G01N2021/8918

APPARATUS, METHOD, AND PROGRAM FOR MONITORING OPERATION OF HIGH FREQUENCY RESISTANCE WELDING AND INDUCTION HEATING WELDING OF ELECTRIC RESISTANCE WELDED STEEL PIPE

The objective of the present invention is to enable accurate detection of a mismatch during electric resistance welding. This operation monitoring device for high-frequency resistance welding and induction heated welding of an electric resistance welded steel pipe, in which a strip-shaped metal sheet is continuously formed into a cylindrical shape by means of a group of rollers while being conveyed from an upstream side to a downstream side, and in which the two edge portions, in the circumferential direction, of the metal sheet, which are caused to converge into a V-shape, are caused to melt by the application of heat and are caused to abut one another, is characterized by being provided with a means for detecting a mismatch by recognizing a non-uniformity between light-emitting regions of a metal part, on both sides, in the circumferential direction, of the abutting position on an outer surface or an inner surface of the metal plate, on the basis of an image of a region including a V-convergence location, which is a location at which the two edge portions in the circumferential direction converge into said V-shape, and said metal part which is caused to flow out onto the surface of the metal plate by means of an electromagnetic force downstream of the V-convergence location, wherein said image is captured by means of an image capturing device from an outer surface side or an inner surface side of the metal plate that has been formed into said cylindrical shape.

Device for recognizing defects in finished surface of product

A device to detect and analyze defects in magnified scale images of a surface of a finished product illuminated with a blue light source and viewed by multiple image-capturing devices each focused on their own spot includes a supporting mechanism, a transmitting mechanism, a detecting mechanism, and a processor. The transmitting mechanism carries and transmits the product. The detecting mechanism includes a detecting frame, a blue light source assembly. The processor is used to connect to a camera assembly, and preprocess the image of the front of the product to obtain a detection and analysis of any defects of the front of the product.

METHOD AND DEVICE FOR DETECTING DEFECTS OF A STRAND-LIKE PRODUCT
20240068939 · 2024-02-29 · ·

A method is provided for detecting a defect of a strand-like product conveyed in a conveying direction at a conveying speed of more than 50 m/min. The method includes determining a frequency of a lateral movement of the strand-like product. The lateral movement occurs in a direction that is transverse to the conveying direction. Terahertz radiation is emitted at a wavelength by at least one transmitter onto the strand-like product conveyed in the conveying direction. The terahertz radiation is reflected by the strand-like product and received by at least one receiver. A temporary change in the terahertz radiation received by the at least one receiver is detected. A defect in the strand-like product is inferred when the temporary change in the terahertz radiation received by the at least one receiver is higher than the frequency of the lateral movement of the strand-like product.

Methods for Analyzing an Electrode Layer of a Battery Cell Using a KI Engine, Training a KI Engine, Producing a Battery Storage Device, and Production Units
20240133819 · 2024-04-25 · ·

Various embodiments of the teachings herein include a method for analyzing an electrode paste and/or an electrode layer for a battery cell. The method may include: measuring a property of the electrode layer paste and/or the electrode layer using a measuring facility; generating measurement data; and determining a quality value of the electrode layer paste and/or the electrode layer using an AI engine based on the measurement data.

Surface treatment of flat products made of aluminium alloys comprising colour measurements
11953424 · 2024-04-09 · ·

A method for the surface treatment of flat products made of aluminium alloys. The method includes pickling the flat product, in particular for degreasing the flat product. The method includes carrying out a colour measurement on the surface of the flat product to determine at least one measured colour value after pickling the flat product. The method includes generating output information on the basis of the at least one measured colour value. The output information is indicative of compliance with at least one rule for the measured colour value and outputting or triggering the output of the output information. The invention further relates to a device for the surface treatment of flat products made of aluminium alloys and to a use of a colorimeter which is configured to determine at least one measured colour value in a surface treatment of flat products made of aluminium alloys.

