A lithium ion-conductive solid electrolyte including a freestanding inorganic vitreous sheet of sulfide-based lithium ion conducting glass is capable of high performance in a lithium metal battery by providing a high degree of lithium ion conductivity while being highly resistant to the initiation and/or propagation of lithium dendrites. Such an electrolyte is also itself manufacturable, and readily adaptable for battery cell and cell component manufacture, in a cost-effective, scalable manner. An automated machine based system, apparatus and methods assessing and inspecting the quality of such vitreous solid electrolyte sheets, electrode sub-assemblies and lithium electrode assemblies can be based on spectrophotometry and can be performed inline with fabricating the sheet or web (e.g., inline with drawing of the vitreous Li ion conducting glass) and/or with the manufacturing of associated electrode sub-assemblies and lithium electrode assemblies and battery cells.

Methods for detecting defects on the surface of a sheet of material include collimating a beam of light and intersecting the collimated beam of light with a beam splitter. The beam splitter directs a first portion of the intersected beam of collimated light to illuminate a first surface of the sheet, wherein a first portion of the light illuminating the first surface is reflected and a second portion of the illuminating light is scattered by a defect. The reflected and scattered light is received with a first lens element that directs the reflected and scattered light to an inverse aperture. The reflected light is blocked by the inverse aperture and the scattered light is transmitted by the inverse aperture. The scattered light transmitted by the inverse aperture is directed with a second lens element to an imaging device.

Methods for detecting defects on the surface of a sheet of material include collimating a beam of light and intersecting the collimated beam of light with a beam splitter. The beam splitter directs a first portion of the intersected beam of collimated light to illuminate a first surface of the sheet, wherein a first portion of the light illuminating the first surface is reflected and a second portion of the illuminating light is scattered by a defect. The reflected and scattered light is received with a first lens element that directs the reflected and scattered light to an inverse aperture. The reflected light is blocked by the inverse aperture and the scattered light is transmitted by the inverse aperture. The scattered light transmitted by the inverse aperture is directed with a second lens element to an imaging device.

A method and apparatus to measure specular reflection intensity, specular reflection angle, near specular scattered radiation, and large angle scattered radiation and determine the location and type of defect present in a first and a second transparent solid that have abutting surfaces. The types of defects include a top surface particle, an interface particle, a bottom surface particle, an interface bubble, a top surface pit, and a stain. The four measurements are conducted at multiple locations along the surface of the transparent solid and the measured information is stored in a memory device. The difference between an event peak and a local average of measurements for each type of measurement is used to detect changes in the measurements. Information stored in the memory device is processed to generate a work piece defect mapping indicating the type of defect and the defect location of each defect found.

Presently disclosed is a way to provide a measuring device capable of easily detecting measurement abnormality without increasing load in hardware. The measuring device may include: an emission means that may emit light to a measurement target region; a light measurement means that may measure light output from the measurement target region by emission with the emission means; a driving means that may move a position of at least one of the measurement target region and the emission means; and a determination means that may compare measurement values of the light measured a plurality of times by the light measurement means while changing positions of the measurement target region by the driving means and thereby determines abnormality of a measurement result. The determination means may determine measurement abnormality in a case where a reference measurement value being a measurement value obtained for a first time is lower than a comparison measurement value being a highest measurement value among measurement values obtained for second and subsequent times.

Presently disclosed is a way to provide a measuring device capable of easily detecting measurement abnormality without increasing load in hardware. The measuring device may include: an emission means that may emit light to a measurement target region; a light measurement means that may measure light output from the measurement target region by emission with the emission means; a driving means that may move a position of at least one of the measurement target region and the emission means; and a determination means that may compare measurement values of the light measured a plurality of times by the light measurement means while changing positions of the measurement target region by the driving means and thereby determines abnormality of a measurement result. The determination means may determine measurement abnormality in a case where a reference measurement value being a measurement value obtained for a first time is lower than a comparison measurement value being a highest measurement value among measurement values obtained for second and subsequent times.

A method and system for automated in-line inspection of optically transparent material is disclosed herein. The method includes illuminating a top and bottom surface of the optically transparent material with at least one sheet of light and then generating an image based on light that is received by an imaging device. The image that is generated may either be a bright field image or a dark field image.

A device for controlling a production system for planar or strand-shaped bodies comprises a measurement region and a conveying apparatus configured to convey the body through the measurement region. A transmission apparatus is configured to irradiate the body with measurement radiation in the measurement region. A detection apparatus is configured to detect the measurement radiation reflected by the body. An evaluation apparatus is configured to use the measurement radiation detected by the detection apparatus to determine at least one of: (1) a refractive index of the body; and (2) an absorption of the measurement radiation by the body. A control apparatus is configured to control at least one production parameter of a production system based on the at least one of: (1) the refractive index of the body; and (2) the absorption of the measurement radiation by the body.

A device for controlling a production system for planar or strand-shaped bodies comprises a measurement region and a conveying apparatus configured to convey the body through the measurement region. A transmission apparatus is configured to irradiate the body with measurement radiation in the measurement region. A detection apparatus is configured to detect the measurement radiation reflected by the body. An evaluation apparatus is configured to use the measurement radiation detected by the detection apparatus to determine at least one of: (1) a refractive index of the body; and (2) an absorption of the measurement radiation by the body. A control apparatus is configured to control at least one production parameter of a production system based on the at least one of: (1) the refractive index of the body; and (2) the absorption of the measurement radiation by the body.

A system for glass substrate inspection, such as flat patterned media, includes an air table that holds the glass substrate. The air table includes chucklets that emit gas as air bearings. A camera is disposed over the air table and moves in a direction across a width of a top surface of the glass substrate. An assembly includes a gripper and a probe bar configured to be transported under the camera. The gripper is configured to grip a bottom surface of the glass substrate opposite the top surface. The probe bar delivers driving signals to the glass substrate through a plurality of probe pins.