A method for measuring the thickness of coatings on a substrate of an aerospace component comprises illuminating a sample comprising the substrate of the aerospace component and a coating with light waves of varying wavelengths from a light source, receiving the light waves reflected by the sample at a light collector, diffracting the light waves into a plurality of component wavelengths with a grating, detecting the light intensities of the plurality of component wavelengths at a detector array, generating a reflectance spectral curve using the detected light intensities for each of the plurality of component wavelengths, calculating the thickness of the coating from the reflectance spectral curves of the component wavelengths.

A surface-defect detecting method of optically detecting a surface defect of a steel material, the method including: an irradiation step of irradiating an examination target part with illumination light beams from different directions by using two or more distinguishable light sources; and a detection step of detecting a surface defect in the examination target part based on the degree of overlapping of bright portions extracted from two or more images formed by reflected light beams of the illumination light beams.

A surface inspection device of a metal strip includes: a first light source unit configured to emit light to a surface of a metal strip; a first imaging unit configured to image regular reflection light on the surface by emission light from the first light source unit; a second light source unit configured to emit light of a wavelength band different from the first light source unit to the surface; a second imaging unit configured to image irregular reflection light on the surface by emission light from the second light source unit; and a surface defect distinguishing unit configured to distinguish a surface defect by using the regular reflection light and irregular reflection light. The emission light from the first light source unit and the emission light from the second light source unit are simultaneously applied to a same place on the surface of the metal strip.

An electrode sheet inspection system includes an inspection unit configured to inspect the external state of an electrode sheet and an ink marking unit configured to mark a portion to be removed on the electrode sheet, wherein the ink marking unit is configured to adjust an ink marking range, whereby it is possible to prevent removal of a mark on a defective portion of an electrode even after a process of notching the electrode sheet. An electrode sheet inspection method using the same is also described.

A device for the contactless determination of at least one property of a metal product during the metallurgical production of the metal product comprises a housing and at least one measuring device comprising a transmitting unit and a receiving unit. An electromagnetic field is generated by the transmitting unit and directed onto the metal product, thereby inducing a physical interaction in the material of the metal product, and a remaining and/or resulting part of this physical interaction is subsequently received by the receiving unit. At least one component of the measuring device comprising the transmitting unit and/or the receiving unit can be moved relative to the housing or the metal product moving therein, in order to thereby set or selectively change a predetermined distance to the metal product for the transmitting unit and/or the receiving unit.

The disclosure contains a method of quantifying and/or evaluating metal ions in a dentifrice, wherein the method comprises subjecting the dentifrice to X-ray absorption spectroscopy (XAS), and wherein the XAS is used to measure and/or evaluate the metal ions in the dentifrice. Also disclosed are methods of selecting and screening for dentifrices based upon the evaluation and quantification of their metal ion content.

A method for measuring the thickness of coatings on metal substrates comprises illuminating a sample comprising a substrate and a coating with light waves of varying wavelengths from a light source, receiving the light waves reflected by the sample at a light collector, diffracting the light waves into a plurality of component wavelengths with a grating, detecting the light intensities of the plurality of component wavelengths at a detector array, generating a reflectance spectral curve using the detected light intensities for each of the plurality of component wavelengths, calculating the thickness of the coating from the reflectance spectral curves of the component wavelengths.

Method for measuring thickness of coatings includes illuminating an automobile sample comprising a substrate and at least one coating with light waves of varying wavelengths from a light source. It further includes receiving the light waves reflected by a top surface and a bottom surface of the coating on the sample at the light collector. It also includes diffracting the light waves into a plurality of component wavelengths with a grating, detecting light intensities of the plurality of component wavelengths at a detector array, generating a combined reflected interference pattern spectral curve using the detected light intensities for each of the received light waves for each of the plurality of component wavelengths, and calculating a thickness of the at least one coating from a frequency of the combined reflected interference pattern spectral curve of the component wavelengths.

A method for measuring a thickness of a coating includes illuminating a substrate of an appliance with light waves of varying wavelengths from a light source. The method further includes receiving the light waves reflected by a top surface and a bottom surface of the coating at a light collector. The method may further include diffracting the light waves into a plurality of component wavelengths with a grating, and detecting light intensities of the plurality of component wavelengths at a detector array. The method may further include calculating a thickness of the coating from the detected light intensities.

An apparatus for manufacturing an electrode performs press-working of a strip electrode being conveyed. This manufacturing apparatus includes a press roll including a roll surface having a width that is twice or more a width of the strip electrode, a switch configured to switch a contact region of the roll surface contacting with the strip electrode during press-working, and a controller. When an abnormality of the roll surface is detected in a state where the contact region of the roll surface is a region located on the left side with respect to a center line of the roll surface, the controller controls the switch such that the contact region of the roll surface is switched to a region located on the right side with respect to the center line of the roll surface.