G01N2021/9583

CONTACT LENS DEFECT ANALYSIS AND TRACING SYSTEM
20220178787 · 2022-06-09 ·

A manual inspection system and method to inspect for defects in Contact lenses comprising; an image acquisition system with at least two high resolution cameras; Top illumination light head used for acquiring Bright field images; a Backlit illumination module to acquire Dark field images; at least another back lit illumination module to acquire a different type of Bright field images; an interchangeable mechanism to change measurement gauges suitable for a particular product; a rotating wheel embedded with multiple optical filters to cater to different imaging requirements; a first camera to capture the full view of the contact lens at a beam splitter; a second camera suitably mounted on a swivel arm to capture a higher resolution image of a selected defective area as viewed on a projection screen; a glass template or measurement gauge mounted at a suitable position to achieve overlaid images of the lens and the gauge on a projection screen for taking measurements; a flexible template measurement gauge as an optional overlay, to replace the glass template, suitably mounted on the projection screen for easy measurement of defects and geometry of the contact lens; an XYZ table to position the contact lens; creating a database on the computer that tabulates geometrical information and detailed defect information along with their respective positional information; and subsequently analyzing the database images to arrive at corrective actions to the manufacturing process to improve the quality and yields in the contact lens.

TESTING DEVICE AND METHOD FOR MEASURING THE HOMOGENEITY OF AN OPTICAL ELEMENT
20220170867 · 2022-06-02 · ·

A testing device for measuring the homogeneity of an optical element in a beam path of the testing device and related method. The testing device includes an interferometer, which comprises a monochromatic light source, an adjustable objective, a reference surface associated with a surface of the optical element to be tested or an interferometry surface, and an analysis unit for the interference of the wave fronts of the light reflected by the reference surface and the associated surface of the optical element to be tested or of the interferometry surface. The testing device and method facilitate highly precise measurement of the homogeneity of an entire optical element—not merely individual surfaces. The method is suitable for the highly precise measurement of plastic lenses or other injection molded components for refractive laser eye surgery for example.

DEFLECTOMETRY DEVICES, SYSTEMS AND METHODS
20220146370 · 2022-05-12 ·

Devices, methods and systems are disclosed that enable deflectometry on a wide array of objects, including convex and freeform optical components. One example deflectometry system includes a light source with a plurality of light emitting devices to illuminate an object under test with incident light, and a detector positioned to receive a reflected or transmitted light from the object under test. The deflectometry system further includes a movable stage for holding or securing the object under test. The movable stage can move in a translational or a rotational direction to cause the object under test to translate or rotate in a plurality of steps such that the light received at the detector encompasses a portion of a full illumination space surrounding the object, and the light received at the detector from all of the plurality of steps encompasses the full illumination space that contiguously surrounds the object under test.

APPARATUS AND METHOD FOR MEASURING THE REFLECTIVITY OR TRANSMITTIVITY OF AN OPTICAL SURFACE

An apparatus and a method measure a reflectivity and/or transmittivity of an optical surface. The apparatus includes a pulsed coherent white light source for generating pulsed coherent white light, wherein the apparatus is adapted to irradiate the optical surface with at least a part of the generated pulsed coherent white light.

Inspection device and method of measuring wavefront aberration

An inspection device includes an objective lens that transmits inspection light reflected from a sample during inspection and measurement light from a point light source during aberration measurement, a first pupil relay lens that transmits the inspection light and the measurement light, a second pupil relay lens in which an intermediate imaging plane is formed between the second pupil relay lens and the first pupil relay lens, a diffraction grating disposed between the first pupil relay lens and the intermediate imaging plane and that diffracts the measurement light, a point diffraction interferometry plate disposed within a depth of focus of the intermediate imaging plane and that selectively transmits the diffracted light, a first detector that detects an image of the sample, and a second detector that detects a fringe image of the measurement light.

IN-LINE METROLOGY SYSTEMS, APPARATUS, AND METHODS FOR OPTICAL DEVICES
20220122241 · 2022-04-21 ·

Embodiments of the present disclosure relate to optical devices for augmented, virtual, and/or mixed reality applications. In one or more embodiments, an optical device metrology system is configured to measure a plurality of first metrics and one or more second metrics for optical devices, the one or more second metrics including a display leakage metric.

Spectacle lens producing method, spectacle lens producing system, and spectacle lens
11712774 · 2023-08-01 · ·

The present invention is a method for producing a spectacle lens from a lens material, and includes: a marking step (step S10) of marking an identification mark for identifying the spectacle lens, and a processing information mark which is used to process a lens blank and includes a tray identification 2D code, a tray identification code, a shape line and a position mark by forming a hole or a groove in a convex surface of the lens material by laser; and a concave surface machining processing step (step S13) of reading the processing information mark, and machining a concave surface of the lens blank based on the read processing information mark.

PLASTIC LENS ELEMENT AND IMAGING LENS ASSEMBLY

A plastic lens element includes an optical effective portion and a peripheral portion. The peripheral portion surrounds the optical effective portion and includes a peripheral surface and an optical inspecting structure. The optical inspecting structure is disposed between the optical effective portion and the peripheral surface and includes a first optical inspecting surface and a second optical inspecting surface. The first optical inspecting surface and the second optical inspecting surface are disposed on two sides of the peripheral portion respectively and correspond to each other.

SPECTACLE LENS PRODUCING METHOD, SPECTACLE LENS PRODUCING SYSTEM, AND SPECTACLE LENS
20230321785 · 2023-10-12 · ·

A method for producing a spectacle lens from a lens material and includes: a marking step of marking an identification mark for identifying the spectacle lens, and a processing information mark which is used to process a lens blank and includes a tray identification 2D code, a tray identification code, a shape line and a position mark by forming a hole or a groove in a convex surface of the lens material by laser; and a concave surface machining processing step of reading the processing information mark, and machining a concave surface of the lens blank based on the read processing information mark.

NONDESTRUCTIVE IMAGING AND SURFACE QUALITY INSPECTION OF STRUCTURED PLATES
20230296472 · 2023-09-21 ·

A system includes a stage, a detector and a measuring device. The stage is configured to hold a substrate. The substrate includes a plurality of tapered structures, and each of the plurality of tapered structures includes a tapered wall between first and second openings at opposite ends of the plurality of tapered structures. The detector is tilted at a first angle and configured to measure light reflected from the tapered wall at about 90 degrees to the tapered wall. The first angle depends at least in part a second angle between the tapered wall and a longitudinal axis running through the tapered structure. The measuring device is configured to determine a characteristic of the tapered wall and whether the characteristic of the tapered wall is above or below a threshold.