW
In one example, a distance sensor includes a camera to capture images of a field of view, a plurality of light sources arranged around a lens of the camera, wherein each light source of the plurality of light sources is configured to project a plurality of beams of light into the field of view, and wherein the plurality of beams of light creates a pattern of projection artifacts in the field of view that is visible to a detector of the camera, a baffle attached to a first light source of the plurality of light sources, wherein the baffle is positioned to limit a fan angle of a plurality of beams of light that is projected by the first light source, and a processing system to calculate a distance from the distance sensor to an object in the field of view, based on an analysis of the images.
APPEARANCE INSPECTION DEVICE, LIGHTING DEVICE, AND IMAGING LIGHTING DEVICE
An imaging lighting device of an appearance inspection device images a product T. A controller of the appearance inspection device causes an imaging control unit to obtain an image, a preprocessing unit to position the product and remove background of the product, a color space processing unit to perform color space processing for emphasizing a defect such as a flaw and a dent of the product and to create a color space processing image, and an assessment unit to make an quality assessment of the product using a learned model obtained through machine learning of quality assessment of the product using the color space processing image.
LED matrix lighting device
An LED matrix lighting device for illuminating a lighting pattern with even intensity. The LED matrix lighting device includes a plurality of LEDs, a collimating lens in front of each LED for collimating light of the LED, and a light refracting element in front of collimating lenses arranged to refract light of at least a first part of the LEDs with a different refraction angle than at least a second part of the LEDs. The disclosure further relates to a machine vision system, a method, and a computer program product.
Method for Monitoring the Compliance of a Container and Apparatus Thereof
A method for monitoring the compliance of a container having a substantially cylindrical shape includes: rotating the container about its longitudinal axis; illuminating the rotating container with a first light source having a first wavelength, thereby generating a first image representative of any incohesive particles that may be present on an inner and/or outer surface of the container; illuminating the rotating container with a second light source having a second wavelength, thereby generating a second image representative of any defects on the surface of the container; acquiring the first image by means of a first acquisition device; acquiring the second image by means of a second acquisition device; comparing the first image and the second image with reference parameters, and notifying any defects of the container as a function of the comparison; wherein the first light source has a different wavelength than the second light source.
Automated inspection of foreign materials, cracks and other surface anomalies
An inspection system for detecting defects in a workpiece can include an illumination source for illuminating a first section of the workpiece with a patterned light, wherein the illumination source does not illuminate a second section of the workpiece. The inspection system further includes a feedback camera for imaging the first section and producing a first output, and a background camera for imaging the second section and producing a second output. A processor compares the first output with the second output, and a controller alters the patterned light that is output by the illumination source based on the comparison. This feedback control continues until the background is suitably homogeneous or camouflaged compared to the defect, such that the visibility and/or detectability of the defect is increased.
SYSTEM AND METHOD FOR AUTOMATIC INSPECTION OF VEHICLES
An automatic inspection station is presented for inspecting exterior of vehicles. The inspection station comprises a physical structure configured to be deployable at a predetermined location and, when deployed defining first and second adjacent compartments and exposing an inner space of the first compartment to vehicle's entry and exit into and from said inner space and at least partially isolate said inner space from ambient light. The first compartment comprises an inspection system, and the second compartment comprises a control system in data communication with the inspection system. The inspection system comprises an optical imaging system configured and operable for imaging a vehicle located within at least part of said inner space and generating image data which is processed and analyzed by the control system to generate data indicative of vehicle's status.
CONTROLLER AND IMAGE PROCESSING SYSTEM
A controller includes a specifying part and a reception part. The specifying part specifies positions where the illumination units are connected. The reception part presents a lightable area and an unlightable area in different modes based on the positions where the illumination units are connected, the positions being specified by the specifying part. The reception part receives settings of the lighting conditions for the lightable area.
IMAGE INSPECTION DEVICE AND LIGHTING DEVICE
An image inspection device and a lighting device capable of setting an irradiation solid angle for each location of a visual field and capable of miniaturization are provided. The image inspection device includes a photographing portion that photographs the target, and a light transmissible lighting portion that is disposed between the target and the photographing portion and configured to irradiate light in a direction toward the target. The lighting portion includes a plurality of light-emitting portions that is arranged in a matrix form and configured to be capable of selectively emitting light, and an optical system configured to control irradiation directions of the light emitted from each of the plurality of light-emitting portions to be directions corresponding to positions of each of the plurality of light-emitting portions.
Object Illumination Systems
Systems and apparatuses of operating the same are described. An apparatus that may include a light guide. The light guide may include a body configured to direct at least a portion of light within a defined wavelength spectrum from a first light source toward an object. The body may be formed of a material to provide a threshold contrast ratio between a first portion of the object and a second portion of the object. The body may include a first surface that includes a first cavity formed to receive at least a portion of an incident end the first light source. The body may include a second surface at a distal end from the light source. The second surface may be a peripheral diffusing portion or a peripheral focusing portion.