The present invention provides a marking apparatus for a display panel and a marking method for a display panel. The marking device comprises an image acquiring module, a simulated marking module and a real marking module. A simulated marking line is drawn, by the simulated marking module, in an image acquired by the image acquiring module, of a region containing a position where a defect occurs on a display panel to be marked. The real marking module automatically draws a real marking line on the display panel to be marked according to the simulated marking line. Thus, a position where a defect occurs on a display panel to be marked is accurately marked, and it is convenient for an engineer to accurately locate and sample the defective position in the subsequent analysis process.

This disclosure describes techniques for automatically controlling the operation of a slitter (40) to convert a web (20) of material into smaller slit rolls (64, 66, 68). A slitter director (60) may automatically control the operation of a slitter (40) for defect removal, web splicing, and/or slit roll rejection based on continually registering previously-generated anomaly data (62) with physical locations of the web (20).

Systems and methods for determining cross-section profiles of underground fluid conveyance structures involves a memory configured to store a profile scan dataset of at least one pipe and at least one pipe template. A processor is configured to compare the profile scan dataset to one or more templates. Profile deviations in a pipe profile are determined using the comparison. A location and an areal measurement of the profile deviations is determined. A user interface is configured to present the profile deviations to a user.

An apparatus according to the present disclosure acquires a display condition for displaying at least a part of target data as a display image on a display device, determines, in a case where the display image is changed, whether to store the display condition according to a changed display image in a storage device, based on an index relating to the change of the display image, and stores, in a case where the display condition is determined to be stored, the display condition according to the changed display image in the storage device.

There is provided a technique that includes: a camera configured to capture images of the target object; a memory configured to store the images of the target object and feature data including one or more predetermined exterior features of the target object; and a processor configured to: determine a first process configuration for an operation including a plurality of image processes; perform the operation under the first process configuration; generate inspection data from the sets of images that have been processed; generate an inspection score by comparing the inspection data with the feature data; compare the inspection score with a predetermined threshold score; set the first process configuration as an optimal configuration if the inspection score satisfies the predetermined threshold score.

Visualizing a contaminant is provided. A contaminant of a plurality of different contaminants included in a contaminant knowledgebase is identified based on analysis of contaminant-relevant data received from one or more sensors of a plurality of different sensor arrays regarding an enclosed physical space. A concentration and a type of the contaminant is identified based on the contaminant-relevant data and information included in the contaminant knowledgebase. A location of the contaminant is identified within the enclosed physical space based on location of the one or more sensors that obtained the contaminant-relevant data and a digital twin of the enclosed physical space. A visualization of the contaminant is projected at an area proximate to the location of the contaminant using a holographic image indicating the concentration and the type of the contaminant within the enclosed physical space.

A visual control system for an extended product being a wire, a tube, a plate, a strip or a series of juxtaposed elements type contains a first measurement zone with an inspection unit for automatically inspecting a portion of the product advancing along a longitudinal path. The inspection unit delivering at least one map having qualitative information of an inspected portion of the product. A second control zone is disposed downstream of the first measurement zone and has a device for overprinting at least the qualitative information on the portion of the product. The second control zone being intended for displaying the portion as it arrives in the second control zone.

An information processing apparatus includes an image obtaining unit configured to obtain an image, a first determining unit configured to determine a first image range to be used in making a determination related to inspection of an inspection target included in the image, based on a detection result of the inspection target from the image, and a second determining unit configured to determine a second image range to be used in recording an inspection result of the inspection target, the second image range being an image range indicating a wider range than a range indicated by the first image range.

Disclosed is a method for determining fine particle defects on a silicon wafer that includes detecting first defects on the surface of the silicon wafer, depositing a thin film thereon, detecting second defects thereon, determining whether or not additional defects are formed after deposition of the thin film, and removing noise therefrom. Using the method, it is possible to identify ultrafine particle defects present on the surface of the silicon wafer before detection of the first defects.

This invention provides an information processing apparatus comprising an image creating unit which creates, from a first image associated with global coordinates, a partial image that is a portion of the first image, as a second image, a recognition processing unit which executes, on the second image, recognition processing of a preset characteristic, and creates a recognition result associated with local coordinates of the second image, and a coordinate converting unit which converts the coordinates of the recognition result from the local coordinates into the global coordinates.