The invention relates to a method for providing a coating composition-related prediction program, the method comprising: providing a database (204, 904) comprising associations of qualitative and/or quantitative characterizations of coating surfaces and one or more parameters; training a machine learning model for providing a predictive model (M2, M3) having learned to correlate qualitative and/or quantitative characterizations of one or more coating surfaces with one or more of the parameters; and providing a composition-quality-prediction program configured for using the predictive model (M2) for predicting the properties of a coating surface to be produced from one or more input parameters; and/or providing a composition-specification-prediction program configured for using the predictive model (M3) for predicting, based on an input specifying at least a desired coating surface characterization, one or more output parameters related to a coating composition predicted to generate a coating surface having the input surface characterizations.

A method for qualitative and/or quantitative characterization of a coating surface is provided, comprising: providing a program recognizing coating surface defect types; determining, by the program, whether a camera(s) coupled to the program is within a predefined distance range and/or within a predefined image acquisition angle range relative to a currently presented coating surface; depending on the determination: generating a feedback signal indicative of whether adjustment of the position of the camera(s) is within predefined distance range and/or within the predefined image acquisition angle range, and/or automatically adjusting the relative distance of the camera and and/or automatically adjusting the angle of the camera; enabling the camera to acquire an image of the coating surface only when the camera(s) is/are within the predefined distance range and/or image acquisition angle range; processing the digital image for recognizing coating surface defects; and outputting a characterization of the coating surface.

A method of identifying an item on a surface of a workpiece is disclosed. An optical device identifies an item on the surface of a workpiece. An item identification system includes a light projector and a photogrammetry system. One of the light projector and the photogrammetry system generates a three-dimensional coordinate system within the work cell. One of the light projector and the photogrammetry system identifies a location of the surface of the workpiece within the three-dimensional coordinates system. The controller calculates geometric location of the item on the surface of the work piece in the three-dimensional coordinate system as identified by the optical device. The controller signals the light projector to project a beam of light onto the surface of the workpiece identifying a disposition of the item disposed upon the surface of the workpiece.

An information processing apparatus includes an image obtaining unit configured to obtain an image, a first determining unit configured to determine a first image range to be used in making a determination related to inspection of an inspection target included in the image, based on a detection result of the inspection target from the image, and a second determining unit configured to determine a second image range to be used in recording an inspection result of the inspection target, the second image range being an image range indicating a wider range than a range indicated by the first image range.

This invention provides a processing apparatus for determining a state of secular change of a deformation of a construction, comprising a selection unit that selects, as a target for determination of secular change, at least a portion of deformations from among a plurality of deformations included in a first image at a first time period, on the basis of at least one of information relating to deformations, information relating to the construction, user selection, or a shape and a relative positional relationship of two or more deformations; a first determination unit that determines a deformation corresponding to a selected deformation among a plurality of deformations included in a second image at a second time period; and a second determination unit that determines a state of secular change between a selected deformation and a deformation determined by the first determination unit.

There is provided a technique that includes: a camera configured to capture images of the target object; a memory configured to store the images of the target object and feature data including one or more predetermined exterior features of the target object; and a processor configured to: determine a first process configuration for an operation including a plurality of image processes; perform the operation under the first process configuration; generate inspection data from the sets of images that have been processed; generate an inspection score by comparing the inspection data with the feature data; compare the inspection score with a predetermined threshold score; set the first process configuration as an optimal configuration if the inspection score satisfies the predetermined threshold score.

A method and device recognize and analyze surface defects in three-dimensional objects having a reflective surface, in particular motor vehicle bodies. In which method the surface defects are identified by the evaluation of an image, recorded by a camera in the form of a raster image of pixels, of an illumination pattern projected by a first illumination device onto a part of the reflective surface using a two-dimensional raster coordinate system. The surface defects are identified exclusively using two-dimensional image information with the aid of image processing algorithms without the need for “environmental parameters”, and complex geometric calculations can be omitted. The solution is fast and robust and can be carried out using differently configured first illumination devices, which makes it suitable for mobile applications, for example as a hand-held module. It is also made possible for the method to be optimized by a “deep learning” strategy.

The present invention provides an image processing method for CDSEM for determining a measuring range of an image of a target pattern measured by a CDSEM machine. The image processing method of CDSEM comprises: obtaining a first gray scale image based on the image of the target pattern; performing Fourier transform to the first gray scale image to obtain a first frequency spectrum distribution; filtering out frequency spectrum components whose absolute values of ordinate are greater than preset threshold in the first frequency spectrum distribution to obtain a second frequency spectrum distribution, the preset threshold relates to the background noise and the signal frequency of SRAF features; and determining the measuring range based on the second frequency spectrum distribution.

The invention relates to marks used for marking gemstones, including diamonds or brilliants, and carrying information for various purposes, for example, identification codes. In particular, the marks are invisible to the naked eye, using magnifying glasses and various types of microscopes. The marks are located inside the volume of diamonds or brilliants without affecting their characteristics, resulting in damage to the quality of diamonds or brilliants. An optically permeable mark located inside the diamond or brilliant volume is disclosed. The mark contains predefined encoded information and consists of a given set of optically permeable elements of micron or submicron size, which represent areas of increased concentration of atomic defects in the diamond or brilliant crystal lattice. The atomic defects in the diamond or brilliant crystal lattice are vacancies and interstitials, wherein said information is encoded in at least two areas of increased concentration of said atomic defects.

Provided is the technique that allows an operator or the like to easily grasp in which part of a mold a defect has been detected. A display control device is configured to carry out a display process in which a marker indicating a defect of a mold determined by an inspection result, which is obtained by an inspection of molds, is optically displayed on the mold.