Patent classifications
G
PHYSICS
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G01
MEASURING; TESTING
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G01N
INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
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21/00
Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
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G01N21/84
Systems specially adapted for particular applications
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G01N21/88
Investigating the presence of flaws or contamination
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G01N21/8806
Specially adapted optical and illumination features
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G01N2021/8829
Shadow projection or structured background, e.g. for deflectometry
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G01N2021/8832
Structured background, e.g. for transparent objects
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