Patent classifications
G01N21/8903
STATIC FULL WIDTH MEASUREMENT SYSTEM
A full width measurement system includes a frame having a first and second rails. The first and second rails are positioned transverse to a moving sheet of material such that the first and second rails are positioned on opposite sides of the moving sheet. Sources may be positioned along the first rail in a predetermined arrangement across a width of the moving sheet. Each of the sources are configured to emit energy toward the moving sheet in a predetermined pattern. Detectors may be positioned along the second rail in a predetermined alignment with respect to the sources such that each of the detectors detect an energy level from multiple respective sources after the energy from the respective sources has passed through the moving sheet. Controller circuitry is configured to receive signals from the detectors and provide real time measured parameters spanning the width of the moving sheet of material.
DEFECT INSPECTION DEVICE
The invention includes a pulse oscillated light source, an illumination unit that guides light output from the light source to a sample, a scanning unit that controls a position at which the sample is scanned by the illumination unit, alight converging unit that converges light reflected from the sample, a first photoelectric conversion unit that outputs an electric signal corresponding to the light converged by the light converging unit, an AD conversion unit that converts the electric signal output from the first photoelectric conversion unit into a digital signal in synchronization with pulse oscillation of the light source, a linear restoration unit that processes a digital signal converted by the AD conversion unit in synchronization with a pulse oscillation output by the AD conversion unit and corrects nonlinearity of the first photoelectric conversion unit, a defect detection unit that detects a defect of the sample based on an output of the linear restoration unit, and a processing unit that obtains and outputs a position and a size of the defect detected by the defect detection unit.
Anisotropic conductive film
An anisotropic conductive film includes an electrically conductive particle dispersion layer, which includes electrically conductive particles dispersed, in a predetermined dispersion state, in an electrically insulating adhesive. The anisotropic conductive film includes a defective portion indication means configured to provide information about a location of a defective portion regarding the dispersion state of the electrically conductive particles. A bonding method for bonding the anisotropic conductive film to an electronic component is performed such that, in accordance with the information about the location of the defective portion, obtained from the defective portion indication means, a defect-free portion of the anisotropic conductive film is bonded to a region where terminals or terminal arrays are present in the electronic component to be anisotropically conductively connected.
Method and system for detecting inclusions in float glass
A method and/or system is provided for detecting inclusions (e.g., nickel sulfide based inclusions/defects) in soda-lime-silica based glass, such as float glass. In certain example instances, during and/or after the glass-making process, following the stage in the float process where the glass sheet is formed and floated on a molten material (e.g., tin bath) and cooled or allowed to cool such as via an annealing lehr, visible light from an intense visible light source(s) is directed at the resulting glass and thermal imaging is used to detect inclusions based on a temperature difference between the inclusions and surrounding float glass. In another example embodiment, inclusion detection may be performed without exposure of the glass to light from a light source(s). Inclusions and surrounding glass may cool at different rates and be at different temperatures just prior to and/or after an annealing lehr, and a difference in residual temperature between inclusions and surrounding glass may be detected via thermal imaging and identified to identify inclusion(s).
Method and device for compensating for a material web offset in material web inspection
The invention relates to a device and a method for compensating for a material web offset in inspection systems for material webs which are moving in the direction of a material web length and/or a material web width. The method comprises the following steps: taking a first picture of a first portion of a material web at a first point in time with a camera which comprises a matrix chip, and taking a second picture of a second portion of the material web at a second point in time with the camera. A first active partial surface of the matrix chip is used for the first picture and a second active partial surface of the matrix chip is used for the second picture here, wherein the first active partial surface and the second active partial surface are not identical.
Inspection station and method for inspecting sheet material
The invention relates to an inspection station for crimped sheet material. The station comprises a light source to illuminate crimped sheet material in an inspection location, a vibrating device to vibrate crimped sheet material in the inspection location. The vibrating device comprises a vibrating element, wherein crimped sheet material is guidable along or over the vibrating element for the crimped sheet material to be vibrated by the vibrating element. The inspection station further comprises a detector for detecting light received from the vibrated crimped sheet material, thereby providing images of the crimped sheet material, and a controller to determine loose material on the crimped surface of the sheet material. The invention also relates to an inspection method and an apparatus comprising an inspection station.
APPARATUS AND METHOD FOR INSPECTING GLASS SUBSTRATE
An apparatus and method for inspecting a glass substrate. The apparatus for inspecting a glass substrate includes a stage configured to support the glass substrate, a first light source for irradiating light onto a surface of the glass substrate at a first angle, a first camera for capturing scattered light of the light irradiated from the first light source, a second light source for irradiating light onto the surface of the glass substrate at a second angle greater than the first angle, a second camera for capturing reflected light and scattered light of the light irradiated from the second light source, and a defect detection unit for detecting a defect of the glass substrate using a first image provided by the first camera and a second image provided by the second camera.
Printing result inspection apparatus and method
Provided are a printing result inspection apparatus, a method, and a program capable of determining a printing defect caused by a printing step and a printing paper defect caused by printing paper by reading the printing paper once. A defect determination unit determines whether defected regions extracted from a non-image region are the printing defect or the printing paper defect based on a density change amount and a color, and an image feature amount of a defected region determined as the printing paper defect in the non-image region is stored in paper defect information and is accumulated in a paper defect information storage unit. Next, the defect determination unit determines whether defected regions extracted from image regions are the printing defect or the printing paper defect based on the paper defect information.
Systems and methods for thermal radiation detection
Systems and methods for thermal radiation detection utilizing a thermal radiation detection system are provided. The thermal radiation detection system includes one or more mercury-cadmium-telluride (HgCdTe)-based photodiode infrared detectors or Indium Arsenide (InAs)-based photodiode infrared detectors and a temperature sensing circuit. The temperature sensing circuit is configured to generate signals correlated to the temperatures of one or more of the plurality of infrared sensor elements. The thermal radiation detection system also includes a signal processing circuit.
MOISTURE DETECTING APPARATUS FOR RECORDING MATERIAL AND IMAGE FORMING APPARATUS
A detecting apparatus includes first and second light emitting elements configured to emit light on a recording material, and a light receiving unit configured to receive the light transmitted through the recording material. The apparatus also includes a rotation member configured to rotate and press the recording material, on which the first light and the second light is emitted, against a conveyance guide for guiding the recording material. As viewed in a rotational axis direction of the rotation member, a first light path connecting the first light emitting element with the light receiving unit and a second light path connecting the second light emitting element with the light receiving unit overlap with the cylindrical member.