Method and apparatus for determining features of hot surface
10386309 · 2019-08-20 · ·

An arrangement for photographing a hot surface includes a camera arranged to take a number of successive images of the surface, whereby each image includes a part of the surface to be photographed. A light source is arranged to illuminate the surface to be photographed, whereby the camera and the light source are synchronized in such a way that the light source illuminates the surface at the shooting moment of each image, and an image-processing unit is arranged to combine a complete image of the whole surface to be photographed out of the successive images taken by the camera. A server is arranged to determine a coordinate system for the complete image, to receive data on the surface generated by one or more measuring devices, and to combine the received data with the complete image.

Analytical Methods

The disclosure contains a method of quantifying and/or evaluating metal ions in a dentifrice, wherein the method comprises subjecting the dentifrice to X-ray absorption spectroscopy (XAS), and wherein the XAS is used to measure and/or evaluate the metal ions in the dentifrice. Also disclosed are methods of selecting and screening for dentifrices based upon the evaluation and quantification of their metal ion content.

Surface state monitoring apparatus for metallic body and surface state monitoring method for metallic body

[Object] To monitor, on a metallic body surface, a region that has a specific hue and a region that does not have the specific hue and has a surface whose roughness varies. [Solution] Included are: a measurement apparatus which includes a line sensor camera which is provided such that an optical axis of the line sensor camera is substantially parallel to a normal direction of a metallic body surface, and first, second, and third illumination light sources each configured to irradiate the metallic body surface with first, second, and third illumination light beams each having a strip shape, the measurement apparatus being configured to measure separately respective reflected light beams of the three illumination light beams that have been emitted; and an arithmetic processing apparatus configured to calculate surface state monitoring information on the basis of luminance values of the reflected light beams. The second and third illumination light sources are provided such that a second angle between an optical axis of the second illumination light source and the optical axis of the line sensor camera is substantially equal to a third angle between an optical axis of the third illumination light source and the optical axis of the line sensor camera, and the first illumination light source is provided such that a first angle between the optical axis of the line sensor camera and an optical axis of the first illumination light source is larger than the second angle. The arithmetic processing apparatus calculates information on a hue of the metallic body surface on the basis of a luminance value of the reflected light beam of the first illumination light beam and information on surface roughness of the metallic body on the basis of luminance values of the respective reflected light beams of the second and third illumination light beams.

Inspection object imaging apparatus, inspection object imaging method, surface inspection apparatus, and surface inspection method

An inspection object imaging apparatus includes: a light source configured to produce a light beam belonging to an infrared wavelength band and having a predetermined spread half-angle on a surface of an inspection object; a projection optical system to project the light beam on the surface of the inspection object at a predetermined projection angle; and an imaging unit. The imaging unit includes an imaging optical system configured to condense reflected light and branch the reflected light to two different directions, and a first image sensor and a second image sensor, the first image sensor positioned on the inspection object side with respect to a position of the imaging optical system that is conjugate with the surface of the inspection object, along an optical axis of the reflected light, and the second image sensor positioned on the reflected-light travel direction side with respect to the conjugate position.

Surface defect inspecting device and method for steel sheets
10267747 · 2019-04-23 · ·

A surface defect inspecting device for steel sheets includes: an illuminating unit configured to illuminate an imaging target portion on a surface of a steel sheet; first and second diffuse reflection light imaging units arranged at a first angle and at a second angle larger than the first angle with respect to a specular reflection direction of illuminated light reflected from the imaging target portion, respectively, imaging simultaneously reflection light of illuminated light reflected from the imaging target portion; and an image signal processor configured to process first and second diffuse reflection image signals acquired by the first and second diffuse reflection light imaging units, respectively, detecting, as a surface defect portion, a portion for which brightness level is lower than a first predetermined threshold in the first diffuse reflection image signal as well as higher than a second predetermined threshold in the second diffuse reflection image signal.